Room Temperature Coulomb Oscillation for Single Electron Transistor on Atomically Flat Ti/α-Al2O3 Substrate Made by Pulse-Mode AFM Nano-Oxidation Process

1998 ◽  
Author(s):  
Kazuhiko Matsumoto ◽  
Yoshitaka Gotoh ◽  
Tatsuro Maeda ◽  
John A. Dagata ◽  
James S. Harris
1997 ◽  
Author(s):  
Kazuhiko Matsumoto ◽  
Yoshitaka Gotoh ◽  
Jun-ichi Shirakashi ◽  
Tatsuro Maeda ◽  
James S. Harris

2000 ◽  
Vol 10 (01) ◽  
pp. 83-91
Author(s):  
KAZUHIKO MATSUMOTO

A single electron transistor (SET) and a single electron memory were fabricated using the improved pulse-mode AFM nano-oxidation process. A single electron transistor which works as an electrometer for detecting the potential of the memory node of the single electron memory showed clear Coulomb oscillation characteristics with the period of 2.1 V at room temperature. A single electron memory exhibited a hysteresis loop as the memory bias was scanned from 0 to 10 V and then back down to 0 V.


1996 ◽  
Author(s):  
Kazuhiko MATSUMOTO ◽  
Masami ISHII ◽  
Jun-ichi SHIRAKASHI ◽  
Bartev J. VARTANIAN ◽  
James S. HARRIS

Author(s):  
Kazuhiko MATSUMOTO ◽  
Masami ISHII ◽  
Kazuhito SEGAWA ◽  
Yasushi OKA ◽  
Bartev J. VARTANIAN ◽  
...  

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