Laser-induced microstructural changes and decomposition of aluminum nitride

1995 ◽  
Vol 10 (1) ◽  
pp. 54-62 ◽  
Author(s):  
Siqi Cao ◽  
A.J. Pedraza ◽  
L.F. Allard

The microstructural changes induced by pulsed laser irradiation in the surface layer of AlN and the initial stage of electroless copper deposition in laser processe specimens have been investigated using transmission electron microscopy (TEM). It was found that a dislocation microstructure is generated by laser processing at laser energy densities of 1.5 J/cm2 or higher. A very sharp change in the dislocation microstructure was seen at a depth of 0.2 to 0.3 μm from the free surface. The dislocation Burgers vector is 〈100〉 and the slip plane is {001}, in agreement with previous reports. AlN was melted and resolidified homo-epitactically from the solid substrate forming a mosaic microstructure with very fine cells having a misorientation of up to 15°. Patches of metallic aluminum were found at the surface of all the specimens irradiated at a laser energy density of 1.5 J/cm2 or higher. Very fine particles of AlN, 20 to 50 nm in diameter, were randomly distributed inside the patches. Immersion of these specimens in an electroless copper bath showed that the electroless solution preferentially etched away aluminum at the Al-AlN interface. At the same time copper islands were deposited in cavities left by AlN particles as well as at the interface with the underlying substrate. These regions are the seeds for further electroless deposition. The TEM observations of laser-induced microstructural changes reported in this paper help to unravel further the mechanisms of adhesion enhancement and surface activation by pulsed laser irradiation.

1993 ◽  
Vol 301 ◽  
Author(s):  
Kenshiro Nakashima

ABSTRACTErbium ions were successfully doped in silicon by pulsed laser irradiation above the threshold laser energy density. Photoluminescence peaks at 1.54, 1.59 and 1.64 µm from Er-optical centers were observed after annealing of Er-doped samples. The intensity of the 1.54 µm Er-emission band increased upon increase in the laser energy density, and then gradually decreased after reaching the maximum, due to the laser sputtering of the silicon substrate. Oxygen atoms, which were unintentionally codoped with Er-ions, were found to be distributed in the same region as in Er-ions, and were suggested to play roles to activate Er-optical centers. The maximum concentration of Er-ions doped in the solid state regime were estimated to be the order of 1018 cm−3 by the Rutherford backscattering measurements.


1984 ◽  
Vol 35 ◽  
Author(s):  
W. Sinke ◽  
F.W. Saris

ABSTRACTAfter low-energy pulsed-laser irradiation of Cu-implanted silicon, a double-peak structure is observed in the Cu concentration profile, which results from the occurrence of two melts. From Cu surface segregation we calculate the depth of the surface melt. Cu segregation near the position of the amorphous-crystalline interface gives evidence for a self-propagating melt, moving from the surface region towards the crystalline substrate. Measurements of As-redistribution and of sheet resistance as a function of laser energy density in As-implanted silicon are consistent with the crystallization model which is derived from the effects as observed in Cu-implanted silicon.The results imply a large difference in melting temperature, heat conductivity and heat of melting between amorphous silicon and crystalline silicon.


1983 ◽  
Vol 29 ◽  
Author(s):  
D. Pribat ◽  
D. Dieumegard ◽  
B. Dessertenne ◽  
J. Chaplart

ABSTRACTWe have studied silicon incorporation in GaAs subsequent to Nd-YAG laser irradiation through high pressure silane atmospheres. The process involves SiH4 pyrolysis at contact with a laser-melted GaAs surface, and incorporation of the released Si atoms in the melt. SIMS analyses have allowed us to study silicon incorporation as a function of SiH4 pressure, laser energy density and number of laser shots. The high sheet resistance of the doped layers indicates that the silicon atoms are poorly electrically activated. A compensation mechanism is discussed based on oxygen penetration from native GaAs oxide layers.


Author(s):  
Siqi Cao ◽  
A. J. Pedraza ◽  
L. F. Allard ◽  
D. H. Lowndes

Surface modifications of wide-gap materials are produced by pulsed laser irradiation. Under given conditions, these near-surface modifications can promote adhesion enhancement of deposited thin film materials, and activation for electroless deposition. AIN decomposes during laser irradiation leaving a metallic film on the surface. High density dislocations were observed in the surface layer of AIN that was laser melted but not decomposed. The laser melted alumina becomes amorphous at a laser energy density of ~1J/cm2. In sapphire, γ-alumina is formed when the sample is laser irradiated in Ar/4%H2. Here, we report the formation of a new structure in laser-irradiated sapphire.Optically polished c-axis sapphire substrates were laser-irradiated in an Ar/4%H2 atmosphere at 4J/cm2 energy density, using a 308 nm-wavelength laser with a pulse duration of ~40 ns. Sapphire (A12O3) has a space group R 3 c and can be described as an hcp structure having oxygen and aluminum layers alternately stacking along the c-axis.


2004 ◽  
Vol 850 ◽  
Author(s):  
Susumu Inasawa ◽  
Masakazu Sugiyama ◽  
Yukio Yamaguchi

ABSTRACTSize distribution of gold nanoparticles in aqueous solution during pulsed laser irradiation (Nd:YAG laser, wavelength of 355 nm, pulse width 30 ps) is observed by transmission electron microscope (TEM). Interestingly, we observed that a single peak distribution of gold nanoparticles sizes (initially centered around 25 nm) is gradually turned into a two-peaks one upon laser radiation. Initial particles reduced their sizes and smaller particles were formed, resulting in the bimodal size distribution. In these bimodal size distributions, two peaks are observed, one is at 6 nm, and another is at 24 nm.


1995 ◽  
Vol 397 ◽  
Author(s):  
A.J. Pedraza ◽  
J.W. Park ◽  
D.H. Lowndes ◽  
S. Cao ◽  
W.R. Allen

ABSTRACTThe surfaces of Al2O3 and AlN are modified by pulsed-laser irradiation This modification promotes the deposition of copper when the irradiated substrates are immersed in an electroless bath. In this paper the nature of the surface modification is analyzed using results from Auger Emission Spectroscopy (AES) and Cross Sectional Transmission Electron Microscopy (XTEM). During irradiation AlN thermally decomposes leaving a discontinuous metallic film on the surface. A film of Al2O3 is detected at the surface of the irradiated AlN substrate, much thicker when the irradiation is performed in an oxidizing atmosphere than when done in a reducing one. Nanoparticles of metallic aluminum are generated during laser irradiation of Al2O3 in a reducing atmosphere. When the irradiation of Al2O3 is performed in an oxidizing atmosphere, regions containing aluminum or substoichiometric alumina are detected by AES. It is concluded that the presence of metallic aluminum is the main reason why electroless deposition can occur in both AlN and Al2O3. Deposition kinetics are completely consistent with this conclusion. It is very likely that also substoichiometric alumina helps to catalyze the electroless deposition.


1986 ◽  
Vol 75 ◽  
Author(s):  
S. Roorda ◽  
A. Polman ◽  
S. B. Ogale ◽  
F. W. Saris

AbstractNitridation and oxidation of titanium is achieved by pulsed laser irradiation of Ti immersed in liquid ammonia or water. Rutherford Backscattering Spectrometry shows that large amounts of nitrogen and oxygen can be incorporated in the metal surface to a depth of several 1000 Å. X-ray diffraction shows evidence of compound formation. Scanning Electron Microscopy reveals that initial surface texture is smoothed, and that stress induced cracks and holes may appear. Irradiation of Fe and Si immersed in various liquids shows that modification depends on which combination of solid and liquid is used. Influence of processing parameters such as laser-energy density and number of laser pulses on compound formation has been investigated. The process is viewed as a reactive solute incorporation in the laser melted surface layer, followed by compound formation.


1993 ◽  
Vol 3 (12) ◽  
pp. 2173-2188
Author(s):  
N. G. Chechenin ◽  
A. V. Chernysh ◽  
V. V. Korneev ◽  
E. V. Monakhov ◽  
B. V. Seleznev

Sign in / Sign up

Export Citation Format

Share Document