ChemInform Abstract: Encapsulation of the Transition Metals Chromium Through Cobalt in Zirconium Cluster Iodides.

ChemInform ◽  
1988 ◽  
Vol 19 (22) ◽  
Author(s):  
T. HUGHBANKS ◽  
G. ROSENTHAL ◽  
J. D. CORBETT
1988 ◽  
Vol 110 (5) ◽  
pp. 1511-1516 ◽  
Author(s):  
Timothy. Hughbanks ◽  
Guy. Rosenthal ◽  
John D. Corbett

Author(s):  
R.W. Carpenter

Interest in precipitation processes in silicon appears to be centered on transition metals (for intrinsic and extrinsic gettering), and oxygen and carbon in thermally aged materials, and on oxygen, carbon, and nitrogen in ion implanted materials to form buried dielectric layers. A steadily increasing number of applications of microanalysis to these problems are appearing. but still far less than the number of imaging/diffraction investigations. Microanalysis applications appear to be paced by instrumentation development. The precipitation reaction products are small and the presence of carbon is often an important consideration. Small high current probes are important and cryogenic specimen holders are required for consistent suppression of contamination buildup on specimen areas of interest. Focussed probes useful for microanalysis should be in the range of 0.1 to 1nA, and estimates of spatial resolution to be expected for thin foil specimens can be made from the curves shown in Fig. 1.


1971 ◽  
Vol 32 (C1) ◽  
pp. C1-74-C1-75 ◽  
Author(s):  
K. ENDO ◽  
Y. FUJITA ◽  
R. KIMURA ◽  
T. OHOYAMA ◽  
M. TERADA

1974 ◽  
Vol 35 (C6) ◽  
pp. C6-184-C6-184
Author(s):  
J. BINDER ◽  
G. KAINDL ◽  
D. SALOMON ◽  
G. WORTMANN

1980 ◽  
Vol 41 (C8) ◽  
pp. C8-503-C8-506 ◽  
Author(s):  
J. B. Van Zytveld

1980 ◽  
Vol 41 (C8) ◽  
pp. C8-423-C8-426
Author(s):  
S. N. Khanna ◽  
F. Cyrot-Lackmann

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