scholarly journals Stress Analysis of Rotary Vibration of Rigid Friction Pile and Stress General Solution of Central Symmetry Plane Elastic Problem

2015 ◽  
Vol 2015 ◽  
pp. 1-12 ◽  
Author(s):  
Fu-yao Zhao ◽  
Er-xiang Song ◽  
Jun Yang

The rotary vibration of rigid friction pile can be seen approximately as a central symmetry plane problem in elasticity. The stress general solution of central symmetry plane problem in elasticity can be constructed by technique such as the Laurent expansion of the volume force. This solution has some decoupling, generalized, and convergent properties, and it can be used in stress analysis of the rotary vibration of pile. The analysis results show that the maximum value of displacement will not occur at the edge of the pile and the assumption that pile cross section remains unchanged is no longer applicable, if the value of one dimensionless quantity, reflecting the angular frequency of the rotation, radius, and material properties of the pile, is larger than 1.84. Once the rotary vibration of rigid friction pile happens, the pile may lose its bearing capacity under the comprehensive effect of normal and shear stress of the pile-soil interface and it will be very difficult to recover.

2018 ◽  
Vol MA2018-01 (32) ◽  
pp. 1985-1985
Author(s):  
Gery R. Stafford ◽  
Ugo Bertocci

Wafer curvature and cantilever bending techniques have been used by the electrochemical community to examine stress development during electrochemical processing. Surface stress changes as low as 10−3 N/m can typically be resolved from cantilever electrodes immersed in solution and under potential control. Such resolution makes this measurement useful for examining virtually all aspects of electrochemistry; i.e., electrocapillarity, adsorption processes, underpotential deposition, electrodeposition, etc. Often these processes occur either simultaneously or in rapid succession and we are often limited to measuring the influence of the dominant process in the time-scale of the experiment. In the case of electrocapillarity (charge-induced stress), the figure of merit is the stress-charge coefficient (ς) which captures the fundamental surface mechanics associated with charging the electrode surface. It has been well documented in the literature that ς is influenced by the anion in solution and its concentration.1,2 However, a steady state measurement cannot separate the contributions of anion adsorption from that of simple capacitive charging. Similar to electrochemical impedance spectroscopy (EIS) where electrochemical processes with different characteristic time constants can be separated, dynamic stress analysis (DSA) allows us to study the dynamics of any particular stress-generating process and link the stress to specific electrochemical and surface phenomena. We have demonstrated the technique by examining the electrocapillarity of both Pt and Au in HClO4 electrolyte.3,4 ς can be obtained from the following equation, ς = jωYsZe where Ze is the electrochemical impedance, Ys is the stress admittance (with units of N/(V-m), ω is the angular frequency, and j =√-1. In order to include adsorbate-induced contributions to the surface stress, one considers an equivalent circuit that adequately describes both the double layer and adsorption contributions to the electrochemical impedance. One can then obtain unique stress-charge coefficients that capture both electrocapillarity and anion adsorption as a function of potential. This will be demonstrated using (111)-textured Au cantilever electrodes in both sulfate and perchlorate electrolyte. References W. Haiss, R.J. Nichols, J.K. Sass, and K.P. Charle, J. Electroanal. Chem., 452, 199, (1998). R.N. Viswanath, D. Kramer, and J. Weissmüller, Langmuir, 21, 4604 (2005). M. C. Lafouresse, U. Bertocci, C. R. Beauchamp, and G. R. Stafford, J. Electrochem. Soc. 159, H816 (2012). M. C. Lafouresse, U. Bertocci, and G. R. Stafford, J. Electrochem. Soc. 160, H636 (2013).


2012 ◽  
Vol 249-250 ◽  
pp. 352-355
Author(s):  
Bao Sheng Zhao ◽  
Di Wu

The refined equations of special orthotropic piezoelectric plate are analyzed. Based on elastic theory, the refined equations of plane problem are derived by using Elliott-Lodge’s general solution and Lur’e method without ad hoc assumptions. The exact deformation field and exact stress field are represented by unknown functions with two independent variables. Based on boundary conditions, the refined equations for the generalized plane problem with symmetrical transverse surface loading are obtained.


2013 ◽  
Vol 275-277 ◽  
pp. 101-104
Author(s):  
Lian Zhi Yang ◽  
Liang Liang Zhang ◽  
Yang Gao

A theory of general solutions of plane problem is developed for the coupled equations in plane elasticity of one-dimensional (1D) hexagonal quasicrystals (QCs), and three general solutions are presented by an operator method. These solutions are expressed in terms of a displacement function, which satisfies a sixth-order partial differential equation. By utilizing a theorem, a decomposition and superposition procedure is taken to replace the sixth-order function with three second-order displacement functions, and the general solution is simplified in terms of these functions. In consideration of different cases of three characteristic roots, the general solution possesses three cases, but all are in simple forms that are convenient to be used.


1975 ◽  
Vol 26 ◽  
pp. 293-295 ◽  
Author(s):  
I. Zhongolovitch

Considering the future development and general solution of the problem under consideration and also the high precision attainable by astronomical observations, the following procedure may be the most rational approach:1. On the main tectonic plates of the Earth’s crust, powerful movable radio telescopes should be mounted at the same points where standard optical instruments are installed. There should be two stations separated by a distance of about 6 to 8000 kilometers on each plate. Thus, we obtain a fundamental polyhedron embracing the whole Earth with about 10 to 12 apexes, and with its sides represented by VLBI.


Author(s):  
John W. Andrew ◽  
F.P. Ottensmeyer ◽  
E. Martell

Energy selecting electron microscopes of the Castaing-Henry prism-mirror-prism design suffer from a loss of image and energy resolution with increasing field of view. These effects can be qualitatively understood by examining the focusing properties of the prism shown in Fig. 1. A cone of electrons emerges from the entrance lens crossover A and impinges on the planar face of the prism. The task of the prism is to focus these electrons to a point B at a focal distance f2 from the side of the prism. Electrons traveling in the plane of the diagram (i.e., the symmetry plane of the prism) are focused toward point B due to the different path lengths of different electron trajectories in the triangularly shaped magnetic field. This is referred to as horizontal focusing; the better this focusing effect the better the energy resolution of the spectrometer. Electrons in a plane perpendicular to the diagram and containing the central ray of the incident cone are focused toward B by the curved fringe field of the prism.


Author(s):  
Alan Boyde ◽  
Milan Hadravský ◽  
Mojmír Petran ◽  
Timothy F. Watson ◽  
Sheila J. Jones ◽  
...  

The principles of tandem scanning reflected light microscopy and the design of recent instruments are fully described elsewhere and here only briefly. The illuminating light is intercepted by a rotating aperture disc which lies in the intermediate focal plane of a standard LM objective. This device provides an array of separate scanning beams which light up corresponding patches in the plane of focus more intensely than out of focus layers. Reflected light from these patches is imaged on to a matching array of apertures on the opposite side of the same aperture disc and which are scanning in the focal plane of the eyepiece. An arrangement of mirrors converts the central symmetry of the disc into congruency, so that the array of apertures which chop the illuminating beam is identical with the array on the observation side. Thus both illumination and “detection” are scanned in tandem, giving rise to the name Tandem Scanning Microscope (TSM). The apertures are arranged on Archimedean spirals: each opposed pair scans a single line in the image.


Sign in / Sign up

Export Citation Format

Share Document