Analysis of mechanical properties of N2 in situ doped polycrystalline 3C-SiC thin films by chemical vapor deposition using single-precursor hexamethyildisilane
2010 ◽
Vol 405
(2)
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pp. 513-516
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2011 ◽
Vol 59
(2)
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pp. 285-288
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1991 ◽
Vol 6
(9)
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pp. 1913-1918
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2009 ◽
Vol 79-82
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pp. 1671-1674
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1995 ◽
Vol 10
(9)
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pp. 2166-2169
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1991 ◽
Vol 107
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pp. 699-704
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2012 ◽
Vol 121
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pp. 175-177
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1992 ◽
Vol 193
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pp. 105-109
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