Reliability analysis of sintered Cu joints for SiC power devices under thermal shock condition

2019 ◽  
Vol 100-101 ◽  
pp. 113456 ◽  
Author(s):  
Yue Gao ◽  
Shuhei Takata ◽  
Chuantong Chen ◽  
Shijo Nagao ◽  
Katsuaki Suganuma ◽  
...  
2016 ◽  
Vol 16 (3) ◽  
pp. 336-344 ◽  
Author(s):  
Dan Simon ◽  
Cristian Boianceanu ◽  
Gilbert De Mey ◽  
Vasile Topa ◽  
Andreas Spitzer

2014 ◽  
Vol 633 ◽  
pp. 427-430 ◽  
Author(s):  
Qing Hui Shang ◽  
Yan Xia Wang ◽  
Bin Jiang ◽  
Dong Huan Zhang ◽  
Tian Tian Sun

For study the damage characteristic of the mullite heat storage ceramic under thermal shock condition, mechanical properties of mullite have been investigated. Under the different cooling mediums (room temperature water, boiling water, air), single and five cycles thermal shock conditions, The article studied the variation of flexural strength and fracture toughness along with temperature. The result show that with the increase of heat transfer coefficient of cooling medium, the bending strength of ceramic decreased. In the 600°C,the ceramic have a maximum bending strength and a minimum fracture toughness. The fracture toughness of precrack specimen is lower than that of non-precrack specimen on the whole. Both Precrack ceramic and non-precrack ceramic have a maximum fracture toughness at 400°C. The study of this paper provides a theoretical basis for the better predicting fracture damage and service life of heat storage ceramic.


2006 ◽  
Vol 326-328 ◽  
pp. 525-528 ◽  
Author(s):  
Samson Yoon ◽  
Seung Min Cho ◽  
Yuri Lee ◽  
Bong Tae Han

A unique interferometric system utilizing thermal-conduction loading is developed and implemented to investigate the effect of ramp rates of accelerated test profiles on the thermal deformation of flex package assemblies. The system provides extreme ramp rates to simulate the thermal shock condition with a temperature control much finer than the conventional convection based system can provide. The in-plane and out-of-plane displacements of the flex package are documented through moiré interferometry and Twyman/Green interferometry, respectively. Deformation measured under a thermal shock condition is compared with that under the conventional thermal cycling condition to assess the effect of ramp rates on package deformation. The comparison reveals that a low ramp rate of typical accelerated thermal cycling (ATC) tests causes significant reduction in the maximum level of elastic energy in the package assembly.


Metals ◽  
2018 ◽  
Vol 8 (8) ◽  
pp. 586 ◽  
Author(s):  
Junghwan Bang ◽  
Dong-Yurl Yu ◽  
Ming Yang ◽  
Yong-Ho Ko ◽  
Jeong-Won Yoon ◽  
...  

The exemption of Pb-bearing automobile electronics in the End of Life Vehicle (ELV) directive has recently expired, bring an urgent need to find Pb-free alloys that can maintain good performance under high-temperature and vibration conditions for automobile application. In this study, a new lead-free solder, Sn-0.7Cu-0.2Cr (wt.%) alloy, was developed. To evaluate the thermomechanical reliability of the new solder alloy in automobile electronics, a thermal shock test was performed. The results show that the presence of Cr in solder inhibits the growth of interfacial Cu3Sn layer and the formation of Kirkendall voids, which effectively improves the joint reliability under intense thermal shock condition compared with the commercial SAC305 and SC07 solders. Specifically, the shear strength of the Sn-0.7Cu-0.2Cr/Cu solder joints was higher by 23% and 44% than that of SAC305 and SC07 solder joints after 2000 cycles of thermal shock at 1 m/s shear speed.


2016 ◽  
Vol 878 ◽  
pp. 3-7 ◽  
Author(s):  
Tian Qi Hu ◽  
Hong Tao Chen ◽  
Ming Yu Li

A novel solder bonding material for high-temperature applications based on Cu@Sn core-shell structured particles was developed, and the fabricated Cu@Sn particles were compressed into preforms for die attachment. The reflow temperature for this bonding material could reached as low as 260°C due to the low melting temperature of the outer Sn layer. However, after reflow soldering, the resulting interconnections can withstand a high temperature of at least 415°C, outer Sn layer completely transformed into Cu-Sn intermetallic compounds (IMCs) with high remelting temperatures. The formed bondlines exhibit good electrical conductivity due to the low porosity and the embedded Cu particles in the interconnections. Furthermore, the interconnections also exhibit excellent reliability under thermal shock cycling from-55°C to 200°C. This die attach material is suitable for power devices operating under high temperatures or other harsh environments.


Sign in / Sign up

Export Citation Format

Share Document