Supply voltage dependence of single event upset sensitivity in diverse SRAM devices

2014 ◽  
Author(s):  
Zhangang Zhang ◽  
Jie Liu ◽  
Youmei Sun ◽  
Mingdong Hou ◽  
Teng Tong ◽  
...  
Keyword(s):  
Voltage Dependence ◽  
Supply Voltage ◽  
Single Event Upset ◽  
Single Event

Single-Event Upset Characterization Across Temperature and Supply Voltage for a 20-nm Bulk Planar CMOS Technology

2015 ◽  
Vol 62 (6) ◽  
pp. 2613-2619 ◽  
Author(s):  
J. S. Kauppila ◽  
W. H. Kay ◽  
T. D. Haeffner ◽  
D. L. Rauch ◽  
T. R. Assis ◽  
...  
Keyword(s):  
Supply Voltage ◽  
Cmos Technology ◽  
Single Event Upset ◽  
Single Event ◽  
20 Nm

Power Supply Voltage Dependence of Within-Die Delay Variation of Regular Manual Layout and Irregular Place-and-Route Layout

2011 ◽  
Vol E94-C (6) ◽  
pp. 1072-1075
Author(s):  
Tadashi YASUFUKU ◽  
Yasumi NAKAMURA ◽  
Zhe PIAO ◽  
Makoto TAKAMIYA ◽  
Takayasu SAKURAI
Keyword(s):  
Power Supply ◽  
Voltage Dependence ◽  
Supply Voltage ◽  
Power Supply Voltage ◽  
Place And Route ◽  
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SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

1986 ◽  
Author(s):  
R. Koga ◽  
W. A. Kolasinski ◽  
C. King ◽  
J. Cusick
Keyword(s):  
Single Event Upset ◽  
Single Event

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

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Shuting Shi ◽  
Rui Chen ◽  
Rui Liu ◽  
Mo Chen ◽  
Chen Shen ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Arm Processor ◽  
28 Nm
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