Calibration and Use of an Electron Microscope for Precision Micromeasurements in Thin Film Materials

1967 ◽  
Vol 19 (1) ◽  
pp. 7-34 ◽  
Author(s):  
L. E. Murr
Keyword(s):  
Thin Film ◽  
Electron Microscope

Clean Electron Microscope Substrate Films Used for Micrometeorite Collection and Study

1967 ◽  
Vol 25 ◽  
pp. 366-367
Author(s):  
D. M. Davies ◽  
R. Kemner ◽  
E. F. Fullam
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
High Altitude ◽  
Amyl Acetate ◽  
Temperature Variations ◽  
Film Forming ◽  
Film Specimen ◽  
Particulate Contaminants

All serious electron microscopists at one time or another have been concerned with the cleanliness and freedom from artifacts of thin film specimen support substrates. This is particularly important where there are relatively few particles of a sample to be found for study, as in the case of micrometeorite collections. For the deposition of such celestial garbage through the use of balloons, rockets, and aircraft, the thin film substrates must have not only all the attributes necessary for use in the electron microscope, but also be able to withstand rather wide temperature variations at high altitude, vibration and shock inherent in the collection vehicle's operation and occasionally an unscheduled violent landing.Nitrocellulose has been selected as a film forming material that meets these requirements yet lends itself to a relatively simple clean-up procedure to remove particulate contaminants. A 1% nitrocellulose solution is prepared by dissolving “Parlodion” in redistilled amyl acetate from which all moisture has been removed.

Studies on Water in the Hydration Chamber of a Modified Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 544-545
Author(s):  
R. C. Moretz ◽  
G. G. Hausner ◽  
D. F. Parsons
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Electron Microscope ◽  
Steady State ◽  
Room Temperature ◽  
Small Mass ◽  
Equilibrium Pressure ◽  
Biological Objects ◽  
Mechanical Pump ◽  
Differential Pumping

Use of the electron microscope to examine wet objects is possible due to the small mass thickness of the equilibrium pressure of water vapor at room temperature. Previous attempts to examine hydrated biological objects and water itself used a chamber consisting of two small apertures sealed by two thin films. Extensive work in our laboratory showed that such films have an 80% failure rate when wet. Using the principle of differential pumping of the microscope column, we can use open apertures in place of thin film windows.Fig. 1 shows the modified Siemens la specimen chamber with the connections to the water supply and the auxiliary pumping station. A mechanical pump is connected to the vapor supply via a 100μ aperture to maintain steady-state conditions.

scholarly journals Optoelectronic properties of highly porous silver oxide thin film

2021 ◽  
Vol 3 (1) ◽  
Author(s):  
Ahmad Al-Sarraj ◽  
Khaled M. Saoud ◽  
Abdelaziz Elmel ◽  
Said Mansour ◽  
Yousef Haik
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Electron Microscope ◽  
Plasma Etching ◽  
Silver Oxide ◽  
Oxidation Time ◽  
Oxide Thin Film ◽  
X Ray ◽  
Porous Silver ◽  
Highly Porous

Abstract In this paper, we report oxidation time effect on highly porous silver oxide nanowires thin films fabricated using ultrasonic spray pyrolysis and oxygen plasma etching method. The NW’s morphological, electrical, and optical properties were investigated under different plasma etching periods and the number of deposition cycles. The increase of plasma etching and oxidation time increases the surface roughness of the Ag NWs until it fused to form a porous thin film of silver oxide. AgNWs based thin films were characterized using X-ray diffraction, scanning electron microscope, transmission electron microscope, X-ray photoemission spectroscopy, and UV–Vis spectroscopy techniques. The obtained results indicate the formation of mixed mesoporous Ag2O and AgO NW thin films. The Ag2O phase of silver oxide appears after 300 s of oxidation under the same conditions, while the optical transparency of the thin film decreases as plasma etching time increases. The sheet resistance of the final film is influenced by the oxidation time and the plasma application periodicity. Graphic abstract

scholarly journals Structure and Optical Properties of Al-Doped ZnO Nanodrums as Anti-Reflection Coating Material in Solar Cells

2019 ◽  
Vol 20 (1) ◽  
pp. 54
Author(s):  
Putri Luthfiana Sari ◽  
Hanik Munawaroh ◽  
Sayekti Wahyuningsih ◽  
Ari Handono Ramelan
Keyword(s):  
Thin Film ◽  
Optical Properties ◽  
Solar Cells ◽  
Electron Microscope ◽  
Dye Sensitized Solar Cells ◽  
Blue Shift ◽  
Transmission Electron ◽  
Visible Spectra ◽  
Doped Zno ◽  
Sensitized Solar Cells

Al-doped ZnO (AZO) nanodrums were synthesized using hydrothermal method at 80 °C for 20 h using precursor Zn(CH3COO)2·2H2O and Al(OH)(CH3COO)2 as a dopant by varying the addition of Al concentrations in the range of 0, 1, 5, 10, 15, and 20 mM. The variation of Al can affect structure properties, optical properties and the crystal growths of ZnO. Addition of Al can inhibit the crystal growth with the decrease of the crystal size ranging from about 43.46 to 37.21 nm. Morphology of Al variation doped ZnO of Al was studied using a Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM) and showed nanodrums morphology. Optical properties of thin film AZO was evaluated using UV-Visible spectrophotometer. The transmission spectra showed that AZO has ~85% transparency in the visible spectra with a sharp peak in the UV region. AZO with the addition of 20 mM Al has the largest transmittance and the lowest reflectance. The crystallite size of AZO can affect optical properties with the occurrence of blue shift. The thin film with transparent properties is a good candidate for application in the dye-sensitized solar cells, such as anti-reflecting coating. AZO was prepared as anti-reflection on the DSSCs system. The best efficiency of DSSCs performance was examined by varying the thickness of the layers of AZO and pointed an efficiency improvement up to 18.29 times.

The Photoluminescence Spectra Research of SiC Thin Film under Different Sputtering Powers

2019 ◽  
Vol 295 ◽  
pp. 93-97
Author(s):  
Chang Zhao ◽  
Man Zhao ◽  
Su Ye Lv ◽  
Qing Jun Liu ◽  
Guang Jian Xing
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Crystal Morphology ◽  
Growth Conditions ◽  
Photoluminescence Spectra ◽  
Experimental Conditions ◽  
Grain Sizes ◽  
Power Inputs ◽  
Scanning Electron

This study prepared an SiC thin film by using the ratio frequency magnetron sputtering method, investigated the effects of different sputtering powers on the SiC material and analysed the changes in crystal morphology and photoluminescence characteristics caused by changes in the growth conditions used. It was considered that there was 6H-SiC crystal morphologies in the SiC thin film under the experimental conditions prevailing in this study. The SiC morphologies with small grain sizes intermingled and therefore formed anSiC thin film. The analyses of the photoluminescence spectra and Scanning Electron Microscope indicated that the SiC thin film materials with preferable crystal compositions could be prepared under appropriate power inputs.

scholarly journals On the Influence of Applied Fields on Spinel Formation

1999 ◽  
Vol 586 ◽  
Author(s):  
C. Korte ◽  
J. K. Farrer ◽  
N. Ravishankar ◽  
J. R. Michael ◽  
H. Schmalzried ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
Solid State ◽  
Electric Fields ◽  
Phase Boundaries ◽  
Electron Backscattered Diffraction ◽  
Backscattered Electron ◽  
Applied Fields ◽  
Mgo Substrate ◽  
Scanning Electron

ABSTRACTInterfaces play an important role in determining the effect of electric fields on the mechanism of the formation of spinel by solid-state reaction. The reaction occurs by the movement of phase boundaries but the rate of this movement can be affected by grain boundaries in the reactants or in the reaction product. Only by understanding these relationships will it be possible to engineer their behavior. As a particular example of such a study, Mgln2O4 can be formed by the reaction between single-crystal MgO substrate and a thin film of In2O3with or without an applied electric field. High-resolution backscattered electron (BSE) imaging and electron backscattered diffraction (EBSD) in a scanning electron microscope (SEM) has been used to obtain complementary chemical and crystallographic information.

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