A novel automatic test pattern generator for asynchronous sequential digital circuits

Roland Dobai; Elena Gramatová

doi:10.1016/j.mejo.2010.10.013

A novel automatic test pattern generator for asynchronous sequential digital circuits

Microelectronics Journal ◽

10.1016/j.mejo.2010.10.013 ◽

2011 ◽

Vol 42 (3) ◽

pp. 501-508

Author(s):

Roland Dobai ◽

Elena Gramatová

Keyword(s):

Digital Circuits ◽

Test Pattern ◽

Pattern Generator ◽

Automatic Test ◽

Automatic Test Pattern Generator

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FUNTEST: a functional automatic test pattern generator for combinational circuits

10.1109/test.1989.82397 ◽

2003 ◽

Cited By ~ 2

Author(s):

S.A. Al-Arian ◽

M. Nordenso

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Combinational Circuits ◽

Automatic Test ◽

Automatic Test Pattern Generator

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A fast nonenumerative automatic test pattern generator for path delay faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.771185 ◽

1999 ◽

Vol 18 (7) ◽

pp. 1050-1057 ◽

Cited By ~ 11

Author(s):

S. Tragoudas ◽

D. Karayiannis

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Automatic Test ◽

Automatic Test Pattern Generator

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An automatic test pattern generator for at-speed robust path delay testing

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741595 ◽

2002 ◽

Author(s):

Yuan-Chieh Hsu ◽

S.K. Gupta

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Delay Testing ◽

Path Delay ◽

Automatic Test ◽

Automatic Test Pattern Generator

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Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator

2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID) ◽

10.1109/vlsid51830.2021.00059 ◽

2021 ◽

Author(s):

Soham Roy ◽

Spencer K. Millican ◽

Vishwani D. Agrawal

Keyword(s):

Neural Network ◽

Test Pattern ◽

Pattern Generator ◽

Machine Intelligence ◽

Automatic Test ◽

Automatic Test Pattern Generator ◽

Training Neural Network

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Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM

IET Computers & Digital Techniques ◽

10.1049/iet-cdt:20060139 ◽

2007 ◽

Vol 1 (3) ◽

pp. 187 ◽

Cited By ~ 7

Author(s):

G. Di Guglielmo ◽

F. Fummi ◽

C. Marconcini ◽

G. Pravadelli

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Automatic Test ◽

High Level ◽

Automatic Test Pattern Generator

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A reconfigurable SAT-based automatic test pattern generator

2011 IEEE GCC Conference and Exhibition (GCC) ◽

10.1109/ieeegcc.2011.5752522 ◽

2011 ◽

Author(s):

Mona Safar ◽

Mohamed Shalan ◽

M. Watheq El-Kharashi ◽

Ashraf Salem

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Automatic Test ◽

Automatic Test Pattern Generator

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An automatic test pattern generator for large sequential circuits based on Genetic Algorithms

Proceedings., International Test Conference ◽

10.1109/test.1994.527955 ◽

2002 ◽

Cited By ~ 64

Author(s):

P. Prinetto ◽

M. Rebaudengo ◽

M. Sonza Reorda

Keyword(s):

Genetic Algorithms ◽

Test Pattern ◽

Pattern Generator ◽

Sequential Circuits ◽

Automatic Test ◽

Automatic Test Pattern Generator

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An automatic test pattern generator for minimizing switching activity during scan testing activity

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2002.800460 ◽

2002 ◽

Vol 21 (8) ◽

pp. 954-968 ◽

Cited By ~ 36

Author(s):

Seongmoon Wang ◽

S.K. Gupta

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Switching Activity ◽

Automatic Test ◽

Scan Testing ◽

Automatic Test Pattern Generator

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Implementation of automatic test pattern generator for asynchronous circuits using SRAM based FPGA

2017 International Conference on Communication and Signal Processing (ICCSP) ◽

10.1109/iccsp.2017.8286393 ◽

2017 ◽

Author(s):

N. Vivek ◽

S. Syed Ameer Abbas

Keyword(s):

Test Pattern ◽

Asynchronous Circuits ◽

Pattern Generator ◽

Automatic Test ◽

Automatic Test Pattern Generator

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ATPD: an automatic test pattern generator for path delay faults

Proceedings International Test Conference 1996. Test and Design Validity ◽

10.1109/test.1996.557051 ◽

2002 ◽

Cited By ~ 9

Author(s):

D. Karayiannis ◽

S. Tragoudas

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Automatic Test ◽

Automatic Test Pattern Generator

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