308 Research on detection of sample surface by using AFM with van der Pol-type self-excited micro-cantilever probe

2008 ◽  
Vol 2008.8 (0) ◽  
pp. 15-16
Author(s):  
Takashi SOMEYA ◽  
Kiwamu ASHIDA ◽  
Masaharu KURODA ◽  
Hiroshi YABUNO
Keyword(s):  
Sample Surface ◽  
Van Der Pol ◽  
Micro Cantilever ◽  
Cantilever Probe

Van der Pol Type Self-Excited Microcantilever and Its Application to AFM

2009 ◽  
Author(s):  
Hiroshi Yabuno ◽  
Masaharu Kuroda ◽  
Takashi Someya ◽  
Masahiro Ohta ◽  
Ryohei Kokawa
Keyword(s):  
Natural Frequency ◽  
The Self ◽  
Material Surface ◽  
Van Der Pol ◽  
Contact Mode ◽  
Response Frequency ◽  
Atomic Force ◽  
Micro Cantilever ◽  
Excited Oscillator ◽  
Cantilever Probe

We propose a van der Pol type self-excited micro-cantilever probe for AFM (atomic force microscope). Because the response frequency of self-excited oscillators is its natural frequency, the equivalent natural frequency depending on the atomic force is easily measured from detecting the response frequency of the self-excited micro-cantilever probe. While the amplitude of the linear self-excited oscillator grows with time, it can be kept very small by the nonlinear effect as van ver Pol oscillator. Therefore, if the micro-cantilever probe has the same dynamics as that of van Pol oscillator, the contact of the micro-cantilever to the material surface is prohibited and non-contact mode AFM is realized. In the present study, we design a van der Pol type micro-cantilever for the application to the practical AFM system.

Van der Pol type self-excited micro-cantilever probe of atomic force microscopy

2008 ◽  
Vol 54 (1-2) ◽  
pp. 137-149 ◽  
Author(s):  
Hiroshi Yabuno ◽  
Hiroyuki Kaneko ◽  
Masaharu Kuroda ◽  
Takeshi Kobayashi
Keyword(s):  
Atomic Force Microscopy ◽  
Van Der Pol ◽  
Force Microscopy ◽  
Atomic Force ◽  
Micro Cantilever ◽  
Cantilever Probe

102 Development of AFM with van der Pol type micro cantilever : Bifurcation control and experimental verification

2006 ◽  
Vol 2006 (0) ◽  
pp. _102-1_-_102-4_
Author(s):  
Hiroshi YABUNO ◽  
Takeshi KOBAYASHI ◽  
Hiroyuki KANEKO ◽  
Masaharu KURODO
Keyword(s):  
Experimental Verification ◽  
Bifurcation Control ◽  
Van Der Pol ◽  
Micro Cantilever

scholarly journals Amplitude Control in van der Pol Type Self-excited Micro Cantilever for AFM

2007 ◽  
Vol 73 (732) ◽  
pp. 2225-2231 ◽  
Author(s):  
Keiichi HAYASHI ◽  
Kiwamu ASHIDA ◽  
Hiroshi YABUNO ◽  
Masaharu KURODA
Keyword(s):  
Van Der Pol ◽  
Amplitude Control ◽  
Micro Cantilever
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