Connector Adapter, Right Angle, RFI Shielded, Electric Connector to Electric Connector

Research on Temperature Stress for Contacts Reliability of Electric Connector

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.945-949.1082 ◽

2014 ◽

Vol 945-949 ◽

pp. 1082-1085

Author(s):

Yong Ying Du ◽

Zhi Li Sun

Keyword(s):

Temperature Field ◽

Temperature Stress ◽

Transfer Functions ◽

Early Stage ◽

Field Analysis ◽

Contact Pair ◽

Temperature Structure ◽

Electrical Connector ◽

Electric Connector ◽

The Impact

Temperature induced degradation is a widely recognized failure phenomenon.However, the basic mechanisms that control the onset and progression of such behavior are not well understood and are a topic of considerable interest in the electrical connector community. In this paper, the simulation analysis of temperature field on this topic are described. The distribution graph of temperature field for the electrical connectors and the highest temperature of the surface of electrical connector was achieved by analyzing a single blade/receptacle contact pair FEA model. A mathematical model was developed that related the early stage temperature levels for the connectors.Additionally, the thermal deformation caused by the temperature had little effect on the contact stress based on temperature - structure coupling field analysis for the electrical connector, the impact of temperature on the electrical connector was mainly reflected in the rate of oxidation of the metal surface. The failure physical process of the electric connector was drawn under temperature stress through the model and theory analysis for the electrical connector , and reliability growth program of the electrical connector was achieved under the temperature influence. The same transfer functions for one type of contact pair were obtained from the simulation, and the results showed that for this limited system, finite element modeling and analysis have great potential for evaluating the influence of design variations on degradation behavior.

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Lubricant for Probe-Based Ferroelectric Recording Devices

STLE/ASME 2008 International Joint Tribology Conference ◽

10.1115/ijtc2008-71311 ◽

2008 ◽

Author(s):

Xiaoping Yan ◽

Paul M. Joes ◽

Lei Li ◽

Yiao-Tee Hsia

Keyword(s):

Analytical Techniques ◽

Low Friction ◽

Recording Technology ◽

Continuous Contact ◽

Storage Devices ◽

Polyphenyl Ether ◽

System A ◽

Diphenyl Ethers ◽

Electric Connector ◽

The Impact

In a probe-based ferroelectric recording system a protective coating of lubricant provides low friction and a low wear rate as well as allows the continuous contact of the probe tip with the storage medium. SO5, a member of the commercially available electric connector lubricants polyphenyl ether (PPE), was experimentally proven effective as a lubricant in supporting this probe/media interface and has enabled the demonstration of the probe-based ferroelectric recording technology. The unique stability of SO5 lubricant in an electric field and in the presence of electrons makes this liquid particularly suitable for ferroelectric recording storage devices. A broad range of analytical techniques were used to identify this lubricant as a mixture of alkylated diphenyl ethers having varying molecular weight. A thin layer of this lubricant was uniformly coated on the probe media surface through a dip-lubing procedure. Its thermal stability and wettability was investigated in terms of the requirements for the successful application of this unique ferroelectric recording technology. The impact of this lubricant film on the read/write capability, durability and tribological performance was also explored.

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