3D TCAD Analysis of Hot-Carrier Degradation Mechanisms in 10 nm Node Input/Output Bulk FinFETs

JSTS Journal of Semiconductor Technology and Science ◽

10.5573/jsts.2016.16.2.191 ◽

2016 ◽

Vol 16 (2) ◽

pp. 191-197 ◽

Author(s):

Dokyun Son ◽

Sangbin Jeon ◽

Myounggon Kang ◽

Hyungcheol Shin

Keyword(s):

Degradation Mechanisms ◽

Input Output ◽

Hot Carrier ◽

Hot Carrier Degradation

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Hot-carrier degradation mechanisms in silicon-On-Insulator MOSFETS

Microelectronics Reliability ◽

10.1016/s0026-2714(96)00262-4 ◽

1997 ◽

Vol 37 (7) ◽

pp. 1003-1013 ◽

Author(s):

Sorin Cristoloveanu

Keyword(s):

Silicon On Insulator ◽

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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Impact of hot carrier degradation on MOSFET small-signal input, output, and transmission features

2014 International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) ◽

10.1109/iccdcs.2014.7016163 ◽

2014 ◽

Author(s):

Daniel Garcia-Garcia ◽

Victor H. Vega-Gonzalez ◽

Reydezel Torres-Torres ◽

Edmundo A. Gutierrez-D

Keyword(s):

Small Signal ◽

Input Output ◽

Hot Carrier ◽

Signal Input ◽

Hot Carrier Degradation

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Competing AC hot-carrier degradation mechanisms in surface-channel p-MOSFETs during pass transistor operation

International Electron Devices Meeting. Technical Digest ◽

10.1109/iedm.1996.554118 ◽

2002 ◽

Author(s):

A. Bravaix ◽

D. Vuillaume ◽

D. Goguenheim ◽

V. Lassarre ◽

M. Haoad

Keyword(s):

Degradation Mechanisms ◽

Hot Carrier ◽

Pass Transistor ◽

Hot Carrier Degradation

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Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. ◽

10.1109/relphy.2003.1197748 ◽

2003 ◽

Author(s):

P. Moens ◽

G. Van den Bosch ◽

G. Groeseneken

Keyword(s):

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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Hot carrier degradation mechanisms in sub-micron p channel MOSFETs: Impact on low frequency (1/f) noise behaviour

Microelectronics Reliability ◽

10.1016/s0026-2714(98)00143-7 ◽

1998 ◽

Vol 38 (6-8) ◽

pp. 931-936 ◽

Author(s):

E. Sheehan ◽

P.K. Hurley ◽

A. Mathewson

Keyword(s):

Low Frequency ◽

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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New hot-carrier degradation mechanisms in 0.25 μm PMOSFETs

Proceedings of 1994 VLSI Technology Symposium ◽

10.1109/vlsit.1994.324417 ◽

2002 ◽

Author(s):

R. Woltjer ◽

G.M. Paulzen ◽

H.G. Pomp ◽

H. Lifka ◽

P.H. Woerlee

Keyword(s):

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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Novel Hot-Carrier Degradation Mechanisms in the Lateral Insulated-Gate Bipolar Transistor on SOI Substrate

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2105494 ◽

2011 ◽

Vol 58 (4) ◽

pp. 1158-1163 ◽

Author(s):

Qinsong Qian ◽

Weifeng Sun ◽

Siyang Liu ◽

Jing Zhu

Keyword(s):

Bipolar Transistor ◽

Degradation Mechanisms ◽

Hot Carrier ◽

Insulated Gate Bipolar Transistor ◽

Hot Carrier Degradation

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A review of hot-carrier degradation mechanisms in MOSFETs

Microelectronics Reliability ◽

10.1016/0026-2714(96)00022-4 ◽

1996 ◽

Vol 36 (7-8) ◽

pp. 845-869 ◽

Author(s):

Alexander Acovic ◽

Giuseppe La Rosa ◽

Yuan-Chen Sun

Keyword(s):

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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Novel device lifetime behavior and hot-carrier degradation mechanisms under V/sub GS/≅V/sub TH/ stress for thin-film SOI nMOSFETs

Proceedings of International Electron Devices Meeting ◽

10.1109/iedm.1995.499301 ◽

2002 ◽

Author(s):

J. Wang-Ratkovic ◽

W.M. Huang ◽

B.Y. Hwang ◽

M. Racanelli ◽

J. Forestner ◽

...

Keyword(s):

Thin Film ◽

Degradation Mechanisms ◽

Hot Carrier ◽

Novel Device ◽

Device Lifetime ◽

Hot Carrier Degradation

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Unified model for n-channel hot-carrier degradation under different degradation mechanisms

Proceedings of International Reliability Physics Symposium RELPHY-96 ◽

10.1109/relphy.1996.492132 ◽

1996 ◽

Author(s):

M. Pagey ◽

R. Milanowski ◽

E. Snyder ◽

N. Bui ◽

B. Deem ◽

...

Keyword(s):

Unified Model ◽

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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