Investigating Kirkendall Effect in Thin Films

Defect and Diffusion Forum ◽

10.4028/www.scientific.net/ddf.369.36 ◽

2016 ◽

Vol 369 ◽

pp. 36-41

Author(s):

János J. Tomán ◽

Yusuke Iguchi ◽

Bence Gajdics

Keyword(s):

Thin Films ◽

Conventional Method ◽

Continuum Model ◽

Binary Systems ◽

Kirkendall Effect ◽

Length Scale ◽

Acta Mater

In binary systems Kirkendall shift is a well-known phenomenon. We investigated nanoscale diffusion in the framework of a recently published continuum model [Erdélyi and Schmitz, Acta. Mater. 60 (2012) 1807]. In thin films the usual vacancy creation and annihilation mechanisms, leading to the Kirkendall shift on larger scales, cannot operate in the same way. On this length-scale the characteristic distances between vacancy sinks and sources can be comparable to the dimension of the sample, causing differences in the development of the Kirkendall effect. Our group recently reported results in simulating nanoscale Kirkendall shift. In present work we show how using conventional method for velocity reconstruction used in multifoil experiments can be misleading if the distribution of vacancy sinks and sources is not uniform.

Download Full-text

Effects of dynamic indentation on the mechanical response of materials

Journal of Materials Research ◽

10.1557/jmr.2008.0205 ◽

2008 ◽

Vol 23 (6) ◽

pp. 1604-1613 ◽

Cited By ~ 21

Author(s):

M.J. Cordill ◽

N.R. Moody ◽

W.W. Gerberich

Keyword(s):

Thin Films ◽

Mechanical Properties ◽

Mechanical Response ◽

Length Scale ◽

Polycrystalline Nickel ◽

Dynamic Indentation ◽

Crystalline Materials ◽

Fused Quartz ◽

Hardness Values ◽

Measured Hardness

Dynamic indentation techniques are often used to determine mechanical properties as a function of depth by continuously measuring the stiffness of a material. The dynamics are used by superimposing an oscillation on top of the monotonic loading. Of interest was how the oscillation affects the measured mechanical properties when compared to a quasi-static indent run at the same loading conditions as a dynamic. Single crystals of nickel and NaCl as well as a polycrystalline nickel sample and amorphous fused quartz and polycarbonate have all been studied. With respect to dynamic oscillations, the result is a decrease of the load at the same displacement and thus lower measured hardness values of the ductile crystalline materials. It has also been found that the first 100 nm of displacement are the most affected by the oscillating tip, an important length scale for testing thin films, nanopillars, and nanoparticles.

Download Full-text

Scratch-Profiles Study in Thin Films Using SEM and EDS

ElectroComponent Science and Technology ◽

10.1155/apec.11.237 ◽

1984 ◽

Vol 11 (3) ◽

pp. 237-241 ◽

Cited By ~ 1

Author(s):

M. El-Shabasy ◽

L. Pogány ◽

G. Konczos ◽

E. Hajtó ◽

B. Szikora

Keyword(s):

Thin Films ◽

Surface Morphology ◽

Critical Load ◽

Conventional Method ◽

Experimental Work ◽

Measuring Method ◽

Shearing Stress ◽

Line Profiles ◽

X Ray ◽

Thickness Profile

The adhesion of evaporated or sputtered thin films to substrates is one of the most important characterising parameters in their fabrication. It is a conventional method to scratch the films using a stylus and evaluate the shearing stress, which is proportional to the energy of adhesion. For the evaluation it is necessary to determine the so-called critical load and the profile of the scratch.The aim during this experimental work was to find a method to evaluate the scratch profile from the X-ray-line profile and SEM pictures. From SEM pictures, the lateral dimensions and surface morphology of the scratches were studied. The thickness was also studied from X-ray-line profiles.In this paper the thickness profile measuring method and the conclusion for the scratch method are discussed.

Download Full-text

Interdiffusion and the Kirkendall Effect in Binary Systems

Thermodynamics, Diffusion and the Kirkendall Effect in Solids ◽

10.1007/978-3-319-07461-0_6 ◽

2014 ◽

pp. 239-298

Author(s):

Aloke Paul ◽

Tomi Laurila ◽

Vesa Vuorinen ◽

Sergiy V. Divinski

Keyword(s):

Binary Systems ◽

Kirkendall Effect

Download Full-text

Dielectric relaxations in ultra-thin films of PMMA: assessing the length scale of cooperativity in the dynamic glass transition

Proceedings 11th International Symposium on Electrets ISE-02 ◽

10.1109/ise.2002.1043027 ◽

2003 ◽

Cited By ~ 8

Author(s):

M. Wubbenhorst ◽

C.A. Murray ◽

J.A. Forrest ◽

J.R. Dutcher

Keyword(s):

Thin Films ◽

Glass Transition ◽

Length Scale ◽

Dielectric Relaxations

Download Full-text

Kinetics of interface alloy phase formation at nanometer length scale in ultra-thin films: X-ray and polarized neutron reflectometry

Progress in Materials Science ◽

10.1016/j.pmatsci.2018.03.005 ◽

2018 ◽

Vol 96 ◽

pp. 1-50 ◽

Cited By ~ 15

Author(s):

Surendra Singh ◽

Mitali Swain ◽

Saibal Basu

Keyword(s):

Thin Films ◽

Phase Formation ◽

Neutron Reflectometry ◽

Length Scale ◽

X Ray ◽

Nanometer Length Scale ◽

Polarized Neutron ◽

Kinetics Of ◽

Polarized Neutron Reflectometry

Download Full-text

Length scale dependent yield strength and fatigue behavior of nanocrystalline Cu thin films

Materials Science and Engineering A ◽

10.1016/j.msea.2011.06.083 ◽

2011 ◽

Vol 528 (25-26) ◽

pp. 7774-7780 ◽

Cited By ~ 30

Author(s):

J.Y. Zhang ◽

X. Zhang ◽

G. Liu ◽

R.H. Wang ◽

G.J. Zhang ◽

...

Keyword(s):

Thin Films ◽

Yield Strength ◽

Fatigue Behavior ◽

Length Scale

Download Full-text

A Cyclic Microbend Study on LIGA Ni Microelectromechanical Systems Thin Films

Journal of Engineering Materials and Technology ◽

10.1115/1.1836767 ◽

2005 ◽

Vol 127 (1) ◽

pp. 16-22 ◽

Cited By ~ 10

Author(s):

J. Lou ◽

P. Shrotriya ◽

W. O. Soboyejo

Keyword(s):

Thin Films ◽

Strain Gradient ◽

Cyclic Deformation ◽

Microelectromechanical Systems ◽

Fatigue Behavior ◽

Cyclic Stress ◽

Length Scale ◽

Gradient Plasticity ◽

Scale Parameters ◽

Reversed Cyclic

This paper presents the results of recent studies of cyclic microbend experiments and their consequences for plasticity length-scale phenomena in LIGA Ni microelectromechanical systems (MEMS) thin films. The strain–life fatigue behavior of LIGA Ni thin films is studied by performing fully reversed cyclic microbend experiments that provide insights into cyclic stress/strain evolution and cyclic failure phenomena. The effects of cyclic deformation on the plasticity length-scale parameters are also considered within the context of strain gradient plasticity theories. The implications of the results are then discussed for the analysis of plasticity and cyclic deformation in MEMS structures and other microscale systems.

Download Full-text