Quantitative analysis of lattice disorder and superconducting transition in epitaxial YBa2Cu3O6.9 films

1996 ◽  
Vol 9 (1) ◽  
pp. 23-25 ◽  
Author(s):  
Andrea Gauzzi ◽  
Davor Pavuna
Keyword(s):  
Quantitative Analysis ◽  
Superconducting Transition ◽  
Lattice Disorder

ELECTRONIC THEORY FOR ELECTRON-DOPED CUPRATE SUPERCONDUCTORS: d-WAVE SUPERCONDUCTIVITY AND THE PHASE DIAGRAM

2000 ◽  
Vol 14 (29n31) ◽  
pp. 3555-3560
Author(s):  
D. MANSKE ◽  
I. EREMIN ◽  
K. H. BENNEMANN
Keyword(s):  
Cuprate Superconductors ◽  
Narrow Range ◽  
Spin Fluctuation ◽  
Flat Band ◽  
Superconducting Transition ◽  
Phonon Interaction ◽  
Pairing Mechanism ◽  
Lattice Disorder ◽  
Electron Phonon Interaction ◽  
The One

Using the one-band Hubbard Hamiltonian we determine various basic properties of the electron-doped cuprate superconductor Nd 2-x Ce x CuO 4 for a spin-fluctuation-induced pairing mechanism. We find a narrow range of superconductivity and, most importantly, like for hole-doped cuprates dx2-y2 -symmetry for the superconducting order parameter. The superconducting transition temperatures Tc(x) for various electron doping concentrations x are calculated to be much smaller than for hole-doped cuprates due to the different energy dispersion and a flat band well below the Fermi level. We find that lattice disorder may sensitively distort the dx2-y2 -symmetry via electron-phonon interaction yielding a finite isotope exponent α0.

Quantitative analysis of lattice disorder and crystallite size in organic semiconductor thin films

2011 ◽  
Vol 84 (4) ◽  
Author(s):  
Jonathan Rivnay ◽  
Rodrigo Noriega ◽  
R. Joseph Kline ◽  
Alberto Salleo ◽  
Michael F. Toney
Keyword(s):  
Thin Films ◽  
Quantitative Analysis ◽  
Crystallite Size ◽  
Organic Semiconductor ◽  
Lattice Disorder ◽  
Semiconductor Thin Films

Quantitative analysis of the creep deformation jump stimulated by the superconducting transition in β-tin

2003 ◽  
Vol 29 (4) ◽  
pp. 340-352 ◽  
Author(s):  
V. D. Natsik ◽  
V. P. Soldatov ◽  
G. I. Kirichenko ◽  
L. G. Ivanchenko
Keyword(s):  
Quantitative Analysis ◽  
Creep Deformation ◽  
Superconducting Transition ◽  
Deformation Jump

Microcalorimeters for X-Ray Spectroscopy

1988 ◽  
Vol 102 ◽  
pp. 41
Author(s):  
E. Silver ◽  
C. Hailey ◽  
S. Labov ◽  
N. Madden ◽  
D. Landis ◽  
...  
Keyword(s):  
High Resolution ◽  
High Efficiency ◽  
Thermal Response ◽  
Low Noise ◽  
High Resolution Spectroscopy ◽  
Superconducting Transition ◽  
Sapphire Substrates ◽  
Laboratory Plasmas ◽  
Adiabatic Demagnetization ◽  
Theoretical Predictions

The merits of microcalorimetry below 1°K for high resolution spectroscopy has become widely recognized on theoretical grounds. By combining the high efficiency, broadband spectral sensitivity of traditional photoelectric detectors with the high resolution capabilities characteristic of dispersive spectrometers, the microcalorimeter could potentially revolutionize spectroscopic measurements of astrophysical and laboratory plasmas. In actuality, however, the performance of prototype instruments has fallen short of theoretical predictions and practical detectors are still unavailable for use as laboratory and space-based instruments. These issues are currently being addressed by the new collaborative initiative between LLNL, LBL, U.C.I., U.C.B., and U.C.D.. Microcalorimeters of various types are being developed and tested at temperatures of 1.4, 0.3, and 0.1°K. These include monolithic devices made from NTD Germanium and composite configurations using sapphire substrates with temperature sensors fabricated from NTD Germanium, evaporative films of Germanium-Gold alloy, or material with superconducting transition edges. A new approache to low noise pulse counting electronics has been developed that allows the ultimate speed of the device to be determined solely by the detector thermal response and geometry. Our laboratory studies of the thermal and resistive properties of these and other candidate materials should enable us to characterize the pulse shape and subsequently predict the ultimate performance. We are building a compact adiabatic demagnetization refrigerator for conveniently reaching 0.1°K in the laboratory and for use in future satellite-borne missions. A description of this instrument together with results from our most recent experiments will be presented.

An Improved Quantitative Image Analyser

1977 ◽  
Vol 35 ◽  
pp. 226-227
Author(s):  
J.P. Fallon ◽  
P.J. Gregory ◽  
C.J. Taylor
Keyword(s):  
Feature Extraction ◽  
Quantitative Analysis ◽  
Frequency Content ◽  
General Sense ◽  
Physical Measurements ◽  
Quantitative Image ◽  
Image Analyser ◽  
Automatic Methods ◽  
Quantitative Results

Quantitative image analysis systems have been used for several years in research and quality control applications in various fields including metallurgy and medicine. The technique has been applied as an extension of subjective microscopy to problems requiring quantitative results and which are amenable to automatic methods of interpretation.Feature extraction. In the most general sense, a feature can be defined as a portion of the image which differs in some consistent way from the background. A feature may be characterized by the density difference between itself and the background, by an edge gradient, or by the spatial frequency content (texture) within its boundaries. The task of feature extraction includes recognition of features and encoding of the associated information for quantitative analysis.Quantitative Analysis. Quantitative analysis is the determination of one or more physical measurements of each feature. These measurements may be straightforward ones such as area, length, or perimeter, or more complex stereological measurements such as convex perimeter or Feret's diameter.

Quantification of Silica Uptake by Alveolar Macrophages - An Emperical Scanning Electron Microprobe Method

1982 ◽  
Vol 40 ◽  
pp. 332-333
Author(s):  
V. V. Damiano ◽  
R. P. Daniele ◽  
H. T. Tucker ◽  
J. H. Dauber
Keyword(s):  
Quantitative Analysis ◽  
Alveolar Macrophages ◽  
Bulk Sample ◽  
Silica Particles ◽  
Empirical Method ◽  
Phagocytic Cells ◽  
Calibration Standards ◽  
X Ray ◽  
Accurate Quantitative Analysis ◽  
Scanning Electron

An important example of intracellular particles is encountered in silicosis where alveolar macrophages ingest inspired silica particles. The quantitation of the silica uptake by these cells may be a potentially useful method for monitoring silica exposure. Accurate quantitative analysis of ingested silica by phagocytic cells is difficult because the particles are frequently small, irregularly shaped and cannot be visualized within the cells. Semiquantitative methods which make use of particles of known size, shape and composition as calibration standards may be the most direct and simplest approach to undertake. The present paper describes an empirical method in which glass microspheres were used as a model to show how the ratio of the silicon Kα peak X-ray intensity from the microspheres to that of a bulk sample of the same composition correlated to the mass of the microsphere contained within the cell. Irregular shaped silica particles were also analyzed and a calibration curve was generated from these data.

Lateral resolution of the electron microbeam analysis

1978 ◽  
Vol 36 (1) ◽  
pp. 542-543
Author(s):  
H.J. Dudek
Keyword(s):  
Quantitative Analysis ◽  
Depth Resolution ◽  
Lateral Resolution ◽  
Cylindrical Particle ◽  
Correction Procedure ◽  
X Ray ◽  
Element Concentrations ◽  
Microbeam Analysis ◽  
The Matrix

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S

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