scholarly journals Thermal annealing effects on vanadium pentoxide xerogel films

2005 ◽  
Vol 30 (2) ◽  
pp. 7-15 ◽  
Author(s):  
G. N. Barbosa ◽  
C. F.O. Graeff ◽  
H. P. Oliveira
Keyword(s):  
Electrochemical Properties ◽  
Thermal Annealing ◽  
Vanadium Pentoxide ◽  
Water Molecules ◽  
Lithium Ions ◽  
Electrochemical Processes ◽  
Different Temperatures ◽  
Annealing Effects ◽  
Xerogel Films ◽  
Vanadium Pentoxide Xerogel Films

The effect of water molecules on the conductivity and electrochemical properties of vanadium pentoxide xerogel was studied in connection with changes of morphology upon thermal annealing at different temperatures. It was demonstrated that the conductivity was increased for the samples heated at 150ºC and 270ºC compared to the vanadium pentoxide xerogel. It was also verified a stabilization of electrochemical processes of the insertion and de-insertion of lithium ions the structure of thermally annealed vanadium pentoxide.

Effect of hydrogenation on the optical properties and internal electrochromism in vanadium pentoxide xerogel films

2018 ◽  
Vol 656 ◽  
pp. 22-29 ◽  
Author(s):  
S.V. Burdyukh ◽  
O.Ya. Berezina ◽  
A.L. Pergament ◽  
L.A. Lugovskaya ◽  
Yu.G. Kolyagin
Keyword(s):  
Optical Properties ◽  
Vanadium Pentoxide ◽  
Xerogel Films ◽  
Vanadium Pentoxide Xerogel Films

Internal electrochromism in vanadium pentoxide xerogel films

2016 ◽  
Vol 44 ◽  
pp. 78-84 ◽  
Author(s):  
D. Yakovleva ◽  
A. Pergament ◽  
O. Berezina ◽  
P. Boriskov ◽  
D. Kirienko ◽  
...  
Keyword(s):  
Vanadium Pentoxide ◽  
Xerogel Films ◽  
Vanadium Pentoxide Xerogel Films

Computer Simulation of Thermal Annealing Effects on Self Implanted Silicon

1994 ◽  
Vol 373 ◽  
Author(s):  
G. DE Sandre ◽  
L. Colombo ◽  
D. Maric
Keyword(s):  
Molecular Dynamics ◽  
Thermal Annealing ◽  
Room Temperature ◽  
Annealing Temperature ◽  
Tight Binding ◽  
Defect Distribution ◽  
Amorphous Network ◽  
Different Temperatures ◽  
Annealing Effects

AbstractWe investigate the effects of thermal annealing on the structural, elastic and electronic properties of self implanted silicon by tight binding molecular dynamics. The irradiated samples, after a careful relaxation at room temperature, are annealed at different temperatures and for different times and, finally, their properties are carefully monitored during constant temperature simulations. We further provide a characterization of the chemical bonding in the amorphous network and show the evolution of the point defect distribution against maximum annealing temperature.

Conduction mechanism in vanadium pentoxide xerogel films

1987 ◽  
Vol 48 (3) ◽  
pp. 431-434 ◽  
Author(s):  
K. Bali ◽  
L.B. Kiss ◽  
T. Szörényi ◽  
M.I. Török ◽  
I. Hevesi
Keyword(s):  
Vanadium Pentoxide ◽  
Conduction Mechanism ◽  
Xerogel Films ◽  
Vanadium Pentoxide Xerogel Films

Restricted Rotational Motion of InterlayerWaterMolecules in Vanadium Pentoxide Hydrate, V2O5·n D2O, as Studied by Deuterium NMR

2002 ◽  
Vol 57 (6-7) ◽  
pp. 419-424 ◽  
Author(s):  
Sadamu Takeda ◽  
Yuko Gotoh ◽  
Goro Maruta ◽  
Shuichi Takahara ◽  
Shigeharu Kittaka
Keyword(s):  
Double Layer ◽  
Vanadium Pentoxide ◽  
Rotational Motion ◽  
Interlayer Space ◽  
Layer Structure ◽  
Bond Distance ◽  
Adsorbed Water ◽  
Deuterium Nmr ◽  
Water Molecules ◽  
Layer Structures

The rotational behavior of the interlayer water molecules of deuterated vanadium pentoxide hydrate, V2O5.nD2O, was studied by solid-state deuterium NMR for the mono- and double-layer structures of the adsorbed water molecules. The rotational motion was anisotropic even at 355 K for both the mono- and double-layer structures. The 180° flipping motion about the C2-symmetry axis of the water molecule and the rotation around the figure axis, which makes an angle Ɵ with the C2-axis, occurred with the activation energy of (34±4) and (49±6) kJmol-1, respectively. The activation energies were almost independent of the mono- and double-layer structures of the water molecules, but the angle Ɵ made by the two axes varied from 33° for the monolayer to 25° for the double-layer at 230 K. The angle started to decrease above 250 K (e. g. the angle was 17 at 355 K for the double-layer structure). The results indicate that the average orientation of the water molecules in the two dimensional interlayer space depends on the layer structure and on the temperature. From the deuterium NMR spectrum at 130 K, the quadrupole coupling constant e2Qq/h = 240 kHz and the asymmetry parameter η= 0.12 were deduced. These values indicate the average hydrogen bond distance R(O H) = 2.0 Å for the D2O molecules in the 2D-interlayer space

Sign in / Sign up

Export Citation Format

Share Document