Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal–oxide–semiconductor-field-effect-transistors
2003 ◽
Vol 20
(5)
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pp. 767-769
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2010 ◽
Vol 49
(4)
◽
pp. 041302
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2000 ◽
Vol 39
(Part 1, No. 6A)
◽
pp. 3271-3276
Keyword(s):
2018 ◽
Vol 57
(6S1)
◽
pp. 06HD03
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2010 ◽
Vol 157
(6)
◽
pp. H633
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Keyword(s):
2007 ◽
Vol 46
(12)
◽
pp. 7635-7638
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