Single-shot time-resolved X-ray scattering measurements of polycrystalline and amorphous materials under shock wave loading

2013 ◽  
pp. 3489-3496
Author(s):  
Kouhei Ichiyanagi ◽  
Kawai Nobuaki ◽  
Shunsuke Nozawa ◽  
Tokushi Sato ◽  
Jianbo Hu ◽  
...  
Keyword(s):  
Shock Wave ◽  
Amorphous Materials ◽  
Single Shot ◽  
Shock Wave Loading ◽  
Wave Loading ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

Single-Shot Time-Resolved X-Ray Scattering Measurements of Polycrystalline and Amorphous Materials Under Shock Wave Loading

PRICM ◽  
2013 ◽  
pp. 3489-3496
Author(s):  
Kouhei Ichiyanagi ◽  
Kawai Nobuaki ◽  
Shunsuke Nozawa ◽  
Tokushi Sato ◽  
Jianbo Hu ◽  
...  
Keyword(s):  
Shock Wave ◽  
Amorphous Materials ◽  
Single Shot ◽  
Shock Wave Loading ◽  
Wave Loading ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

scholarly journals Fast acquisition protocol for X-ray scattering tensor tomography

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Jisoo Kim ◽  
Matias Kagias ◽  
Federica Marone ◽  
Zhitian Shi ◽  
Marco Stampanoni
Keyword(s):  
Null Space ◽  
Sufficient Information ◽  
Single Shot ◽  
Time Resolved ◽  
X Ray ◽  
Circular Pattern ◽  
Rapid Acquisition ◽  
Tensor Tomography ◽  
X Ray Scattering ◽  
Ray Scattering

AbstractMicrostructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. X-ray scattering tensor tomography with the use of this circular grating array has been demonstrated. We propose here simple yet inherently rapid acquisition protocols for X-ray scattering tensor tomography leveraging on these new optical elements. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.

Time-resolved small-angle x-ray scattering measurements of a polymer bicontinuous microemulsion structure factor under shear

2002 ◽  
Vol 66 (4) ◽  
Author(s):  
Franklin E. Caputo ◽  
Wesley R. Burghardt ◽  
Kasiraman Krishnan ◽  
Frank S. Bates ◽  
Timothy P. Lodge
Keyword(s):  
Small Angle ◽  
Structure Factor ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Bicontinuous Microemulsion ◽  
Scattering Measurements ◽  
Ray Scattering

First performance assessment of the small-angle X-ray scattering beamline at ELETTRA

1998 ◽  
Vol 5 (3) ◽  
pp. 506-508 ◽  
Author(s):  
H. Amenitsch ◽  
M. Rappolt ◽  
M. Kriechbaum ◽  
H. Mio ◽  
P. Laggner ◽  
...  
Keyword(s):  
Small Angle ◽  
Wide Angle ◽  
Fibrous Materials ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Scattering Measurements ◽  
Double Focusing ◽  
Ray Scattering

The double-focusing high-flux wiggler beamline dedicated to small-angle X-ray scattering (SAXS) and wide-angle X-ray scattering (WAXS) at ELETTRA has gone into user operation recently. It has been designed specifically for time-resolved studies of non-crystalline and fibrous materials in the submillisecond time scale, and has been optimized for small-angle scattering measurements. An overview of the beamline status and of some representative results, highlighting the performance of the SAXS beamline, are given.

Correlation of nanostructural parameters and macromechanical behaviour of hyperbranched-modified polypropylene using time-resolved small-angle X-ray scattering measurements

2012 ◽  
Vol 62 (7) ◽  
pp. 1101-1111 ◽  
Author(s):  
Morteza Ganjaee Sari ◽  
Norbert Stribeck ◽  
Siamak Moradian ◽  
Ahmad Zeinolebadi ◽  
Saeed Bastani ◽  
...  
Keyword(s):  
Small Angle ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

Performance and First Results of the ELETTRA High-Flux Beamline for Small-Angle X-ray Scattering

1997 ◽  
Vol 30 (5) ◽  
pp. 872-876 ◽  
Author(s):  
H. Amenitsch ◽  
S. Bernstorff ◽  
M. Kriechbaum ◽  
D. Lombardo ◽  
H. Mio ◽  
...  
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
Design Parameters ◽  
High Flux ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

A new beamline for small-angle X-ray scattering (SAXS) has recently been constructed and is presently under final commissioning at the 2 GeV storage ring ELETTRA. It has been designed specifically for time-resolved studies of non-crystalline and fibrous materials and has been optimized for small-angle scattering measurements. The beamline operates with a SAXS resolution between 10 and about 1400 Å in d spacing (at 8 keV) and has been optimized with respect to high flux at the sample [of the order of 1013 photons s−1 for 8 keV photons (2 GeV, 400 mA)]. Soon it will be possible to perform simultaneously wide-angle diffraction measurements in the d-spacing range 1.2–8 Å (at 8 keV). In order to allow time-resolved (resolution ~1 ms) small-angle scattering measurements, a high-power 57-pole wiggler is used as the beamline source. From its beam, one of three discrete energies, 5.4, 8 and 16 keV, can be selected with a double-crystal monochromator, which contains three pairs of asymmetrically cut plane Si(111) crystals. Downstream, the beam is focused horizontally and vertically by a toroidal mirror. Commissioning tests of this new SAXS beamline showed that all design parameters have been realized.

scholarly journals Fast Acquisition Protocol for X-ray Scattering Tensor Tomography

2021 ◽  
Author(s):  
Jisoo Kim ◽  
Matias Kagias ◽  
Federica Marone ◽  
Zhitian Shi ◽  
Marco Stampanoni
Keyword(s):  
Null Space ◽  
Sufficient Information ◽  
Single Shot ◽  
Time Resolved ◽  
X Ray ◽  
Circular Pattern ◽  
Rapid Acquisition ◽  
Tensor Tomography ◽  
X Ray Scattering ◽  
Ray Scattering

Abstract Microstructural information over an entire sample is important to understand the macroscopic behavior of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. Leveraging on these new optical elements, we propose here simple yet inherently rapid acquisition protocols forX-ray scattering tensor tomography. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.

Scaling in Charge-Density-Wave Relaxation: Time-Resolved X-Ray Scattering Measurements

1999 ◽  
Vol 82 (9) ◽  
pp. 1923-1926 ◽  
Author(s):  
K. L. Ringland ◽  
A. C. Finnefrock ◽  
Y. Li ◽  
J. D. Brock ◽  
S. G. Lemay ◽  
...  
Keyword(s):  
Relaxation Time ◽  
Charge Density ◽  
Charge Density Wave ◽  
Density Wave ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

Microtubule nucleation sequence studied by time-resolved x-ray scattering and electron microscopy

1983 ◽  
Vol 41 ◽  
pp. 766-767
Author(s):  
Eva-Maria Mandelkow ◽  
Eckhard Mandelkow ◽  
Joan Bordas
Keyword(s):  
Electron Microscopy ◽  
Dynamic Equilibrium ◽  
Time Resolved ◽  
X Ray ◽  
Additional Information ◽  
X Ray Scattering ◽  
Low Concentrations ◽  
Microtubule Growth ◽  
Ray Patterns ◽  
Ray Scattering

When a solution of microtubule protein is changed from non-polymerising to polymerising conditions (e.g. by temperature jump or mixing with GTP) there is a series of structural transitions preceding microtubule growth. These have been detected by time-resolved X-ray scattering using synchrotron radiation, and they may be classified into pre-nucleation and nucleation events. X-ray patterns are good indicators for the average behavior of the particles in solution, but they are difficult to interpret unless additional information on their structure is available. We therefore studied the assembly process by electron microscopy under conditions approaching those of the X-ray experiment. There are two difficulties in the EM approach: One is that the particles important for assembly are usually small and not very regular and therefore tend to be overlooked. Secondly EM specimens require low concentrations which favor disassembly of the particles one wants to observe since there is a dynamic equilibrium between polymers and subunits.

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