Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy

2016 ◽  
Vol 161 ◽  
pp. 41-50 ◽  
Author(s):  
Bien Cuong Tran Khac ◽  
Koo-Hyun Chung
Keyword(s):  
Atomic Force Microscopy ◽  
Quantitative Assessment ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Calibration Methods ◽  
Force Calibration

Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

2020 ◽  
Vol 68 (4) ◽  
Author(s):  
Arnab Bhattacharjee ◽  
Nikolay T. Garabedian ◽  
Christopher L. Evans ◽  
David L. Burris
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration

Atomic Force Microscopy Calibration Methods for Lateral Force, Elasticity, and Viscosity

1998 ◽  
Vol 522 ◽  
Author(s):  
C. K. Buenviaje ◽  
S.-R. Ge ◽  
M. H. Rafailovich ◽  
R. M. Overney
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Calibration Methods

scholarly journals Determining amplitude and tilt of a lateral force microscopy sensor

2021 ◽  
Vol 12 ◽  
pp. 517-524
Author(s):  
Oliver Gretz ◽  
Alfred J Weymouth ◽  
Thomas Holzmann ◽  
Korbinian Pürckhauer ◽  
Franz J Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Scanning Tunneling ◽  
Two Dimensional ◽  
Local Surface ◽  
Lateral Force Microscopy ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Calibration Methods

In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on the acquired data. To determine the amplitude and tilt we make use of the scanning tunneling microscopy (STM) channel and acquire data without and with oscillation of the tip above a local surface feature. We use a full two-dimensional current map of the STM data without oscillation to simulate data for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation.

Sliding Friction by Atomic Force Microscopy

1998 ◽  
Vol 543 ◽  
Author(s):  
V. Pasquier ◽  
J. M. Drake
Keyword(s):  
Atomic Force Microscopy ◽  
Sliding Friction ◽  
Lateral Force ◽  
Lateral Force Microscopy ◽  
Force Microscopy ◽  
Load Dependence ◽  
Silica Surfaces ◽  
Atomic Force ◽  
Friction Measurements ◽  
Force Calibration

AbstractLateral Force Microscopy offers the possibility of exploring tribological properties of interfaces atthe nanoscale. Our research focused on some crucial conditions that must be fuffilled to obtainquantitative and reliable LFM friction measurements. We have characterized the mechanical andvibrational properties of the cantilever. Precise force calibration were made based on ourknowledge of the intrinsic coupling modes of the cantilever. We report measurements of the slidingfriction between two silica surfaces. The load dependence of the friction force was analyzedassuming different models for the contact, from Hertzian to Amontons law.

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