Grazing Incidence X-Ray Fluorescence Analysis using Synchrotron Radiation

AbstractThe X-ray fluorescence analysis of a trace element under a grazing incidence condition has been developed using synchrotron radiation. The interference effect plays an important role for determining the depth distribution of the elemental concentration. The elemental distribution above, on or below the material surface has been studied. The glancing angle dependence of the X-ray fluorescence signal around the critical angle strongly reflects the elemental distribution, and can be used to determine the position of the element of interest.

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Near-Surface Analysis of Semicondutor Using Grazing Incidence X-Ray Fluorescence

Advances in X-ray Analysis ◽

10.1154/s0376030800022345 ◽

1987 ◽

Vol 31 ◽

pp. 487-494 ◽

Cited By ~ 2

Author(s):

Atsuo Iida ◽

Kenji Sakurai ◽

Yohichi Gohshi

Keyword(s):

Surface Layer ◽

High Temperature ◽

Synchrotron Radiation ◽

Fluorescence Analysis ◽

Grazing Incidence ◽

Total Reflection ◽

Near Surface ◽

X Ray ◽

Gaas Wafer ◽

Glancing Angle

SummaryThe X-ray external total reflection was used for the x-ray fluorescence analysis of the near surface layer of a GaAs wafer and a GaAlAs epilayer. Synchrotron radiation was used as an excitation source. The intensity ratio between the Ga K and As K fluorescence signals was measured as a function of the glancing angle. The reduction of As atoms near the surface of less than a hundred Å was observed for the high temperature annealed GaAlAs epilayer.

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Grazing Incidence X-Ray Fluorescence Analysis Using Synchrotron Radiation

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3460-0_14 ◽

1992 ◽

pp. 795-806 ◽

Cited By ~ 9

Author(s):

Atsuo Iida

Keyword(s):

Synchrotron Radiation ◽

Fluorescence Analysis ◽

Grazing Incidence ◽

X Ray

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The interaction between atoms of Au and Cu with clean Si(111) surface: A study combining synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations

Spectrochimica Acta Part A Molecular and Biomolecular Spectroscopy ◽

10.1016/j.saa.2009.06.021 ◽

2009 ◽

Vol 74 (1) ◽

pp. 292-296 ◽

Cited By ~ 6

Author(s):

Hudson W.P. de Carvalho ◽

Ana P.L. Batista ◽

Teodorico C. Ramalho ◽

Carlos A. Pérez ◽

Angelo Luiz Gobbi

Keyword(s):

Synchrotron Radiation ◽

Theoretical Calculations ◽

Fluorescence Analysis ◽

Grazing Incidence ◽

X Ray

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Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques

Microscopy and Microanalysis ◽

10.1017/s1431927615015093 ◽

2015 ◽

Vol 21 (6) ◽

pp. 1644-1648 ◽

Cited By ~ 5

Author(s):

Daniel Abou-Ras ◽

Raquel Caballero ◽

Cornelia Streeck ◽

Burkhard Beckhoff ◽

Jung-Hwan In ◽

...

Keyword(s):

Thin Film ◽

Thin Films ◽

Fluorescence Analysis ◽

Grazing Incidence ◽

Elemental Distribution ◽

X Ray ◽

Breakdown Spectroscopy ◽

Absorber Material ◽

Laser Induced Breakdown ◽

Comprehensive Comparison

AbstractIn a recent publication by Abou-Ras et al., various techniques for the analysis of elemental distribution in thin films were compared, using the example of a 2-µm thick Cu(In,Ga)Se2 thin film applied as an absorber material in a solar cell. The authors of this work found that similar relative Ga distributions perpendicular to the substrate across the Cu(In,Ga)Se2 thin film were determined by 18 different techniques, applied on samples from the same identical deposition run. Their spatial and depth resolutions, their measuring speeds, their availabilities, as well as their detection limits were discussed. The present work adds two further techniques to this comparison: laser-induced breakdown spectroscopy and grazing-incidence X-ray fluorescence analysis.

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Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis

physica status solidi (a) ◽

10.1002/pssa.201400204 ◽

2015 ◽

Vol 212 (3) ◽

pp. 523-528 ◽

Cited By ~ 12

Author(s):

Philipp Hönicke ◽

Blanka Detlefs ◽

Matthias Müller ◽

Erik Darlatt ◽

Emmanuel Nolot ◽

...

Keyword(s):

Fluorescence Analysis ◽

Grazing Incidence ◽

X Ray ◽

Gradient Systems

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Pigments analysis in cartonages of an Egyptian mummy of the Roman period using X-ray fluorescence spectrometry

Journal of Biological Research - Bollettino della Società Italiana di Biologia Sperimentale ◽

10.4081/jbr.2005.10127 ◽

2005 ◽

Vol 80 (1) ◽

Author(s):

Cristiane Calza ◽

Marcelino J. Anjos I ◽

Sheila M.F. Mendonça de Souza ◽

Antonio Brancaglion Jr ◽

Ricardo T. Lopes

Keyword(s):

Chemical Composition ◽

Synchrotron Radiation ◽

Fluorescence Analysis ◽

Spectroscopic Technique ◽

Roman Period ◽

Metal Alloys ◽

Egyptian Mummy ◽

X Ray ◽

Radiation Technique ◽

Radiation Laboratory

This work evaluates the chemical composition of pigments used in decorative paintings in the coffin cartonage fragments and linen wrappings of an Egyptian mummy, using X-ray microfluorescence with synchrotron radiation technique. The measures were obtained at the XRF beamline of the National Synchrotron Radiation Laboratory (LNLS). This Roman period female mummy is one of the most important mummies in the National Museum because of its unconventional embalming with disarticulated legs and arms. X-ray fluorescence analysis is a widely used spectroscopic technique in archaeometry for investigating the chemical composition of pigments in manuscripts, paintings, ceramics and other artifacts, metal alloys, and stones. Knowledge of composition allows pigment characterization through major or minor constituents, and makes it possible to establish the provenance, age, and consequently, the authenticity of the artifact.

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