Determination of pseudo-refractive index in self-assembled ligand layers from spectral shift of surface plasmon resonances in colloidal silver nanoplates

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Pavel Malakhovsky ◽  
Dmitry Murausky ◽  
Dmitry Guzatov ◽  
Sergey Gaponenko ◽  
Mikhail Artemyev

Abstract We examined systematically how self-assembled monolayers (SAMs) of different mercaptoacids affect the spectral shift of the localized surface plasmon resonance in silver nanoplates and nanospheres. We observed a clear trend in the magnitude of a redshift with a molecular length or the SAM thickness within a homologous series of aliphatic mercaptoacids: the thicker shell the stronger the red shift. Using classic Mie theory for plasmonic core-dielectric shell spheres and oblate spheroids we developed the method for determination of a pseudo-refractive index in SAM of different molecules and obtained a good correlation with the reference refractive indices for bulk long-chain aliphatic acids, but only in case of silver nanoplates. Calculations for silver core–shell nanospheres gave overestimated values of refractive index perhaps due to restrictions of Mie theory on the minimum particle size.

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.


Langmuir ◽  
2017 ◽  
Vol 33 (6) ◽  
pp. 1437-1441 ◽  
Author(s):  
Liyuan Ma ◽  
Shandong Xu ◽  
Chaoming Wang ◽  
Haining Wang ◽  
Shengli Zou ◽  
...  

Langmuir ◽  
2017 ◽  
Vol 33 (49) ◽  
pp. 13936-13944 ◽  
Author(s):  
Zhijun Li ◽  
Kim Munro ◽  
Iraklli I. Ebralize ◽  
Mina R. Narouz ◽  
J. Daniel Padmos ◽  
...  

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