Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

Author(s):  
Shuting Shi ◽  
Rui Chen ◽  
Rui Liu ◽  
Mo Chen ◽  
Chen Shen ◽  
...  
1986 ◽  
Author(s):  
R. Koga ◽  
W. A. Kolasinski ◽  
C. King ◽  
J. Cusick

2021 ◽  
Vol 120 ◽  
pp. 114128
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Peng-Fei Zhai ◽  
Li Cai ◽  
Tao Liu ◽  
...  

1994 ◽  
Vol 41 (6) ◽  
pp. 2195-2202 ◽  
Author(s):  
S. Buchner ◽  
J.B. Langworthy ◽  
W.J. Stapor ◽  
A.B. Campbell ◽  
S. Rivet

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