Innovative methods of digital holographic interferometry for non-destructive testing of microelectronics products

Author(s):  
Zakirjan Taxirovich Azamatov ◽  
Nigora Alimdjanovna Akbarova ◽  
Mira Ruzimovna Bekchanova ◽  
M. A. Yoldoshev ◽  
Sanabar Rejepbaevna Reymbaeva
2020 ◽  
Vol 7 (1) ◽  
pp. 14-17
Author(s):  
Аndrei V. Gurevich ◽  
Tatyana S. Bernik

This article discusses the possibilities of holographic interferometry when used in various fields of activity, such as optical processing of received information, optical-electronic instrumentation, interferometry, laser technology, registration and control of fast processes, non-destructive testing of test objects.


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