Influence of different chemical surface patterns on the dynamic wetting behaviour on flat and silanized silicon wafers during inclining-plate measurements: An experimental investigation with the high-precision drop shape analysis approach

Colloids and Surfaces A Physicochemical and Engineering Aspects ◽

10.1016/j.colsurfa.2016.08.061 ◽

2016 ◽

Vol 508 ◽

pp. 274-285 ◽

Cited By ~ 6

Author(s):

F. Heib ◽

W.M. Munief ◽

S. Ingebrandt ◽

R. Hempelmann ◽

M. Schmitt

Keyword(s):

Experimental Investigation ◽

High Precision ◽

Shape Analysis ◽

Silicon Wafers ◽

Analysis Approach ◽

Dynamic Wetting ◽

Drop Shape ◽

Chemical Surface ◽

Surface Patterns

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High-precision drop shape analysis (HPDSA) of quasistatic contact angles on silanized silicon wafers with different surface topographies during inclining-plate measurements: Influence of the surface roughness on the contact line dynamics

Applied Surface Science ◽

10.1016/j.apsusc.2015.03.032 ◽

2015 ◽

Vol 342 ◽

pp. 11-25 ◽

Cited By ~ 27

Author(s):

F. Heib ◽

R. Hempelmann ◽

W.M. Munief ◽

S. Ingebrandt ◽

F. Fug ◽

...

Keyword(s):

Surface Roughness ◽

High Precision ◽

Shape Analysis ◽

Contact Line ◽

Contact Angles ◽

Silicon Wafers ◽

Drop Shape ◽

Surface Topographies ◽

Contact Line Dynamics

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Evaluation of the Wettability Variation of Shales by Drop Shape Analysis Approach

Proceedings of the SPE/AAPG/SEG Asia Pacific Unconventional Resources Technology Conference ◽

10.15530/ap-urtec-2019-198277 ◽

2019 ◽

Author(s):

Hamid Sharifigaliuk ◽

Syed Mohammad Mahmood ◽

Eswaran Padmanabhan

Keyword(s):

Shape Analysis ◽

Analysis Approach ◽

Drop Shape

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Statistical Contact Angle Analyses with the High-Precision Drop Shape Analysis (HPDSA) Approach: Basic Principles and Applications

Coatings ◽

10.3390/coatings6040057 ◽

2016 ◽

Vol 6 (4) ◽

pp. 57 ◽

Cited By ~ 42

Author(s):

Florian Heib ◽

Michael Schmitt

Keyword(s):

Contact Angle ◽

High Precision ◽

Shape Analysis ◽

Basic Principles ◽

Drop Shape

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High-precision drop shape analysis on inclining flat surfaces: Introduction and comparison of this special method with commercial contact angle analysis

The Journal of Chemical Physics ◽

10.1063/1.4822261 ◽

2013 ◽

Vol 139 (13) ◽

pp. 134201 ◽

Cited By ~ 23

Author(s):

Michael Schmitt ◽

Florian Heib

Keyword(s):

Contact Angle ◽

High Precision ◽

Shape Analysis ◽

Special Method ◽

Drop Shape ◽

Flat Surfaces ◽

Contact Angle Analysis

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Experimental Investigation of Ion Mass Dependency of Magnetic Reconnection Outflow by using High Precision Ion Doppler Spectroscopy

IEEJ Transactions on Fundamentals and Materials ◽

10.1541/ieejfms.134.352 ◽

2014 ◽

Vol 134 (5) ◽

pp. 352-353

Author(s):

Hirotaka Oka ◽

Hiroshi Tanabe ◽

Masanobu Annoura ◽

Michiaki Inomoto ◽

Yasushi Ono

Keyword(s):

Experimental Investigation ◽

Magnetic Reconnection ◽

High Precision ◽

Doppler Spectroscopy

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Modelling and experimental investigation of spindle and cutter dynamics for a high-precision machining center

The International Journal of Advanced Manufacturing Technology ◽

10.1007/s00170-003-1794-8 ◽

2004 ◽

Vol 24 (11-12) ◽

pp. 806-815 ◽

Cited By ~ 16

Author(s):

Adam G. Rehorn ◽

Jin Jiang ◽

Peter E. Orban ◽

Evgueni Bordatchev

Keyword(s):

Experimental Investigation ◽

High Precision ◽

Precision Machining ◽

Machining Center

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Film Tension and Film Rupture of Alkanes at the Air−Water Interface Using Axisymmetric Drop Shape Analysis

The Journal of Physical Chemistry B ◽

10.1021/jp973093o ◽

1998 ◽

Vol 102 (14) ◽

pp. 2511-2518 ◽

Cited By ~ 3

Author(s):

P. Chen ◽

C. Mak ◽

S. S. Susnar ◽

A. W. Neumann

Keyword(s):

Shape Analysis ◽

Water Interface ◽

Film Rupture ◽

Drop Shape ◽

Axisymmetric Drop Shape Analysis ◽

Air Water Interface ◽

Film Tension

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Mixed Proteins/Surfactants Interfacial Layers as Studied by Drop Shape Analysis and Capillary Pressure Tensiometry

Recent Trends in Surface and Colloid Science - Statistical Science and Interdisciplinary Research ◽

10.1142/9789814299428_0007 ◽

2012 ◽

pp. 85-104

Author(s):

V.S. Alahverdjieva ◽

D.O. Grigoriev ◽

A. Javadi ◽

Cs. Kotsmar ◽

J. Krägel ◽

...

Keyword(s):

Capillary Pressure ◽

Shape Analysis ◽

Drop Shape ◽

Interfacial Layers

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Contact Angle Measurements and Contact Angle Interpretation. 1. Contact Angle Measurements by Axisymmetric Drop Shape Analysis and a Goniometer Sessile Drop Technique

Langmuir ◽

10.1021/la9608021 ◽

1997 ◽

Vol 13 (10) ◽

pp. 2880-2894 ◽

Cited By ~ 176

Author(s):

D. Y. Kwok ◽

T. Gietzelt ◽

K. Grundke ◽

H.-J. Jacobasch ◽

A. W. Neumann

Keyword(s):

Contact Angle ◽

Shape Analysis ◽

Sessile Drop ◽

Sessile Drop Technique ◽

Drop Shape ◽

Axisymmetric Drop Shape Analysis ◽

Angle Measurements ◽

Contact Angle Measurements ◽

Drop Technique

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Dynamic wetting behavior of silicon wafers in alkaline solutions of interest to semiconductor processing

Journal of Adhesion Science and Technology ◽

10.1163/156856193x00646 ◽

1993 ◽

Vol 7 (3) ◽

pp. 179-193 ◽

Cited By ~ 1

Author(s):

Jin-Goo Park ◽

Srini Raghavan

Keyword(s):

Silicon Wafers ◽

Alkaline Solutions ◽

Semiconductor Processing ◽

Dynamic Wetting ◽

Wetting Behavior

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