scholarly journals Study of Carbon Nanotube Based Devices Using Scanning Probe Microscope

10.5772/52067 ◽  
2013 ◽  
Author(s):  
Hock Guan ◽  
Junling Wang
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

Scanning Probe Microscope Tip with Carbon Nanotube Truss

2004 ◽  
Vol 43 (7B) ◽  
pp. 4499-4501 ◽  
Author(s):  
Seiji Akita ◽  
Yoshikazu Nakayama
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

Carbon-Nanotube Engineering for Probes and Tweezers Operating in Scanning Probe Microscope

2003 ◽  
Vol 772 ◽  
Author(s):  
Yoshikazu Nakayama ◽  
Seiji Akita
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Knife Edge ◽  
Maximum Current ◽  
Probe Microscope ◽  
Carbon Nanotube Devices ◽  
Scanning Electron

AbstractWe have developed a series of processes for preparing carbon nanotube devices of probes and tweezers that operate in scanning probe microscope (SPM). The main developments are a nanotube cartridge where nanotubes are aligned at a knife-edge to be easily picked up one by one and a scanning-electron-microscope manipulator by which a nanotube is transferred from the nanotube cartridge onto a Si tip under observing its view.We have also developed the electron ablation of a nanotube to adjust its length and the sharpening of a multiwall nanotube to have its inner layer with or without an end cap at the tip. For the sharpening process, the free end of a nanotube protruded from the cartridge was attached onto a metal-coated Si tip and the voltage was applied to the nanotube. At a high voltage giving the saturation of current, the current decreased stepwise in the temporal variation, indicating the sequential destruction of individual nanotube layers. The nanotube was finally cut at the middle of the nanotube bridge, and its tip was sharpened to have an inner layer with an opened end. Moving up the cartridge before cutting enables us to extract the inner layer with an end cap.It is evidenced that the maximum current at each layer during the stepwise decrease depends on its circumference, and the force for extracting the inner layer with ∼ 5nm diameter is ∼ 4 nN.

Carbon nanotube tips for a scanning probe microscope: their fabrication and properties

1999 ◽  
Vol 32 (9) ◽  
pp. 1044-1048 ◽  
Author(s):  
Seiji Akita ◽  
Hidehiro Nishijima ◽  
Yoshikazu Nakayama ◽  
Fuyuki Tokumasu ◽  
Kunio Takeyasu
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

Manipulation of Nanomaterial by Carbon Nanotube Nanotweezers in Scanning Probe Microscope

2002 ◽  
Vol 41 (Part 1, No. 6B) ◽  
pp. 4242-4245 ◽  
Author(s):  
Seiji Akita ◽  
Yoshikazu Nakayama
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

scholarly journals Fabrication of individual aligned carbon nanotube for scanning probe microscope

2005 ◽  
Vol 10 ◽  
pp. 186-189 ◽  
Author(s):  
Shih-Chun Tseng ◽  
Ching-Hsiang Tsai ◽  
Chia-Hung Lee ◽  
Chuen-Horng Tsai ◽  
Shi-Pu Chen ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

Microprocess for fabricating carbon-nanotube probes of a scanning probe microscope

2000 ◽  
Vol 18 (2) ◽  
pp. 661 ◽  
Author(s):  
Yoshikazu Nakayama ◽  
Hidehiro Nishijima ◽  
Seiji Akita ◽  
Ken I. Hohmura ◽  
Shige H. Yoshimura ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

Critical Dimension Measurement Using New Scanning Mode and Aligned Carbon Nanotube Scanning Probe Microscope Tip

2006 ◽  
Vol 45 (3B) ◽  
pp. 1970-1973 ◽  
Author(s):  
Masatoshi Yasutake ◽  
Kazutoshi Watanabe ◽  
Sigeru Wakiyama ◽  
Takehiro Yamaoka
Keyword(s):  
Carbon Nanotube ◽  
Critical Dimension ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Dimension Measurement ◽  
Probe Microscope

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

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