scholarly journals Probing the dynamics of Cu nanoparticle growth inside metal-organic frameworks upon electron beam irradiation

2020 ◽  
Vol 41 ◽  
pp. 100832 ◽  
Author(s):  
Yuri A. Mezenov ◽  
Stéphanie Bruyere ◽  
Nikita K. Kulachenkov ◽  
Andrei N. Yankin ◽  
Sergey S. Rzhevskiy ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Metal Organic Frameworks ◽  
Beam Irradiation ◽  
Nanoparticle Growth ◽  
Metal Organic ◽  
Cu Nanoparticle

Electron beam induced nanoparticle growth in metal-organic frameworks

2020 ◽  
Author(s):  
Yuri A. Mezenov ◽  
Nikita K. Kulachenkov ◽  
Stéphanie Bruyere ◽  
Valentin A. Milichko
Keyword(s):  
Electron Beam ◽  
Metal Organic Frameworks ◽  
Nanoparticle Growth ◽  
Metal Organic

Ga-vacancy activation under low energy electron irradiation in GaN-based materials

2012 ◽  
Vol 1432 ◽  
Author(s):  
Henri Nykänen ◽  
Sami Suihkonen ◽  
Lucasz Kilanski ◽  
Markku Sopanen ◽  
Filip Tuomisto
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Vacancy Concentration ◽  
Positron Annihilation Spectroscopy ◽  
Low Energy ◽  
Energy Electron ◽  
Beam Irradiation ◽  
Organic Vapor ◽  
Metal Organic ◽  
Low Energy Electron

ABSTRACTWe present results on optical degradation of gallium nitride based materials under low energy electron beam irradiation (LEEBI). GaN thin film and GaN/InGaN quantum well samples, grown by metal-organic vapor phase epitaxy (MOVPE), were exposed to a tightly focused (ø = 2 nm, J = 0-130 kA/cm2), rapidly scanning electron beam (e-beam) with energy of 5-20 keV and dose of 0-500 μC/cm2. The irradiation severely reduced the band-to-band photoluminescence of the exposed sample areas. Performing positron annihilation spectroscopy measurements on the irradiated films revealed an important increase of Ga-vacancy concentration as a function of the irradiation dose. Based on the measurements we propose that in-grown passive VGa-Hn complexes are present in MOVPE grown GaN (and its alloys), and are activated by LEEBI.

scholarly journals Elucidating the real-time Ag nanoparticle growth on α-Ag2WO4during electron beam irradiation: experimental evidence and theoretical insights

2015 ◽  
Vol 17 (7) ◽  
pp. 5352-5359 ◽  
Author(s):  
Wyllamanney da Silva Pereira ◽  
Juan Andrés ◽  
Lourdes Gracia ◽  
Miguel A. San-Miguel ◽  
Edison Z. da Silva ◽  
...  
Keyword(s):  
Electron Beam ◽  
Experimental Evidence ◽  
Real Time ◽  
Electron Beam Irradiation ◽  
Atomic Scale ◽  
Ag Nanoparticle ◽  
Beam Irradiation ◽  
The Real ◽  
Nanoparticle Growth

The nucleation of Ag on α-Ag2WO4is investigated at atomic-scale by TEM and FE-SEM techniques. Ag-3 and Ag-4 centers of the (100) sub-surface are the most favorable to diffuse to form metallic Ag.

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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