Characterization of piezoelectric AlN thin films deposited on Si by RF reactive magnetron sputtering at low temperature for acoustic wave devices
2016 ◽
Vol 26
(4)
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pp. 889-894
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2011 ◽
Vol 13
(2)
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pp. 314-320
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2018 ◽
Vol 54
(2)
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pp. 1434-1442
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2008 ◽
Vol 254
(14)
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pp. 4396-4400
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2017 ◽
Vol 70
(9)
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pp. 856-860
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Keyword(s):
2014 ◽
Vol 10
(5)
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pp. 887-892
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