Intracellular concentration map of magnesium in whole cells by combined use of X-ray fluorescence microscopy and atomic force microscopy

2011 ◽  
Vol 66 (11-12) ◽  
pp. 834-840 ◽  
Author(s):  
Stefano Lagomarsino ◽  
Stefano Iotti ◽  
Giovanna Farruggia ◽  
Alessia Cedola ◽  
Valentina Trapani ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Intracellular Concentration ◽  
X Ray ◽  
Whole Cells ◽  
Force Microscopy ◽  
Atomic Force ◽  
Combined Use

scholarly journals Combined X-ray Microfluorescence and Atomic Force Microscopy Studies of Mg Distribution in Whole Cells

2011 ◽  
Author(s):  
S. Lagomarsino ◽  
S. Iotti ◽  
G. Farruggia ◽  
V. Trapani ◽  
A. Cedola ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
X Ray ◽  
Whole Cells ◽  
Force Microscopy ◽  
Atomic Force

Surface Morphology of InxGa1-xAs/GaAs Relaxed Layers Characterized by Atomic Force Microscopy

1994 ◽  
Vol 340 ◽  
Author(s):  
G. Padeletti ◽  
G. M. Ingo ◽  
P. Imperatori
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Strain Relaxation ◽  
Grazing Incidence ◽  
Dislocation Network ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Combined Use

ABSTRACTGa0.65In0.35As layers of a varying nominal epilayer thickness (10 – 1000 nm) have been grown by the MBE technique on GaAs (100) substrates and characterized by the combined use of atomic force microscopy (AFM) and grazing incidence X-ray diffraction (GIXD). The surface roughness and morphology have been investigated. The GIXD and AFM results show that the thinnest films are characterized by an asymmetric strain relaxation along the two <110> directions with no surface crosshatched pattern but with a misfit dislocation network. AFM images on the thickest films show also well-oriented protrusions along the [110] direction, which increase in size and become more elongated as the nominal film thickness increases.

scholarly journals Review—Multiscale Characterization of Li-Ion Batteries through the Combined Use of Atomic Force Microscopy and X-ray Microscopy and Considerations for a Correlative Analysis of the Reviewed Data

2021 ◽  
Author(s):  
Danilo Dini ◽  
Flavio Cognigni ◽  
Daniele Passeri ◽  
Francesca Anna Scaramuzzo ◽  
Mauro Pasquali ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Correlative Analysis ◽  
Atomic Force ◽  
Combined Use ◽  
Complementary Techniques ◽  
Non Destructive

Abstract The present review analyses the recent literature on the combined use of X-ray microscopy (XRM) and atomic force microscopy (AFM) for multiscale characterization of Li+ (or Li) batteries (LiBs) with the aim of developing guidelines for correlative analysis. The usefulness of XRM resides in the capability of affording non invasively in situ images of the inner parts of a LiB (an encapsulated device) with spatial resolution of dozens of nm during operation. XRM is non destructive and affords the early diagnosis of LiBs degradation causes when these manifest themselves as microdeformations. Multiscale characterization of LiBs also requires AFM for visualizing the morphological/physical alterations of LiB components (anodes, cathodes, electrolyte) at the sub-nanometer level. Different to XRM, AFM necessitates of a modification of LiB working configuration since AFM uses a contacting probe whereas XRM exploits radiation-matter interactions and does not require LiB dissection. A description of the working principles of the two techniques is provided to evidence which technical aspects have to be considered for achieving a meaningful correlative analysis of LiBs. In delineating new perspectives for the analysis of LiBs we will consider additional complementary techniques. Among various AFM-based techniques particular emphasis is given to electrochemical AFM (EC-AFM).

Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

1995 ◽  
Vol 382 ◽  
Author(s):  
Martin Pehnt ◽  
Douglas L. Schulz ◽  
Calvin J. Curtis ◽  
Helio R. Moutinho ◽  
Amy Swartzlander ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Cdte Nanoparticles ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Cdte Thin Films

ABSTRACTIn this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

Sign in / Sign up

Export Citation Format

Share Document