Pragmatic generative optimization of novel structural lattice metamaterials with machine learning

Materials & Design ◽

10.1016/j.matdes.2021.109632 ◽

2021 ◽

pp. 109632

Author(s):

Anthony P. Garland ◽

Benjamin C. White ◽

Scott C. Jensen ◽

Brad L. Boyce

Keyword(s):

Machine Learning ◽

Structural Lattice

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Mind wandering as data augmentation: How mental travel supports abstraction

Behavioral and Brain Sciences ◽

10.1017/s0140525x1900311x ◽

2020 ◽

Vol 43 ◽

Author(s):

Myrthe Faber

Keyword(s):

Machine Learning ◽

Data Augmentation ◽

Mental Content ◽

Mind Wandering ◽

Theoretical Framework ◽

Important Addition

Abstract Gilead et al. state that abstraction supports mental travel, and that mental travel critically relies on abstraction. I propose an important addition to this theoretical framework, namely that mental travel might also support abstraction. Specifically, I argue that spontaneous mental travel (mind wandering), much like data augmentation in machine learning, provides variability in mental content and context necessary for abstraction.

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TEM Analysis of Long-Period Polytypes in SiC—S

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100093110 ◽

1976 ◽

Vol 34 ◽

pp. 630-631

Author(s):

S. Shinozaki ◽

J. W. Sprys

Keyword(s):

Electron Diffraction ◽

Isothermal Annealing ◽

Tem Analysis ◽

Long Period ◽

Transmission Electron ◽

Average Grain Size ◽

High Resolution Tem ◽

Structural Lattice ◽

The Stability ◽

Continuous Curves

In reaction sintered SiC (∽ 5um average grain size), about 15% of the grains were found to have long-period structures, which were identifiable by transmission electron microscopy (TEM). In order to investigate the stability of the long-period polytypes at high temperature, crystal structures as well as microstructural changes in the long-period polytypes were analyzed as a function of time in isothermal annealing.Each polytype was analyzed by two methods: (1) Electron diffraction, and (2) Electron micrograph analysis. Fig. 1 shows microdensitometer traces of ED patterns (continuous curves) and calculated intensities (vertical lines) along 10.l row for 6H and 84R (Ramsdell notation). Intensity distributions were calculated based on the Zhdanov notation of (33) for 6H and [ (33)3 (32)2 ]3 for 84R. Because of the dynamical effect in electron diffraction, the observed intensities do not exactly coincide with those intensities obtained by structure factor calculations. Fig. 2 shows the high resolution TEM micrographs, where the striped patterns correspond to direct resolution of the structural lattice periodicities of 6H and 84R structures and the spacings shown in the figures are as expected for those structures.

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