Characterization of an Oxidized Porous Silicon Layer by Complex Process Using RTO and the Fabrication of CPW-Type Stubs on an OPSL for RF Application
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2000 ◽
Vol 69-70
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pp. 182-187
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2013 ◽
Vol 8
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pp. 29-36
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1987 ◽
Vol 45
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pp. 252-253
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