Structural phase transition and negative thermal expansion in Cu1.8Zn0.2V2–x
P
x
O7 solid solutions
Abstract Negative thermal expansion (NTE) is exhibited over the entire x range for Cu1.8Zn0.2V2–xPxO7. In particular, dilatometric measurements using epoxy resin matrix composites containing the spray-dried powder demonstrated that the thermal expansion suppressive capability was almost unchanged for x≤0.1. With increasing x, the x-ray diffraction peak position moves systematically, but some peaks are extremely broad and/or asymmetric, suggesting disorder in the internal structure. The crystallographic analysis confirmed NTE enhancement by microstructural effects at least for x=0.2. Preliminary measurements suggest higher resistivity and lower dielectric constant than that of pure vanadate, which is suitable for application to electronic devices.