Using a negative correlation learning method to evolve fault tolerant digital circuits
2011 ◽
Vol 403-408
◽
pp. 915-919
◽
2009 ◽
Vol 72
(13-15)
◽
pp. 2796-2805
◽
2009 ◽
Vol 20
(12)
◽
pp. 1962-1979
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