Experimental Manipulation of Gold Nano-Particles by Atomic Force Microscope and Investigating Effect of Various Working Parameters

2013 ◽  
Vol 829 ◽  
pp. 831-835
Author(s):  
Seyed Abbas Shahmoradi Zavareh ◽  
Hamid Akbari Moayyer ◽  
Mohammad Amin Ahouei
Keyword(s):  
Experimental Study ◽  
Atomic Force Microscope ◽  
Scanning Speed ◽  
Experimental Manipulation ◽  
Nano Particles ◽  
Mica Surface ◽  
Contact Mode ◽  
Atomic Force ◽  
Gold Nano Particles ◽  
Working Parameters

Due to involvement of various fields of engineering and bio researchers in nanoprojects and their need in achieving certain layout of nanoparticles (NPs) in many research studies, considerable attention is paid to nanomanipulation nowadays. The present experimental study employs Atomic Force Microscope (AFM) in order to push gold nanoparticles on a highly flat mica surface. A silicon probe in contact mode is used to both image and manipulate nanoparticles and Topo and L-R images have been obtained to show the successes of manipulation when proper conditions are fulfilled. The effect of AFM parameters such as applied force, scanning speed and number of pixels of image on nanomanipulation efficiency is investigated. Moreover, the tip is moved along a special path which can be set by software to study manipulation of nanoparticles aggregates. Finally, possible applications of nanomanipulation in nanomechanics, nanoelectronics, nanomaterials and bio-technology are reported and further experimental research works on nanomanipulation are proposed.

scholarly journals Redesigned Sensor Holder for an Atomic Force Microscope with an Adjustable Probe Direction

2021 ◽  
Author(s):  
Janik Schaude ◽  
Maxim Fimushkin ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Piezoelectric Actuator ◽  
High Speed ◽  
Closed Loop ◽  
Coefficient Of Thermal Expansion ◽  
Measuring System ◽  
Contact Mode ◽  
Loop Control ◽  
Atomic Force ◽  
Measuring Machine

AbstractThe article presents a redesigned sensor holder for an atomic force microscope (AFM) with an adjustable probe direction, which is integrated into a nano measuring machine (NMM-1). The AFM, consisting of a commercial piezoresistive cantilever operated in closed-loop intermitted contact-mode, is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The axes greatly enlarge the metrology frame of the measuring system by materials with a comparatively high coefficient of thermal expansion. The AFM is therefore operated within a thermostating housing with a long-term temperature stability of 17 mK. The sensor holder, connecting the rotational axes and the cantilever, inserted one adhesive bond, a soldered connection and a geometrically undefined clamping into the metrology circle, which might also be a source of measurement error. It has therefore been redesigned to a clamped senor holder, which is presented, evaluated and compared to the previous glued sensor holder within this paper. As will be shown, there are no significant differences between the two sensor holders. This leads to the conclusion, that the three aforementioned connections do not deteriorate the measurement precision, significantly. As only a minor portion of the positioning range of the piezoelectric actuator is needed to stimulate the cantilever near its resonance frequency, a high-speed closed-loop control that keeps the cantilever within its operating range using this piezoelectric actuator further on as actuator was implemented and is presented within this article.

scholarly journals Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head

Sensors ◽  
2021 ◽  
Vol 21 (2) ◽  
pp. 362
Author(s):  
Luke Oduor Otieno ◽  
Bernard Ouma Alunda ◽  
Jaehyun Kim ◽  
Yong Joong Lee
Keyword(s):  
Atomic Force Microscope ◽  
Natural Frequency ◽  
High Speed ◽  
Contact Mode ◽  
Ongoing Process ◽  
Atomic Force ◽  
Constant Height ◽  
Mode Tracking

A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of 1μm×1μm with 100×100 pixels.

Design of a compact atomic force microscope to enhance scanning speed

2004 ◽  
Author(s):  
Heung-Keun Park ◽  
Yong K. Hong ◽  
Sung Q. Lee ◽  
Kee S. Moon
Keyword(s):  
Atomic Force Microscope ◽  
Scanning Speed ◽  
Atomic Force

Manipulation of Nickel Nanoparticles Deposited on HOPG

2004 ◽  
Vol 853 ◽  
Author(s):  
Massood Z. Atashbar ◽  
Valery N. Bliznyuk ◽  
Srikanth Singamaneni
Keyword(s):  
Atomic Force Microscope ◽  
Magnetic Force ◽  
Nickel Nanoparticles ◽  
Pyrolytic Graphite ◽  
Critical Force ◽  
Contact Mode ◽  
Cyclic Voltametry ◽  
Atomic Force ◽  
Nickel Nanowires ◽  
Plating Solution

ABSTRACTNickel nanowires were fabricated by electrodepositing Ni from an aqueous plating solution onto the step edges of Highly Oriented Pyrolytic Graphite (HOPG). Freshly cleaved HOPG was exposed to a plating solution of nickel and electro chemically deposited by cyclic voltametry. The morphology of the deposited nanoparticles was studied using an Atomic Force Microscope (AFM) in non-contact mode. The magnetic force of interaction between the nanoparticles was studied by magnetizing the particles. The critical force to displace the nanoparticles was estimated using contact mode of AFM.

Acquisition of High Precision Images for Non-Contact Atomic Force Microscopy via Direct Identification of Sample Height

2005 ◽  
Author(s):  
H. N. Pishkenari ◽  
Nader Jalili ◽  
A. Meghdari
Keyword(s):  
High Precision ◽  
Single Mode ◽  
Scanning Speed ◽  
Sample Surface ◽  
Biological Species ◽  
Atomic Scale ◽  
Contact Mode ◽  
Practical Applications ◽  
Atomic Force ◽  
Sample Height

Atomic force microscopes (AFM) can image and manipulate sample properties at the atomic scale. The non-contact mode of AFM offers unique advantages over other contemporary scanning probe techniques, especially when utilized for reliable measurements of soft samples (e.g., biological species). The distance between cantilever tip and sample surface is a time varying parameter even for a fixed sample height, and hence, difficult to identify. A remedy to this problem is to directly identify the sample height in order to generate high precision, atomic-resolution images. For this, the microcantilever is modeled by a single mode approximation and the interaction between the sample and cantilever is derived from a van der Waals potential. Since in most practical applications only the microcantilever deflection is accessible, this measurement is utilized to identify the sample height in each point. Using the proposed approach for identification of the sample height, the scanning speed can be increased significantly. Furthermore, for taking atomic-scale images of atomically flat samples, there is no need to use the feedback loop to achieve setpoint amplitude. Simulation results are provided to demonstrate the effectiveness of the approach and suggest the most suitable technique for the sample height identification.

Atomic Paths in Scanning of the AFM Tip above the Close-Packed Surface in Repulsive Mode

1998 ◽  
Vol 05 (05) ◽  
pp. 989-996
Author(s):  
E. V. Blagov ◽  
G. L. Klimchitskaya ◽  
V. M. Mostepanenko
Keyword(s):  
Atomic Force Microscope ◽  
Vertical Resolution ◽  
Contact Mode ◽  
Atomic Force ◽  
Elastic Approximation

The paths are calculated for the surface and tip apex atoms when scanning the AFM tip above the close-packed lattice in contact mode. The interaction of the sample and the tip atoms is considered in elastic approximation. The dependence of the atomic paths on the type of the tip and its orientation is investigated. It is shown that the vertical characteristic sizes of the atomic paths are several times larger than the vertical resolution of the atomic force microscope.

Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscope

2010 ◽  
Vol 110 (3) ◽  
pp. 254-258 ◽  
Author(s):  
Tathagata De ◽  
Antony M. Chettoor ◽  
Pranav Agarwal ◽  
Murti V. Salapaka ◽  
Saju Nettikadan
Keyword(s):  
Atomic Force Microscope ◽  
Yeast Cells ◽  
Contact Mode ◽  
Atomic Force ◽  
Intermittent Contact ◽  
Immobilization Method

scholarly journals Análisis de rugosidad y determinación de los desplazamientos en aleaciones de Níquel-Titanio mediante microscopia de fuerza atómica

2015 ◽  
Vol 3 (1) ◽  
pp. 4-8
Author(s):  
Edwin Fernando Mendoza Carreño ◽  
Arturo Plata Gómez
Keyword(s):  
Shape Memory ◽  
Atomic Force Microscope ◽  
Physical Property ◽  
Lateral Force ◽  
Austenite Phase ◽  
Final State ◽  
Contact Mode ◽  
Atomic Force ◽  
Roughness Analysis ◽  
Stimulus Temperature

Introducción: En este trabajo de investigación se analiza una aleación de Níquel (Ni) y Titanio (Ti). Este tipo de materiales poseen la propiedad Física de memoria de forma; la cual consiste en aplicarle una deformación inicial al material, este puede volver a su estado original aplicándole un estímulo externo (temperatura o fuerza). Materiales y métodos: Mediante la utilización de un Microscopio de Fuerza Atómica (AFM). Basados en la información suministrada por el AFM se obtuvieron datos de los desplazamientos que sufre el material utilizando regiones de muestreo de 1 x 1 micras. También, se realizó un análisis de la rugosidad del material, teniendo en cuenta la variación de la topografía a medida que se comprime la muestra. Resultados y Discusión: La transición en los materiales ocurre al pasar de una fase austenita a una fase martensitica cuando el material es sometido a una compresión siendo un estado final de la transformación más estable. Conclusiones: Cuando el AFM se emplea en modo de contacto permite observar como varía la topografía de la muestra lo cual determina el comportamiento de la rugosidad, evidenciada en una disminución del material a medida que se comprime y en el modo de contacto con fuerza lateral. Con el primero se logró observar la forma como rotan las partículas agrupadas en la superficie, cuando se le aplica una fuerza externa.Introduction: In this research an alloy of nickel (Ni) and Titanium (Ti) is analyzed. Such materials possess the physical property of shape memory; which consists of applying an initial deformation to the material, it can return to its original state by applying an external stimulus (temperature or power). Methods: Using an Atomic Force Microscope (AFM) and based on the information provided by the AFM data of displacement experienced by the material using sampling regions of 1 x 1 micron were obtained. Roughness analysis of the material, considering the topography variation as the sample is compressed was also carried out. Results and Discussion: The transition occurs in the material passing an austenite phase to a martensitic phase when the material is subjected to compression to be a final state of stable transformation. Conclusions: When the AFM is used in contact mode allows observing the change the topography of the sample which determine the behavior of the roughness, as evident in a decrease of material as it is compressed and in contact mode lateral force. With the former were able to observe how the grouped rotate on the surface, when an external force is applied particles. 

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