scholarly journals Elucidating the real-time Ag nanoparticle growth on α-Ag2WO4during electron beam irradiation: experimental evidence and theoretical insights

2015 ◽  
Vol 17 (7) ◽  
pp. 5352-5359 ◽  
Author(s):  
Wyllamanney da Silva Pereira ◽  
Juan Andrés ◽  
Lourdes Gracia ◽  
Miguel A. San-Miguel ◽  
Edison Z. da Silva ◽  
...  
Keyword(s):  
Electron Beam ◽  
Experimental Evidence ◽  
Real Time ◽  
Electron Beam Irradiation ◽  
Atomic Scale ◽  
Ag Nanoparticle ◽  
Beam Irradiation ◽  
The Real ◽  
Nanoparticle Growth

The nucleation of Ag on α-Ag2WO4is investigated at atomic-scale by TEM and FE-SEM techniques. Ag-3 and Ag-4 centers of the (100) sub-surface are the most favorable to diffuse to form metallic Ag.

Atomic-scale observation of pressure-dependent reduction dynamics of W18O49 nanowires using environmental TEM

2017 ◽  
Vol 19 (25) ◽  
pp. 16307-16311
Author(s):  
Zhengfei Zhang ◽  
Liping Sheng ◽  
Lu Chen ◽  
Ze Zhang ◽  
Yong Wang
Keyword(s):  
Electron Beam ◽  
Oxygen Pressure ◽  
Electron Beam Irradiation ◽  
Atomic Scale ◽  
Beam Irradiation ◽  
Environmental Tem

The oxygen pressure dependent reduction of W18O49 nanowires was observed by in situ TEM through electron beam irradiation.

Experimental Evidence of N2Formation from NO in Simulated Coal-fired Flue Gas by Electron Beam Irradiation

1988 ◽  
Vol 17 (9) ◽  
pp. 1465-1468 ◽  
Author(s):  
Hideki Namba ◽  
Yasushi Aoki ◽  
Okihiro Tokunaga ◽  
Ryoji Suzuki ◽  
Shinji Aoki
Keyword(s):  
Electron Beam ◽  
Experimental Evidence ◽  
Flue Gas ◽  
Electron Beam Irradiation ◽  
Beam Irradiation

scholarly journals In Situ Atomic-Scale Observation of Silver Oxidation Triggered by Electron Beam Irradiation

Nanomaterials ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 1021
Author(s):  
Hui Zhang ◽  
Tao Xu ◽  
Yatong Zhu ◽  
Wen Wang ◽  
Hao Zhang ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Oxidation Process ◽  
Atomic Scale ◽  
Advanced Materials ◽  
Metal Oxidation ◽  
Beam Irradiation ◽  
Transmission Electron ◽  
Fundamental Understanding

Understanding the mechanism of metal oxidation processes is critical for maintaining the desired properties of metals and catalysts, as well as for designing advanced materials. In this work, we investigate the electron beam induced oxidation of silver using in situ transmission electron microscopy. The additions of Ag-O columns on {111} and {110} planes were captured with atomic resolution. Interestingly, oscillatory growth on {110} planes was observed, which resulted from the double effect of electron beam irradiation. It was found that not only thermodynamic factors but also kinetic factors played significant roles in morphology evolutions. These results can facilitate the fundamental understanding of the oxidation process of Ag and provide a promising approach for the fabrication of desired nanostructures.

Electron-Beam Induced Growth of Silica Nanowires and Silica/Carbon Heterostructures

2007 ◽  
Vol 1017 ◽  
Author(s):  
Francisco Solá ◽  
Oscar Resto ◽  
Azlin M Biaggi-Labiosa ◽  
Luis F Fonseca
Keyword(s):  
Electron Beam ◽  
Porous Silicon ◽  
Real Time ◽  
Electric Fields ◽  
Growth Process ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Electron Dose ◽  
Novel Synthesis ◽  
Silica Nanowires

AbstractA novel synthesis of silica nanowires and silica/carbon heterostructures by electron beam irradiation on porous silicon films was investigated. The method allows us to monitor the growth process in real time at atomic scales. Depending on the electron dose we obtain nanowires with diameters in the range of 15-49nm and lengths up to 500 nm. We found that the adequate electron dose was between 0.01 Acm-2 and 2 Acm-2. Additional electron dose causes plastic and failure deformations in the silica nanowires. A growth model consistent with our findings is presented that involves the flow of mass from the substrate to the nanowire driven by the local electric fields. Heterostructures showing a nanopalm-like shape are obtained after exposing the silica nanowire to poor vacuum conditions in which carbon aggregation from the surrounding gas is promoted by the local electric fields enhanced at the tip of the silica wires.

scholarly journals Probing the dynamics of Cu nanoparticle growth inside metal-organic frameworks upon electron beam irradiation

2020 ◽  
Vol 41 ◽  
pp. 100832 ◽  
Author(s):  
Yuri A. Mezenov ◽  
Stéphanie Bruyere ◽  
Nikita K. Kulachenkov ◽  
Andrei N. Yankin ◽  
Sergey S. Rzhevskiy ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Metal Organic Frameworks ◽  
Beam Irradiation ◽  
Nanoparticle Growth ◽  
Metal Organic ◽  
Cu Nanoparticle

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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