Faculty Opinions recommendation of A high-speed atomic force microscope for studying biological macromolecules.

Author(s):  
Jane Clarke
ChemPhysChem ◽  
2003 ◽  
Vol 4 (11) ◽  
pp. 1196-1202 ◽  
Author(s):  
Toshio Ando ◽  
Noriyuki Kodera ◽  
Yasuyuki Naito ◽  
Tatsuya Kinoshita ◽  
Ken'ya Furuta ◽  
...  

2002 ◽  
Vol 41 (Part 1, No. 7B) ◽  
pp. 4851-4856 ◽  
Author(s):  
Toshio Ando ◽  
Noriyuki Kodera ◽  
Daisuke Maruyama ◽  
Eisuke Takai ◽  
Kiwamu Saito ◽  
...  

2001 ◽  
Vol 98 (22) ◽  
pp. 12468-12472 ◽  
Author(s):  
T. Ando ◽  
N. Kodera ◽  
E. Takai ◽  
D. Maruyama ◽  
K. Saito ◽  
...  

2001 ◽  
Vol 41 (supplement) ◽  
pp. S92 ◽  
Author(s):  
T. Ito ◽  
N. Kodera ◽  
T. Ando

Author(s):  
Janik Schaude ◽  
Maxim Fimushkin ◽  
Tino Hausotte

AbstractThe article presents a redesigned sensor holder for an atomic force microscope (AFM) with an adjustable probe direction, which is integrated into a nano measuring machine (NMM-1). The AFM, consisting of a commercial piezoresistive cantilever operated in closed-loop intermitted contact-mode, is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The axes greatly enlarge the metrology frame of the measuring system by materials with a comparatively high coefficient of thermal expansion. The AFM is therefore operated within a thermostating housing with a long-term temperature stability of 17 mK. The sensor holder, connecting the rotational axes and the cantilever, inserted one adhesive bond, a soldered connection and a geometrically undefined clamping into the metrology circle, which might also be a source of measurement error. It has therefore been redesigned to a clamped senor holder, which is presented, evaluated and compared to the previous glued sensor holder within this paper. As will be shown, there are no significant differences between the two sensor holders. This leads to the conclusion, that the three aforementioned connections do not deteriorate the measurement precision, significantly. As only a minor portion of the positioning range of the piezoelectric actuator is needed to stimulate the cantilever near its resonance frequency, a high-speed closed-loop control that keeps the cantilever within its operating range using this piezoelectric actuator further on as actuator was implemented and is presented within this article.


Sensors ◽  
2021 ◽  
Vol 21 (2) ◽  
pp. 362
Author(s):  
Luke Oduor Otieno ◽  
Bernard Ouma Alunda ◽  
Jaehyun Kim ◽  
Yong Joong Lee

A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of 1μm×1μm with 100×100 pixels.


2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.


2019 ◽  
Vol 30 (2) ◽  
pp. 027002
Author(s):  
Hsien-Shun Liao ◽  
Ka Kit Lei ◽  
Yu Fang Tseng

2016 ◽  
Vol 160 ◽  
pp. 213-224 ◽  
Author(s):  
I. Soltani Bozchalooi ◽  
A. Careaga Houck ◽  
J.M. AlGhamdi ◽  
K. Youcef-Toumi

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