scholarly journals A Novel Measurement Standard for Surface Roughness on Involute Gears

2021 ◽  
Vol 11 (21) ◽  
pp. 10303
Author(s):  
Felix Steinmeyer ◽  
Dorothee Hüser ◽  
Rudolf Meeß ◽  
Martin Stein
Keyword(s):  
Surface Roughness ◽  
Physical Measurement ◽  
Roughness Measurement ◽  
Measurement Standard ◽  
Coordinate Measurement ◽  
Measurement Systems ◽  
Planar Surfaces ◽  
Involute Gears ◽  
Material Measure ◽  
Roughness Measurements

Although manufacturers of coordinate measurement systems and gear measurement systems already provide instruments that enable an end-of-line-monitoring of the roughness properties of gears, the roughness measurement on gear flanks still lacks traceability with respect to the standardised SI-units. There is still a gap between well standardised roughness measurements on planar surfaces and gear measurements on involutes. This gap is bridged by a novel physical measurement standard (PMS), also referred to as material measure, for roughness measurements on involute gears that has been developed at the Physikalisch-Technische Bundesanstalt (PTB). The necessary transformations between the systems of roughness and gear measurements have been implemented. The measurement standard itself represents calibrated roughness values for the parameters Ra, Rz, Rq, Rk, Rpk and Rvk and Mr1 and Mr2. Furthermore, the PMS can be measured both with classic profilometers as well as gear measurement systems with integrated roughness probes.

Surface Roughness Measurements of a Narrow Borehole — Development of Stylus with Cylindrical Mirror and Lensed Fiber

2014 ◽  
Vol 939 ◽  
pp. 491-498 ◽  
Author(s):  
Eiki Okuyama ◽  
Wataru Yoshinari ◽  
Yuichi Suzuki ◽  
Riku Yoshida ◽  
Ichiro Yoshida ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Optical Signal ◽  
Measurement Range ◽  
Roughness Measurement ◽  
Confined Spaces ◽  
Major Disadvantage ◽  
Measure Surface Roughness ◽  
Cylindrical Mirror ◽  
Surface Profiles ◽  
Roughness Measurements

In various industrial fields, it is frequently necessary to measure surface roughness in confined spaces such as boreholes and grooves. However, using a small stylus, the surface roughness of a narrow borehole can be directly measured only a few millimeters from its end; alternatively, destructive measurements must be performed. This major disadvantage of conventional stylus-based surface profilometers is mainly due to an inductive pick-up that is connected to the stylus used to detect the surface roughness. In this paper, we propose a novel surface roughness measurement sensor. To make the surface roughness sensor small, we used a stylus with a cylindrical mirror and a lensed fiber instead of a conventional inductive pick-up. The proposed sensor converts the signal obtained by measuring the surface roughness of a borehole into an optical signal, which is transferred outside the borehole by an optical fiber. Experimental results demonstrate that this system has a measurement range of 8 μm and a sensitivity of 19 nm. Surface profiles were measured by the proposed sensor and by a conventional surface profiler and the results were found to be very similar.

scholarly journals How levelling and scan line corrections ruin roughness measurement and how to prevent it

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
David Nečas ◽  
Miroslav Valtr ◽  
Petr Klapetek
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Material Science ◽  
Mean Square ◽  
Roughness Measurement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scan Line ◽  
Scale Roughness ◽  
Roughness Measurements

Abstract Surface roughness plays an important role in various fields of nanoscience and nanotechnology. However, the present practices in roughness measurements, typically based on some Atomic Force Microscopy measurements for nanometric roughness or optical or mechanical profilometry for larger scale roughness significantly bias the results. Such biased values are present in nearly all the papers dealing with surface parameters, in the areas of nanotechnology, thin films or material science. Surface roughness, most typically root mean square value of irregularities Sq is often used parameter that is used to control the technologies or to link the surface properties with other material functionality. The error in estimated values depends on the ratio between scan size and roughness correlation length and on the way how the data are processed and can easily be larger than 10% without us noting anything suspicious. Here we present a survey of how large is the problem, detailed analysis of its nature and suggest methods to predict the error in roughness measurements and possibly to correct them. We also present a guidance for choosing suitable scan area during the measurement.

scholarly journals Roughness Measurements with Polychromatic Speckles on Tilted Surfaces

2021 ◽  
Author(s):  
Johannes Stempin ◽  
Andreas Tausendfreund ◽  
Dirk Stöbener ◽  
Andreas Fischer
Keyword(s):  
Surface Roughness ◽  
Experimental Investigations ◽  
Sensor Surface ◽  
Roughness Measurement ◽  
Surface Alignment ◽  
Evaluation Approach ◽  
Speckle Patterns ◽  
Speed Up ◽  
Scattering Centre ◽  
Roughness Measurements

AbstractSurface light scattering enables contactless and fast measurements of surface roughness. A surface inclination alters the direction of the scattering beam and thus the measured surface roughness is calculated from the detected intensity distribution. Hence, an accurate sensor–surface alignment is necessary. In order to achieve tilt-independent roughness measurements, a model-based evaluation approach for polychromatic speckle patterns is presented. By evaluating the shape of the superposed speckles, which occur for polychromatic illumination, with regard to the distance to the scattering centre, surfaces with an Sa roughness value in the range of 0.8–3.2 μm are measurable. Experimental investigations demonstrate that the influence of a surface tilt up to ± 1.25° on the roughness measurement is reduced by 90%. As a result, the robustness of the polychromatic speckle roughness measurement is improved, which allows to speed up the adjustment of the measurement system or the surface sample, respectively.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

State special primary acceleration measurement standard for gravimetry GET 190-2019

2020 ◽  
pp. 3-8
Author(s):  
L.F. Vitushkin ◽  
F.F. Karpeshin ◽  
E.P. Krivtsov ◽  
P.P. Krolitsky ◽  
V.V. Nalivaev ◽  
...  
Keyword(s):  
High Precision ◽  
Free Fall ◽  
Measurement Range ◽  
Measurement Standard ◽  
Acceleration Measurement ◽  
Measurement Systems ◽  
Free Fall Acceleration ◽  
Investigation Methods ◽  
Measurement Results ◽  
Upper Level

The State special primary acceleration measurement standard for gravimetry (GET 190-2019), its composition, principle of operation and basic metrological characteristics are presented. This standard is on the upper level of reference for free-fall acceleration measurements. Its accuracy and reliability were improved as a result of optimisation of the adjustment procedures for measurement systems and its integration within the upgraded systems, units and modern hardware components. A special attention was given to adjusting the corrections applied to measurement results with respect to procedural, physical and technical limitations. The used investigation methods made it possibled to confirm the measurement range of GET 190-2019 and to determine the contributions of main sources of errors and the total value of these errors. The measurement characteristics and GET 90-2019 were confirmed by the results obtained from measurements of the absolute value of the free fall acceleration at the gravimetrical site “Lomonosov-1” and by their collation with the data of different dates obtained from measurements by high-precision foreign and domestic gravimeters. Topicality of such measurements ensues from the requirements to handle the applied problems that need data on parameters of the Earth gravitational field, to be adequately faced. Geophysics and navigation are the main fields of application for high-precision measurements in this field.

Surface Roughness Measurement of Thermal Barrier Coating using Terahertz Waves

2017 ◽  
Vol 137 (3) ◽  
pp. 147-152 ◽  
Author(s):  
Tetsuo Fukuchi ◽  
Norikazu Fuse ◽  
Mitsutoshi Okada ◽  
Tomoharu Fujii ◽  
Maya Mizuno ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Thermal Barrier Coating ◽  
Thermal Barrier ◽  
Roughness Measurement ◽  
Terahertz Waves ◽  
Surface Roughness Measurement ◽  
Barrier Coating

scholarly journals Calibration and uncertainty estimation of non-contact coordinate measurement systems based on Kriging models

2019 ◽  
Vol 57 ◽  
pp. 16-29 ◽  
Author(s):  
Lan Fei ◽  
Jean-Yves Dantan ◽  
Cyrille Baudouin ◽  
Shichang Du
Keyword(s):  
Uncertainty Estimation ◽  
Coordinate Measurement ◽  
Measurement Systems
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