The Control of Electronic States Spreading Outside the Conjugated Polymer Surface

ABSTRACTThe surface electronic structures of conjugated regio regular and regio random poly (3- hexylthiophene) (rr-P3HT and rra-P3HT) thin films were studied by near edge X-ray absorption fine structure spectroscopy, ultraviolet photoelectron spectroscopy and Penning ionization electron spectroscopy (PIES). The distribution of the surface electronic states was controlled on rr-P3HT and rra-P3HT thin films with different molecular ordering by varying the coating process and PIES was adopted to observe the electronic states existing outside the surface.

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A contrast in the electronic structures of B ion implanted ZnO thin films grown on glass and silicon substrates by using x-ray absorption spectroscopy

Journal of Applied Physics ◽

10.1063/5.0007733 ◽

2020 ◽

Vol 128 (6) ◽

pp. 065303

Author(s):

Krishna Kumar ◽

Shi-Chen Wu ◽

Yueh-Chung Yu ◽

Da-Hua Wei ◽

Jau-Wern Chiou

Keyword(s):

Thin Films ◽

Absorption Spectroscopy ◽

Electronic Structures ◽

Zno Thin Films ◽

Silicon Substrates ◽

X Ray ◽

X Ray Absorption ◽

Ion Implanted

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History and Cross-Disciplinary Perspective of Compositional Imaging and Mapping With Nexafs Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927600020894 ◽

1998 ◽

Vol 4 (S2) ◽

pp. 154-155

Author(s):

H. Ade

Keyword(s):

Electronic Structures ◽

Chemical Shifts ◽

Electronic States ◽

Inorganic Materials ◽

Chemical Bonds ◽

Fundamental Physics ◽

X Ray ◽

Disciplinary Perspective ◽

Core Electrons ◽

X Ray Absorption

In Near Edge X-ray Absorption Fine Structure (NEXAFS) microscopy, excitations of core electrons into unoccupied molecular orbitals or electronic states provide sensitivity to a wide variety of chemical functionalities in molecules and solids. This sensitivity complements infrared (IR) spectroscopy, although the NEXAFS spectra are not quite as specific and “rich” as IR spectra. The sensitivity of NEXAFS to distinguish chemical bonds and electronic structures covers a wide variety of samples: from metals to inorganics and organics. (There is a tendency in the community to use the term NEXAFS for soft x-ray spectroscopy of organic materials, while for inorganic materials or at higher energies X-ray Absorption Near Edge Spectroscopy (XANES) is utilized, even though the fundamental physics is the same.) The sensitivity of NEXAFS is particularly high to distinguish saturated from unsaturated bonds. NEXAFS can also detect conjugation in a molecule, as well as chemical shifts due to heteroatoms.

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The Electronic Structures of Fullerene/Transition-Metal Hybrid Material

MRS Proceedings ◽

10.1557/proc-1081-p07-01 ◽

2008 ◽

Vol 1081 ◽

Author(s):

Yoshihiro Matsumoto ◽

Seiji Sakai ◽

Hiroshi Naramoto ◽

Norie Hirao ◽

Yuji Baba ◽

...

Keyword(s):

Photoelectron Spectroscopy ◽

Electronic Structures ◽

Line Broadening ◽

Hybrid Films ◽

Xps Spectra ◽

X Ray ◽

Nexafs Spectroscopy ◽

Homo Level ◽

Valence Band Region ◽

X Ray Absorption

ABSTRACTLocal electronic structures of C60-Co hybrid films have been studied by X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. XPS spectra of C 1s main and satellite peaks for the C60-Co films show binding-energy shifts and also line-broadening compared to those in a pure C60 film. In addition, XPS spectra in valence band region suggest an appearance of three new components at near Fermi level and HOMO level in the C60-Co film. These results are attributed to hybridizations between Co 3d band and C60 LUMO. The same effects have been observed in NEAXFS spectra at C 1s excitations.

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Crystalline Phases and Electronic Structures in Superconducting Bi – Sr – Ca – Cu Oxides

Journal of Materials Research ◽

10.1557/jmr.1997.0270 ◽

1997 ◽

Vol 12 (8) ◽

pp. 2009-2013

Author(s):

M. D. Giardina ◽

R. Feduzi ◽

D. Inzaghi ◽

A. Manara ◽

C. Giori ◽

...

Keyword(s):

Microwave Absorption ◽

Photoelectron Spectroscopy ◽

Electronic Structures ◽

Theoretical Interpretation ◽

Nominal Composition ◽

X Ray Diffraction ◽

Edge Structure ◽

X Ray ◽

Quantum Percolation ◽

X Ray Absorption

Two classes of samples, designated A and B, of layered Bi–Sr–Ca–Cu oxides having the same nominal composition 4 : 3 : 3 : 4, but different thermal histories, were investigated by using field modulated microwave absorption (ESR), powder x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS), and x-ray absorption near the edge structure (XANES). Previous electrical resistivity measurements showed that the B samples presented only two superconducting phases with midpoints of the transition temperatures at ∼80 K and ∼105 K. The microwave absorption technique indicated instead the presence of islands which became superconducting at the above-mentioned temperatures also in the A samples. The crystalline and electronic structures of the two types of samples are illustrated and discussed. A plausible theoretical interpretation of the experimental results, based on a quantum percolation model with Coulomb interaction, is also given.

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Variation of electronic structures of CeAl2 thin films with thickness studied by X-ray absorption near-edge structure spectroscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2006.01.004 ◽

2006 ◽

Vol 152 (1-2) ◽

pp. 1-5 ◽

Cited By ~ 2

Author(s):

C.L. Dong ◽

K. Asokan ◽

C.L. Chang ◽

C.L. Chen ◽

P.C. Lee ◽

...

Keyword(s):

Thin Films ◽

Electronic Structures ◽

Edge Structure ◽

X Ray ◽

X Ray Absorption

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Effect of thickness and Si substrate morphology in La0.7Sr0.3MnO3/Si thin films

Acta Crystallographica Section A Foundations and Advances ◽

10.1107/s2053273314084678 ◽

2014 ◽

Vol 70 (a1) ◽

pp. C1532-C1532

Author(s):

Hsiao-Tsu Wang ◽

Mau- Kuen Wu ◽

Yu-Cheng Shao ◽

Yu-Fu Wang ◽

Shang-Hsien Hsieh ◽

...

Keyword(s):

Thin Films ◽

Magnetic Properties ◽

Electronic Structures ◽

Magnetic Circular Dichroism ◽

Magnetic Behavior ◽

Si Substrate ◽

Edge Structure ◽

X Ray ◽

X Ray Absorption ◽

Different Thickness

Investigation has been made on atomic, electronic structures and magnetic properties of La0.7Sr0.3MnO3 (LSMO) on Si substrate. The effect of different thickness of LSMO and different morphological [flat and nano-pyramid (NP)] of Si substrate are studied in present work. The result of Mn K-edge extended x-ray absorption fine structure indicates the more disorder of local atomic structure of first shell (Mn-O bound) in the thinner LSMO/Si film. The Mn L3,2-edge x-ray absorption near-edge structure shows the presence of Mn2+ ion on the sample. Furthermore, the Mn L3,2-edge x-ray magnetic circular dichroism reveals that the thinner film (LSMO/Si) has highest magnetic moment, in comparison to that of thick LSMO/Si and LSMO/Si-NP samples. This finding suggests that the appearance Mn2+ may play an important role in magnetic behavior of hetero-junction LSMnO/Si and Si-NP.

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