Device linearity and intermodulation distortion comparison of dual material gate and conventional AlGaN/GaN high electron mobility transistor
2011 ◽
Vol 51
(3)
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pp. 587-596
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2019 ◽
Vol 32
(3)
◽
pp. e2546
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2017 ◽
Vol 12
(12)
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pp. 1314-1320
1998 ◽
Vol 31
(2)
◽
pp. 159-164
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2006 ◽
Vol 45
(No. 35)
◽
pp. L932-L934
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2004 ◽
Vol 43
(12)
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pp. 8019-8023
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