Radiative Pion Capture and Charged Photo-Pion Production in the Threshold Region

Author(s):  
H. W. Baer
2011 ◽  
Vol 198 (1) ◽  
pp. 133-140
Author(s):  
D. Hornidge ◽  
A. M. Bernstein

2003 ◽  
Vol 721 ◽  
pp. C735-C738
Author(s):  
Masahiro Yamaguchi ◽  
Atsushi Hosaka

2005 ◽  
Vol 20 (02n03) ◽  
pp. 590-592
Author(s):  
S. KREWALD ◽  
S. SCHNEIDER ◽  
U.-G. MEIßNER

Two-pion production in the pion-nucleon reaction is studied in a meson-exchange model with resonances. The model matches with chiral perturbation theory in the threshold region and includes unitarization effects at the two-particle level. Results are compared with the recent BNL data.


1983 ◽  
Vol 28 (11) ◽  
pp. 2714-2720 ◽  
Author(s):  
D. Day ◽  
R. Ammar ◽  
D. Coppage ◽  
R. Davis ◽  
N. Kwak ◽  
...  

1974 ◽  
Vol 33 (7) ◽  
pp. 448-451 ◽  
Author(s):  
S. J. Barish ◽  
Y. Cho ◽  
M. Derrick ◽  
L. G. Hyman ◽  
J. Rest ◽  
...  

2021 ◽  
Vol 11 (1) ◽  
pp. 6
Author(s):  
Orazio Aiello

The paper deals with the immunity to Electromagnetic Interference (EMI) of the current source for Ultra-Low-Voltage Integrated Circuits (ICs). Based on the properties of IC building blocks, such as the current-splitter and current correlator, a novel current generator is conceived. The proposed solution is suitable to provide currents to ICs operating in the sub-threshold region even in the presence of an electromagnetic polluted environment. The immunity to EMI of the proposed solution is compared with that of a conventional current mirror and evaluated by analytic means and with reference to the 180 nm CMOS technology process. The analysis highlights how the proposed solution generates currents down to nano-ampere intrinsically robust to the Radio Frequency (RF) interference affecting the input of the current generator, differently to what happens to the output current of a conventional mirror under the same conditions.


1975 ◽  
Vol 58 (4) ◽  
pp. 428-430 ◽  
Author(s):  
P. Ebersold ◽  
B. Aas ◽  
W. Dey ◽  
R. Eichler ◽  
H.J. Leisi ◽  
...  

1975 ◽  
Vol 34 (15) ◽  
pp. 991-991 ◽  
Author(s):  
J. Papp ◽  
J. Jaros ◽  
L. Schroeder ◽  
J. Staples ◽  
H. Steiner ◽  
...  
Keyword(s):  

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