scholarly journals Application of Bayesian Super-Resolution to Spectroscopic Data for Precise Characterization of Spectral Peak Shape

2022 ◽  
Author(s):  
Kota Tsujimori ◽  
Jun Hirotani ◽  
Shunta Harada
Keyword(s):  
Raman Spectra ◽  
Spectroscopic Data ◽  
Super Resolution ◽  
Spectral Peak ◽  
Peak Shape ◽  
Si Substrate ◽  
Precise Characterization ◽  
Data Points ◽  
The Ideal

AbstractThe number of data points of digitally recorded spectra have been limited by the number of multichannel detectors employed, which sometimes impedes the precise characterization of spectral peak shape. Here we describe a methodology to increase the number of data points as well as the signal-to-noise (S/N) ratio by applying Bayesian super-resolution in the analysis of spectroscopic data. In our present method, first, the hyperparameters for the Bayesian super-resolution are determined by a virtual experiment imitating actual experimental data, and the precision of the super-resolution reconstruction is confirmed by the calculation of errors from the ideal values. For validation of the super-resolution reconstruction of spectroscopic data, we applied this method to the analysis of Raman spectra. From 200 Raman spectra of a reference Si substrate with a data interval of about 0.8 cm−1, super-resolution reconstruction with a data interval of 0.01 cm−1 was successfully achieved with the promised precision. From the super-resolution spectrum, the Raman scattering peak of the reference Si substrate was estimated as 520.55 (+0.12, −0.09) cm−1, which is comparable to the precisely determined value reported in previous works. The present methodology can be applied to various kinds of spectroscopic analysis, leading to increased precision in the analysis of spectroscopic data and the ability to detect slight differences in spectral peak positions and shapes.

scholarly journals Application of Bayesian Super-Resolution to Spectroscopic Data for Precise Characterization of Spectral Peak Shape

2021 ◽  
Author(s):  
Kota Tsujimori ◽  
Jun Hirotani ◽  
Shunta Harada
Keyword(s):  
Raman Spectra ◽  
Spectroscopic Data ◽  
Super Resolution ◽  
Spectral Peak ◽  
Peak Shape ◽  
Si Substrate ◽  
Precise Characterization ◽  
Data Points ◽  
The Ideal

Abstract The number of data points of digitally recorded spectra have been limited by the number of multi-channel detectors employed, which sometimes inhibits the precise characterization of spectral peak shape. Here we describe a methodology to increase the number of data points as well as the signal-to-noise (S/N) ratio by applying Bayesian super-resolution in the analysis of spectroscopic data. In our present method, first the hyperparameters for the Bayesian super-resolution are determined by a virtual experiment imitating actual experimental data, and the precision of the super-resolution reconstruction is confirmed by the calculation of errors from the ideal values. For validation of the super-resolution reconstruction of spectroscopic data, we applied this method to the analysis of Raman spectra. From 200 Raman spectra of a reference Si substrate with a data interval of about 0.8 cm-1, super-resolution reconstruction with a data interval of 0.01 cm-1 was successfully achieved with the promised precision. From the super-resolution spectrum, the Raman scattering peak of the reference Si substrate was estimated as 520.55 (+0.12, -0.09) cm-1, which is comparable to the precisely determined value reported in previous works. The present methodology can be applied to various kinds of spectroscopic analysis, leading to increased precision in the analysis of spectroscopic data and the ability to detect slight differences in spectral peak positions and shapes.

scholarly journals Bayesian Super-Resolution of Spectroscopic Data

2021 ◽  
Author(s):  
Kota Tsujimori ◽  
Jun Hirotani ◽  
Shunta Harada
Keyword(s):  
Raman Spectra ◽  
Spectroscopic Data ◽  
Super Resolution ◽  
Si Substrate ◽  
Charge Coupled Device ◽  
Research Fields ◽  
Wide Range ◽  
Ccd Arrays ◽  
Ccd Detectors ◽  
The Ideal

Abstract The resolution of spectroscopy, which delivers valuable insights and knowledge in various research fields, has sometimes been limited by the number of multi-channel detectors employed. For example, in Raman spectroscopy using charge coupled device (CCD) detectors, the resolution is limited by the number of the CCD arrays and it is difficult to achieve spectroscopic data acquisition with high resolution over a wide range. Here we describe a methodology to increase the resolution as well as signal-to-noise (S/N) ratio by applying Bayesian super-resolution in the analysis of spectroscopic data. In our present method, first the hyperparameters for the Bayesian super-resolution are determined by a virtual experiment imitating actual experimental data, and the precision of the super-resolution reconstruction is confirmed by the calculation of errors from the ideal values. For validation of the super-resolution of spectroscopic data, we applied this method to the analysis of Raman spectra. From 200 Raman spectra of a reference Si substrate with a resolution of about 0.8 cm-1, super-resolution reconstruction with resolution of 0.01 cm-1 was successfully achieved with the promised precision. From the super-resolution spectrum, the Raman scattering peak of the reference Si substrate was estimated as 520.55 (+0.12, -0.09) cm-1, which is comparable to the precisely determined value from previous works. The present methodology can be applied to various kinds of spectroscopic analysis, leading to increased precision in the analysis of spectroscopic data and the ability to detect slight differences in spectral peak positions and shapes.

scholarly journals Bayesian Super-Resolution of Spectroscopic Data

2021 ◽  
Author(s):  
Kota Tsujimori ◽  
Jun Hirotani ◽  
Shunta Harada
Keyword(s):  
Raman Spectra ◽  
Spectroscopic Data ◽  
Super Resolution ◽  
Si Substrate ◽  
Charge Coupled Device ◽  
Research Fields ◽  
Wide Range ◽  
Ccd Arrays ◽  
Ccd Detectors ◽  
The Ideal

Abstract The resolution of spectroscopy, which delivers valuable insights and knowledge in various research fields, has sometimes been limited by the number of multi-channel detectors employed. For example, in Raman spectroscopy using charge coupled device (CCD) detectors, the resolution is limited by the number of the CCD arrays and it is difficult to achieve spectroscopic data acquisition with high resolution over a wide range. Here we describe a methodology to increase the resolution as well as signal-to-noise (S/N) ratio by applying Bayesian super-resolution in the analysis of spectroscopic data. In our present method, first the hyperparameters for the Bayesian super-resolution are determined by a virtual experiment imitating actual experimental data, and the precision of the super-resolution reconstruction is confirmed by the calculation of errors from the ideal values. For validation of the super-resolution of spectroscopic data, we applied this method to the analysis of Raman spectra. From 200 Raman spectra of a reference Si substrate with a resolution of about 0.8 cm− 1, super-resolution reconstruction with resolution of 0.01 cm− 1 was successfully achieved with the promised precision. From the super-resolution spectrum, the Raman scattering peak of the reference Si substrate was estimated as 520.55 (+ 0.12, -0.09) cm− 1, which is comparable to the precisely determined value from previous works. The present methodology can be applied to various kinds of spectroscopic analysis, leading to increased precision in the analysis of spectroscopic data and the ability to detect slight differences in spectral peak positions and shapes.

scholarly journals Bayesian Super-Resolution of Spectroscopic Data

2021 ◽  
Author(s):  
Kota Tsujimori ◽  
Jun Hirotani ◽  
Shunta Harada
Keyword(s):  
Raman Spectra ◽  
Spectroscopic Data ◽  
Super Resolution ◽  
Si Substrate ◽  
Charge Coupled Device ◽  
Research Fields ◽  
Wide Range ◽  
Ccd Arrays ◽  
Ccd Detectors ◽  
The Ideal

Abstract The resolution of spectroscopy, which delivers valuable insights and knowledge in various research fields, has sometimes been limited by the number of multi-channel detectors employed. For example, in Raman spectroscopy using charge coupled device (CCD) detectors, the resolution is limited by the number of the CCD arrays and it is difficult to achieve spectroscopic data acquisition with high resolution over a wide range. Here we describe a methodology to increase the resolution as well as signal-to-noise (S/N) ratio by applying Bayesian super-resolution in the analysis of spectroscopic data. In our present method, first the hyperparameters for the Bayesian super-resolution are determined by a virtual experiment imitating actual experimental data, and the precision of the super-resolution reconstruction is confirmed by the calculation of errors from the ideal values. For validation of the super-resolution of spectroscopic data, we applied this method to the analysis of Raman spectra. From 200 Raman spectra of a reference Si substrate with a resolution of about 0.8 cm-1, super-resolution reconstruction with resolution of 0.01 cm-1 was successfully achieved with the promised precision. From the super-resolution spectrum, the Raman scattering peak of the reference Si substrate was estimated as 520.55 (+ 0.12, -0.09) cm-1, which is comparable to the precisely determined value from previous works. The present methodology can be applied to various kinds of spectroscopic analysis, leading to increased precision in the analysis of spectroscopic data and the ability to detect slight differences in spectral peak positions and shapes.

Characterization of Difference Size of IDE Pattern for Formaldehyde Detection Sensor

2015 ◽  
Vol 754-755 ◽  
pp. 917-922 ◽  
Author(s):  
M. Zaki ◽  
Uda Hashim ◽  
Mohd Khairuddin Md Arshad ◽  
M.F.M. Fathil ◽  
A.H. Azman ◽  
...  
Keyword(s):  
Gas Sensing ◽  
Low Cost ◽  
Electrical Characterization ◽  
Gas Detection ◽  
Si Substrate ◽  
Hard Mask ◽  
Large Size ◽  
Mask Design ◽  
The Ideal

This paper studies the effect of different gap sizes of IDE pattern on the surface morphology and electrical properties for the formaldehyde detection sensor. Two types of IDE chrome mask are designed to determine the ideal IDE pattern for formaldehyde gas detection by using conventional lithography. In the first method, IDE is transferred onto SiO2layer. In order to ensure that the perfect pattern with minimum defect structure is obtained, the process parameters should be optimized and controlled. In the second method, the aluminium is deposited directly on SiO2/Si substrate by using IDE hard mask design plate. The fabricated IDE pattern is further validated through morphological and electrical characterization. The average gap size of IDE sensor is approximately 100 μm and 400 μm for IDE chrome and IDE hard mask respectively. The latter method is preferable since for formaldehyde gas sensing large size is needed and moreover the process is simple and requires low cost. Characterization of difference IDE pattern is demonstrated by various measurements.

Highly precise characterization of the hydration state upon thermal denaturation of human serum albumin using a 65 GHz dielectric sensor

2020 ◽  
Vol 22 (35) ◽  
pp. 19468-19479 ◽  
Author(s):  
Keiichiro Shiraga ◽  
Mako Urabe ◽  
Takeshi Matsui ◽  
Shojiro Kikuchi ◽  
Yuichi Ogawa
Keyword(s):  
Human Serum Albumin ◽  
Serum Albumin ◽  
Human Serum ◽  
Thermal Denaturation ◽  
Hydration Water ◽  
Biological Functions ◽  
Dielectric Sensor ◽  
Hydration State ◽  
Precise Characterization

The biological functions of proteins depend on harmonization with hydration water surrounding them.

scholarly journals Characterization of Locus Specific Chromatin Structure and Dynamics using Correlative Conventional Super Resolution Crispr dCas9/Ms2 Imaging

2021 ◽  
Vol 120 (3) ◽  
pp. 9a
Author(s):  
Dushyant Mehra ◽  
Chiranjib Banerjee ◽  
Santosh Adhikari ◽  
Jacob M. Ritz ◽  
Angel Mancebo ◽  
...  
Keyword(s):  
Chromatin Structure ◽  
Super Resolution ◽  
Structure And Dynamics ◽  
Chromatin Structure And Dynamics

Towards 3D image-based nanocrystallography by means of transmission electron goniometry

2004 ◽  
Vol 839 ◽  
Author(s):  
Peter Moeck ◽  
Wentao Qin ◽  
Philip B. Fraundorf
Keyword(s):  
Lattice Structure ◽  
Three Dimensions ◽  
Structural Defects ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
Z Contrast ◽  
Individual Nanoparticles ◽  
Nanocrystal Model ◽  
The Ideal

ABSTRACTIt is well known that the crystallographic phase and morphology of many materials changes with the crystal size in the tens of nanometer range and that many nanocrystals possess structural defects in excess of their equilibrium levels. A need to determine the ideal and real structure of individual nanoparticles, therefore, arises. High-resolution phase-contrast transmission electron microscopy (TEM) and atomic resolution Z-contrast scanning TEM (STEM) when combined with transmission electron goniometry offer the opportunity of develop dedicated methods for the crystallographic characterization of nanoparticles in three dimensions. This paper describes tilt strategies for taking data from individual nanocrystals “as found”, so as to provide information on their lattice structure and orientation, as well as on the structure and orientation of their surfaces and structural defects. Internet based java applets that facilitate the application of this technique for cubic crystals with calibrated tilt-rotation and double-tilt holders are mentioned briefly. The enhanced viability of image-based nanocrystallography in future aberration-corrected TEMs and STEMs is illustrated on a nanocrystal model system.

Distorted chiolite crystal structures of α-Na5M3F14 (M=Cr,Fe,Ga) studied by X-ray powder diffraction

2003 ◽  
Vol 18 (2) ◽  
pp. 128-134 ◽  
Author(s):  
A. Le Bail ◽  
A.-M. Mercier
Keyword(s):  
Crystal Structures ◽  
Powder Diffraction ◽  
Room Temperature ◽  
Rietveld Refinements ◽  
Space Group ◽  
X Ray ◽  
Precise Characterization

The crystal structures of the chiolite-related room temperature phases α-Na5M3F14 (MIII=Cr,Fe,Ga) are determined. For all of them, the space group is P21/n, Z=2; a=10.5096(3) Å, b=7.2253(2) Å, c=7.2713(2) Å, β=90.6753(7)° (M=Cr); a=10.4342(7) Å, b=7.3418(6) Å, c=7.4023(6) Å, β=90.799(5)° (M=Fe), and a=10.4052(1) Å, b=7.2251(1) Å, c=7.2689(1), β=90.6640(4)° (M=Ga). Rietveld refinements produce final RF factors 0.036, 0.033, and 0.035, and RWP factors, 0.125, 0.116, and 0.096, for MIII=Cr, Fe, and Ga, respectively. The MF6 polyhedra in the defective isolated perovskite-like layers deviate very few from perfect octahedra. Subtle octahedra tiltings lead to the symmetry decrease from the P4/mnc space group adopted by the Na5Al3F14 chiolite aristotype to the P21/n space group adopted by the title series. Facile twinning precluded till now the precise characterization of these compounds.

Synthesis and Characterization of Tris(trimethyltin) Thiophosphate (Me3Sn)3PO3S

1993 ◽  
Vol 48 (12) ◽  
pp. 1781-1783 ◽  
Author(s):  
Abdel-Fattah Shihada
Keyword(s):  
Aqueous Medium ◽  
Raman Spectra ◽  
Mass Spectra ◽  
Ir And Raman Spectra ◽  
Synthesis And Characterization ◽  
Polymeric Structure ◽  
Ir And Raman

(Me3Sn)3PO3S has been prepared from the reaction of Me3SnCl with Na3PO3S • 12 H2O under cooling in aqueous medium. Its IR and Raman spectra are found to be consistent with a polymeric structure with tetra- and penta-coordinated tin atoms. The 31P NMR and mass spectra of (Me3Sn)3PO3S are reported and discussed.

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