Improved biaxial texture of tri-layer YBCO/CaTiO3/YBCO films using an all chemical solution deposition method

2020 ◽  
Vol 578 ◽  
pp. 1353737
Author(s):  
Chunyuan Zhang ◽  
Xiaoyan Du ◽  
Huiliang Zhang
Keyword(s):  
Chemical Solution Deposition ◽  
Deposition Method ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Ybco Films ◽  
Biaxial Texture ◽  
Chemical Solution Deposition Method

Preparation and Properties ofK(Sr0.75Ba0.25)2Nb5O15Thin Films by Chemical Solution Deposition Method

1997 ◽  
Vol 36 (Part 1, No. 9B) ◽  
pp. 5930-5934 ◽  
Author(s):  
Wataru Sakamoto ◽  
Akihiro Kawase ◽  
Toshinobu Yogo ◽  
Shin-ichi Hirano
Keyword(s):  
Chemical Solution Deposition ◽  
Deposition Method ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Chemical Solution Deposition Method

Preparation and Properties of V-Doped (Bi,Nd)4Ti3O12 Ferroelectric Thin Films by Chemical Solution Deposition Method

2004 ◽  
Vol 62 (1) ◽  
pp. 233-241 ◽  
Author(s):  
TAKASHI HAYASHI ◽  
NAOYA IIZAWA ◽  
DAICHI TOGAWA ◽  
MIO YAMADA ◽  
WATARU SAKAMOTO ◽  
...  
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Ferroelectric Thin Films ◽  
Deposition Method ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Chemical Solution Deposition Method

Magneto-dielectric and magnetoelectric anisotropies of CoFe2O4/Bi5Ti3FeO15 bilayer composite heterostructural films

RSC Advances ◽  
2016 ◽  
Vol 6 (57) ◽  
pp. 52353-52359 ◽  
Author(s):  
Yulong Bai ◽  
Jieyu Chen ◽  
Shifeng Zhao ◽  
Qingshan Lu
Keyword(s):  
Chemical Solution Deposition ◽  
Deposition Method ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Chemical Solution Deposition Method

Bilayer composite heterostructural films consisting of magnetic CoFe2O4 and multiferroic Bi5Ti3FeO15 films were prepared by the chemical solution deposition method.

Epitaxial growth of PbZr0.5Ti0.5O3 thin films on (001) LaAlO3 by the chemical solution deposition method

1999 ◽  
Vol 14 (10) ◽  
pp. 4004-4010 ◽  
Author(s):  
J. H. Kim ◽  
F. F. Lange
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Driving Force ◽  
Fluorite Phase ◽  
Deposition Method ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Boundary Area ◽  
Pzt Thin Films ◽  
Chemical Solution Deposition Method

Epitaxial PbZr0.5Ti0.5O3 (PZT) thin films were grown on (001) LaAlO3 substrates (∼6.1% lattice mismatch) by the chemical solution deposition method. The sequence of epitaxy during heating between 375 and 700 °C/1h was characterized by x-ray diffraction and transmission electron microscopy. At approximately 375 °C/1h, a nanocrystalline metastable fluorite phase of PZT was formed from the pyrolyzed amorphous precursor. At higher temperatures (400–425 °C/1h), thermodynamically stable PZT crystallites were first observed at the interface; with increasing higher temperatures, these nuclei grew across the interface and through the film toward the surface by consuming the metastable nanocrystalline fluorite grains. PZT thin films annealed above ∼500 °C/1h were observed to be dense with an epitaxial orientation relationship of [100](001)PZT‖[100](001)LAO. The metastable nanocrystalline fluorite to the stable single-crystal perovskite transformation gives an extra driving force by providing an additional decrease in free energy in addition to a driving force from the elimination of grain boundary area for epitaxy.

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