In situ studies of the spiral growth of zinc thiourea sulphate crystals with ethylene diamine tetraacetic acid doped by atomic force microscopy

2014 ◽  
Vol 49 (9) ◽  
pp. 743-752 ◽  
Author(s):  
Jie Song ◽  
Mingwei Li ◽  
Min Cheng ◽  
Zhitao Hu ◽  
Yachao Cao
Keyword(s):  
Atomic Force Microscopy ◽  
Ethylene Diamine Tetraacetic Acid ◽  
Spiral Growth ◽  
Ethylene Diamine ◽  
Tetraacetic Acid ◽  
Force Microscopy ◽  
In Situ Studies ◽  
Atomic Force

In situ studies of thiol self-assembly on gold from solution using atomic force microscopy

1998 ◽  
Vol 108 (12) ◽  
pp. 5002-5012 ◽  
Author(s):  
Song Xu ◽  
Sylvain J. N. Cruchon-Dupeyrat ◽  
Jayne C. Garno ◽  
Gang-Yu Liu ◽  
G. Kane Jennings ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Self Assembly ◽  
Force Microscopy ◽  
In Situ Studies ◽  
Atomic Force

scholarly journals Erratum: “In situ studies of thiol self-assembly on gold from solution using atomic force microscopy” [J. Chem. Phys. 108, 5002 (1998)]

2000 ◽  
Vol 113 (20) ◽  
pp. 9357-9357
Author(s):  
Song Xu ◽  
Sylvain J. N. Cruchon-Dupeyrat ◽  
Jayne C. Garno ◽  
Gang-Yu Liu ◽  
G. Kane Jennings ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Self Assembly ◽  
Chem Phys ◽  
Force Microscopy ◽  
In Situ Studies ◽  
Atomic Force

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)

2001 ◽  
Vol 167 (1) ◽  
pp. 139-151 ◽  
Author(s):  
Connie J. Rossini ◽  
Justinn F. Arceo ◽  
Evan R. McCarney ◽  
Brian H. Augustine ◽  
Douglas E. Dennis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force
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