Folding Graphene with Swift Heavy Ions

2011 ◽  
Vol 1354 ◽  
Author(s):  
Sevilay Akcöltekin ◽  
Hanna Bukowska ◽  
Ender Akcöltekin ◽  
Henning Lebius ◽  
Marika Schleberger
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Kinetic Energy ◽  
Heavy Ions ◽  
Standard Technique ◽  
Heavy Ion ◽  
Force Microscopy ◽  
Swift Heavy Ions ◽  
Atomic Force ◽  
Swift Heavy Ion

ABSTRACTSwift heavy ion induced modifications on graphene were investigated by means of atomic force microscopy and Raman spectroscopy. For the experiment graphene was exfoliated onto different substrates (SrTiO3 (100), TiO2(100), Al2O3(1102) and 90 nm SiO2/Si) by the standard technique. After irradiation with heavy ions of 93 MeV kinetic energy and under glancing angles of incidence, characteristic folding structures are observed. The folding patterns on crystalline substrates are generally larger and are created with a higher efficiency than on the amorphous SiO2. This difference is attributed to the relatively large distance between graphene and SiO2 of d ≈ 1 nm.

SWIFT HEAVY ION INDUCED NANOHILL FORMATION ON THE SURFACE OF GaP

2011 ◽  
Vol 10 (01n02) ◽  
pp. 105-109 ◽  
Author(s):  
R. L. DUBEY ◽  
S. K. DUBEY ◽  
A. D. YADAV ◽  
D. KANJILAL
Keyword(s):  
Atomic Force Microscopy ◽  
Crystallite Size ◽  
Gallium Phosphide ◽  
Phonon Mode ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Swift Heavy Ion

Gallium phosphide ( GaP ) samples were irradiated with swift (100 MeV)56 Fe 9+ ions for various ion fluences varying from 1 × 1011 to 1 × 1014 cm -2. Atomic force microscopy, Raman scattering, and X-ray diffraction techniques have been used to investigate the irradiation effect. Atomic force microscopy studies showed the presence of nanosized hills separated with valleys at the surface of irradiated gallium phosphide. The average diameters of hills were found to be 19.76, 19.81, 20.70, and 22.64 nm for ion fluences 5 × 1012, 1 × 1013, 5 × 1013, and 1 × 1014 cm -2, respectively. Root mean square surface roughness analysis has been used to characterize the nature of the surface under swift heavy ion irradiation. The features observed in the Raman spectra at 402.18 cm-1 and 365.05 cm-1 were assigned to the characteristic first-order longitudinal optical (LO) phonon mode and transverse optical (TO) phonon mode of gallium phosphide, respectively. We have also observed the second-order overtones and combinations of optical modes giving rise to three characteristic peaks in the region between 700 and 800 cm-1. X-ray diffraction technique has been used to determine the crystallite size. The crystallite size was found to decrease with increase in ion fluence.

scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

1994 ◽  
Vol 76 (6) ◽  
pp. 3443-3447 ◽  
Author(s):  
J. M. Yáñez‐Limón ◽  
F. Ruiz ◽  
J. González‐Hernández ◽  
C. Vázquez‐López ◽  
E. López‐Cruz
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Carbon Films ◽  
Force Microscopy ◽  
Atomic Force

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

Biophysical Modeling of Fragment Length Distributions of DNA Plasmids after X and Heavy-Ion Irradiation Analyzed by Atomic Force Microscopy

2008 ◽  
Vol 169 (6) ◽  
pp. 649-659 ◽  
Author(s):  
Thilo Elsässer ◽  
Stephan Brons ◽  
Katarzyna Psonka ◽  
Michael Scholz ◽  
Ewa Gudowska-Nowak ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Fragment Length ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Biophysical Modeling ◽  
Force Microscopy ◽  
Heavy Ion Irradiation ◽  
Atomic Force

Atomic force microscopy and Raman spectroscopy of Pb1−xSnxTe surfaces polished after treatment with H2O2–HBr–ethylene glycol etchants

2019 ◽  
Vol 10 (8) ◽  
pp. 2717-2722
Author(s):  
G. P. Malanych ◽  
O. F. Kolomys ◽  
A. A. Korchovyi ◽  
N. V. Safriuk ◽  
V. M. Tomashyk
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Ethylene Glycol ◽  
Force Microscopy ◽  
Atomic Force
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