Influence of the soldering paste type on optical and thermal parameters of LED modules

Purpose This paper presents the results of the investigations of LED modules soldered with the use of different soldering pastes. Design/methodology/approach The tested power LED modules are soldered using different solder pastes and soldering processes. Thermal parameters of the performed modules are tested using indirect electrical methods. The results of measurements obtained for different modules are compared and discussed. Findings It was shown that the soldering process visibly influences the results of measurements of optical and thermal parameters of LED modules. For example, values of thermal resistance of these modules and the efficiency of conversion of electrical energy into light differ between each other even by 15%. Practical implications The obtained results of investigations can be usable for designers of the assembly process of power LED modules. Originality/value This paper shows the investigations results in the area of effective assembly of power LEDs to the metal core printed circuit board (MCPCB) using different soldering pastes (REL22, REL61, LMPA-Q6, OM-5100, OM-338-PT, M8, OM-340, CVP-390). It was shown that the best thermal and optical properties of these modules are obtained for the OM5100 paste by Alpha Assembly.

Understanding the Effect of Reflow Profile on the Metallurgical Properties of Tin–Bismuth Solders

Sn–Bi alloys are desirable candidates for soldering components on printed circuit boards (PCBs) because of their low melting point and reduced cost. While certain tin–bismuth solders are well characterized many new alloys in this family have been developed which need proper characterization. The following study looks at the behavior of four different Sn–Bi alloys—traditional 42Sn58Bi and 42Sn57Bi1Ag and two new tin–bismuth alloys—in solder paste during the reflow soldering process. Each alloy was processed using different reflow profiles that had varying times above liquidus (TALs) and peak temperatures. The PCBs were then analyzed to see how the processing variables influenced wetting, voiding, microstructure, intermetallic layer composition, and thickness. After analysis, the PCBs were then subjected to thermal cycling experiments to see how reflow profile impacted microstructure evolution. The results demonstrated that reflow profile affects properties such as metal wetting and voiding. It does not however, greatly impact key metallurgical properties such as intermetallic layer thickness.

Electromigration and Flux Residues

Electromigration and its subcategory electrochemical migration is a serious problem in electronic industry working with printed circuit boards (PCB). Smaller equipment with high density of interconnection (HDI) is assembled with surface mounted devices (SMD) and through hole components (THC) Assembly techniques are realised mainly by soldering process with no clean fluxes. Result is not only a reliable solder joint, but also flux residues. The first part of the article after short theory is focused on gatering basic knowledge about fluxes and surface finishes by using cyclic voltammetry (CV) and electrochemical impedance spectrometry (EIS). The second part of the experiments is oriented on practical test with different fluxes for wave and reflow soldering. These tests are associated with the reduction of surface insulation resistance, corrosion, dendrite/fiber growth and the formation of subsequent short circuits. The acceleration of these electrochemical reactions is helped by higher working temperatures, higher humidity, and magnitude \ and frequency of electrical voltage between the conductors.

Fluxless Direct Soldering of Transparent Conductive Oxides (TCOs) to Copper

Due to the combined advantages of low cost, good soldering properties, and appropriate melting temperature range, novel Sn8Zn3Bi1Mg active solder was developed for direct soldering of transparent conductive oxide (TCO) ceramic targets with oxygen-free copper at 200°C in air. The TCO specimens have aluminum-doped zinc oxide (AZO) and zinc oxide (ZnO) ceramics. The direct soldering process was performed without the need for flux or pre-metallization of the two transparent conductive oxides. The microstructure, phase constitution, melting characteristics, and soldering properties of the Sn8Zn3Bi1Mg active solder were investigated. The liquidus temperature of the Sn8Zn3Bi1Mg active solder was 198.6°C, which was very close to the binary Sn-Zn eutectic temperature of 198.5°C. The effect of temperature on the bonding strength of the solder joints was evaluated. The shear strengths of AZO/Cu and ZnO/Cu joints soldered with Sn8Zn3Bi1Mg active solder were 10.3 and 7.5 MPa at room temperature, respectively. Increasing the temperature from room temperature to 180°C reduced the bonding shear strengths of AZO/Cu and ZnO/Cu joints to 3.3 and 3.7 MPa, respectively.

Characterization of Sn–Sb–Ti Solder Alloy and the Study of Its Use for the Ultrasonic Soldering Process of SiC Ceramics with a Cu–SiC Metal–Ceramic Composite

The aim of this research was to characterize soldering alloys of the type Sn–Sb–Ti and to study the ultrasonic soldering of SiC ceramics with a metal–ceramic composite of the type Cu–SiC. The Sn5Sb3Ti solder exerts a thermal transformation of a peritectic character with an approximate melting point of 234 °C and a narrow melting interval. The solder microstructure consists of a tin matrix, where the acicular constituents of the Ti6(Sb,Sn)5 phase and the sharp-edged constituents of the TiSbSn phase are precipitated. The tensile strength of the soldering alloy depends on the Ti content and reaches values from 34 to 51 MPa. The average strength of the solder increases with increasing Ti content. The bond with SiC ceramics is formed owing to the interaction of titanium, activated by ultrasound, with SiC ceramics, forming the (Ti,Si)6(Sb,Sn)5 reaction product. The bond with the metal–ceramic composite Cu–SiC is formed owing to the solubility of Cu in a tin solder forming two phases: the wettable η-Cu6Sn5 phase, formed in contact with the solder, and the non-wettable ε-Cu3Sn phase, formed in contact with the copper composite. The average shear strength of the combined joint of SiC/Cu–SiC fabricated using the Sn5Sb3Ti solder was 42.5 MPa. The Sn–Sb–Ti solder is a direct competitor of the S-Bond active solder. The production of solders is cheaper, and the presence of antimony increases their strength. In addition, the application temperature range is wider.

Mechanisms of structural-phase transformations during crystallization of solder melt under conditions of magnetic-dynamic influences for carbide tools

The processes of melt formation were studied by methods of optical and electron scanning microscopy. These processes occur during induction brazing of a hard alloy to a steel holder and contact interaction of low-melting (copper-zinc system alloy) and refractory (iron-nickel) components of the solders. It is shown that the effect of a thermal and magnetic-dynamic high-frequency electromagnetic field on the components of the composite solder is how a high-strength solder joint is formed. The structure is forming by disperse hardening mechanism. The research of the contact interaction process for low-melting and high-melting components of solders during the soldering process of the tool showed that the formation of solder in brazed seams occurs through a number of stages and this does not lead to the formation of microstructures that are characteristic of alloys based on copper-iron-phosphorus, copper-zinc-nickel and copper-zinc-iron. Thus, the use of composite solders can reduce the soldering temperature by 40-50 K and increase the concentration of alloying species in the solder and change its structure. These advantages of composite solders reduce the thermal impact on contact materials, increase the strength of the weld and allow you to control the thickness of the brazed weld, and this is important when soldering hard alloys of WC-TiC (TaC) systems. High initial dissolution rates of nickel particles in the copper-zinc melt and the solubility of copper, zinc in nickel lead to the formation in the melt of quasi-liquid particles of the nickel alloy. When the melt is cooled, particles other than the surrounding alloy composition are formed. They are morphologically related to the grain structure of the solder. The formed alloy (solder) has the structure of a composite material in which the metal particles are enriched in nickel, and have the role of a reinforcing element.

Influence of copper pillar bump structure on flip chip packaging during reflow soldering: a numerical approach

Purpose The purpose of this paper is to present the experimental and simulation studies on the influence of copper pillar bump structure on flip chip packaging during reflow soldering. Design/methodology/approach In this work, solidification/melting modelling and volume of fluid modelling were used. Reflow soldering process of Cu pillar type FC was modelled using computational fluid dynamic software (FLUENT). The experimental results have been validated with the simulation results to prove the accuracy of the numerical method. Findings The findings of this study reveal that solder volume is the most important element influencing reflow soldering. The solder cap volume reduces as the Cu pillar bump diameter lowers, making the reflow process more difficult to establish a good solder union, as less solder is allowed to flow. Last but not least, the solder cap height for the reflow process must be optimized to enable proper solder joint formation. Practical implications This study provides a basis and insights into the impact of copper pillar bump structure on flip chip packaging during reflow soldering that will be advancing the future design of 3D stack package. This study also provides a superior visualization and knowledge of the melting and solidification phenomenon during the reflow soldering process. Originality/value The computational fluid dynamics analysis of copper pillar bump structure on flip chip packaging during reflow soldering is scant. To the authors’ best knowledge, no research has been concentrated on copper pillar bump size configurations in a thorough manner. Without the in-depth study, copper pillar bump size might have the impact of copper pillar bump structure on flip chip packaging during reflow soldering. Five design of parameter of flip chip IC package model was proposed for the investigation of copper pillar bump structure on flip chip packaging during reflow soldering.

Influence of moisture concentration and hydrophobic material on induced stress in FCBGA package under reflow

Purpose This paper focuses on the fluid-structure interaction (FSI) analysis of moisture induced stress for the flip chip ball grid array (FCBGA) package with hydrophobic and hydrophilic materials during the reflow soldering process. The purpose of this paper is to analyze the influence of moisture concentration and FCBGA with hydrophobic material on induced pressure and stress in the package at varies times. Design/methodology/approach The present study analyzed the warpage deformation during the reflow process via visual inspection machine (complied to Joint Electron Device Engineering Council standard) and FSI simulation by using ANSYS/FLUENT package. The direct concentration approach is used to model moisture diffusion and ANSYS is used to predict the Von-Misses stress. Models of Test Vehicle 1 (similar to Xie et al., 2009b) and Test Vehicle 2 (FCBGA package) with the combination of hydrophobic and hydrophilic materials are performed. The simulation for different moisture concentrations with reflows process time has been conducted. Findings The results from the mechanical reliability study indicate that the FSI analysis is found to be in good agreement with the published study and acceptable agreement with the experimental result. The maximum Von-Misses stress induced by the moisture significantly increased on FCBGA with hydrophobic material compared to FCBGA with a hydrophilic material. The presence of hydrophobic material that hinders the moisture desorption process. The analysis also illustrated the moisture could very possibly reside in electronic packaging and developed beyond saturated vapor into superheated vapor or compressed liquid, which exposed electronic packaging to higher stresses. Practical implications The findings provide valuable guidelines and references to engineers and packaging designers during the reflow soldering process in the microelectronics industry. Originality/value Studies on the influence of moisture concentration and hydrophobic material are still limited and studies on FCBGA package warpage under reflow process involving the effect of hydrophobic and hydrophilic materials are rarely reported. Thus, this study is important to effectively bridge the research gap and yield appropriate guidelines in the microelectronics industry.

Influence of Laser Soldering Temperatures On Thru-Hole Component

The conventional method of selective soldering has been practiced using wave soldering, convection reflow, and hand soldering. However, due to industry automation and high demand for quality, repeatability and flexibility, laser soldering process has been developed to meet these demands. This paper investigates the effect of different temperature of laser soldering process on lead free solder (SAC305) by means of numerical method that is validated by experiment. Finite Volume Method (FVM) was used for the three-dimensional (3D) simulation to simulate the filling flow of the lead-free solder. Experiments were carried out to complement simulation validity and the results of far both methods have reached a good agreement. The findings show that a better result can be achieved when angle of lead component (?le) approaches 90°. Using the optimized lead angle, five different temperature simulations were set in the range of 550K < T < 700K. The finding shows that, 600K has the best velocity and pressure distributions with average values of 63.3 mm/s and 101.1386kPa, respectively. The high-pressure region is concentrated at the top and bottom surface of solder pad. High difference in pressure and velocity spots somehow lead to issue associated with possibility of incomplete filling or void formation. 650K model shows less void formation since it produces high pressure filling flow within the solder region.