Modelling of grazing incidence X-ray diffraction spectra from Mo-implanted stainless steel

2006 ◽  
Vol 200 (16-17) ◽  
pp. 5058-5066 ◽  
Author(s):  
J. Dudognon ◽  
M. Vayer ◽  
A. Pineau ◽  
R. Erre
Keyword(s):  
Stainless Steel ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Simulation of X-ray diffractograms obtained by grazing incidence X-ray diffraction of implanted stainless steel

2008 ◽  
Vol 40 (3-4) ◽  
pp. 441-444 ◽  
Author(s):  
J. Dudognon ◽  
M. Vayer ◽  
A. Pineau ◽  
R. Erre
Keyword(s):  
Stainless Steel ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

scholarly journals Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3191
Author(s):  
Arun Kumar Mukhopadhyay ◽  
Avishek Roy ◽  
Gourab Bhattacharjee ◽  
Sadhan Chandra Das ◽  
Abhijit Majumdar ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Relative Composition ◽  
Transmission Electron ◽  
Deposited Film ◽  
Deposited Films

We report the surface stoichiometry of Tix-CuyNz thin film as a function of film depth. Films are deposited by high power impulse (HiPIMS) and DC magnetron sputtering (DCMS). The composition of Ti, Cu, and N in the deposited film is investigated by X-ray photoelectron spectroscopy (XPS). At a larger depth, the relative composition of Cu and Ti in the film is increased compared to the surface. The amount of adventitious carbon which is present on the film surface strongly decreases with film depth. Deposited films also contain a significant amount of oxygen whose origin is not fully clear. Grazing incidence X-ray diffraction (GIXD) shows a Cu3N phase on the surface, while transmission electron microscopy (TEM) indicates a polycrystalline structure and the presence of a Ti3CuN phase.

Preparation of β-PbO2 and β-PbO2-MnO2 Coating on Stainless Steel Substrate

2012 ◽  
Vol 490-495 ◽  
pp. 3486-3490
Author(s):  
Qiang Yu ◽  
Zhen Chen ◽  
Zhong Cheng Guo
Keyword(s):  
Stainless Steel ◽  
Mass Fraction ◽  
Stainless Steel Substrate ◽  
Steel Substrate ◽  
Substrate Material ◽  
X Ray Diffraction ◽  
X Ray ◽  
New Type ◽  
Plating Solution ◽  
Element Mass Fraction

In order to prepare a new type of anode material, stainless steel was selected as substrate material. The β-PbO2 coating on stainless steel substrate was prepared under the appropriate plating solution, and the PbO2-MnO2 coating was prepared with thermal decomposition. The crystal structure was determined by X-ray diffraction; Surface morphology was test by Scanning Electron Microscopy; the energy spectrum was used to determine element mass-fraction and the ratio of atomic number of the coatings.

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