Determination of twist angle of in-plane mosaic spread of GaN films by high-resolution X-ray diffraction

2003 ◽  
Vol 255 (1-2) ◽  
pp. 63-67 ◽  
Author(s):  
X.H. Zheng ◽  
H. Chen ◽  
Z.B. Yan ◽  
Y.J. Han ◽  
H.B. Yu ◽  
...  
Keyword(s):  
High Resolution ◽  
Twist Angle ◽  
X Ray Diffraction ◽  
X Ray ◽  
Mosaic Spread

Determination of the Twist Angle of GaN Film by High Resolution X-ray Diffraction

2008 ◽  
Vol 1 ◽  
pp. 045004 ◽  
Author(s):  
Hongtao Li ◽  
Yi Luo ◽  
Lai Wang ◽  
Guangyi Xi ◽  
Yang Jiang ◽  
...  
Keyword(s):  
High Resolution ◽  
Twist Angle ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gan Film

Composition determination of β-(AlxGa1−x)2O3layers coherently grown on (010) β-Ga2O3substrates by high-resolution X-ray diffraction

2016 ◽  
Vol 9 (6) ◽  
pp. 061102 ◽  
Author(s):  
Yuichi Oshima ◽  
Elaheh Ahmadi ◽  
Stefan C. Badescu ◽  
Feng Wu ◽  
James S. Speck
Keyword(s):  
High Resolution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Composition Determination

Determination of The State of Deformation in Epitaxial Layers Using High Resolution X-Ray Diffraction

1993 ◽  
Vol 319 ◽  
Author(s):  
P.J. Dugdale ◽  
R.C. Pond ◽  
S.J. Barnett
Keyword(s):  
High Resolution ◽  
The State ◽  
Epitaxial Layers ◽  
Misfit Dislocations ◽  
X Ray Diffraction ◽  
X Ray ◽  
Additional Information ◽  
Transmission Electron ◽  
Dislocation Densities

AbstractThe state of deformation in epitaxial layers of InGaAs grown by MBE on GaAs substrates has been determined using high resolution X-ray diffraction. This method enables the strains and rigid body rotations which occur in the layers to be measured and these are described by means of a tensor. Layers of different thicknesses have been grown on substrates whose dislocation densities differ by three orders of magnitude in order to assess the influence of this parameter on layer relaxation through the motion of misfit dislocations to the interface. Transmission electron microscopy has also been used to provide additional information on the relaxations.

Refinement of framework disorder in dehydrated CaA zeolite from single-crystal synchrotron data

2000 ◽  
Vol 56 (5) ◽  
pp. 766-772 ◽  
Author(s):  
Florence Porcher ◽  
Mohamed Souhassou ◽  
Heinz Graafsma ◽  
Anna Puig-Molina ◽  
Yves Dusausoy ◽  
...  
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Catalytic Properties ◽  
Exchangeable Cations ◽  
Mirror Plane ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zeolite Structure ◽  
Accurate Knowledge

An accurate knowledge of zeolite structure is required for understanding their selective sorption capacities and their catalytic properties. In particular, the positions of the exchangeable cations and their interactions with the framework are essential. The present study deals with the accurate crystal structure determination of a fully exchanged and fully dehydrated CaA zeolite (Ca48Al96Si96O384, Fm\bar 3c, a = 24.47 Å) using single-crystal high-resolution synchrotron X-ray diffraction [(sin θ/λ)max = 1.4 Å−1]. It is shown that cation exchange severely distorts the skeleton, especially around the O2 atom. The high-resolution synchrotron data reveal that this latter O atom is disordered and lies out of the mirror plane it occupies in other A-type zeolites. This feature is related to that observed for Ca2+ cations.

Accurate determination of lattice mismatch in the epitaxial AlAs/GaAs system by high-resolution X-ray diffraction

1993 ◽  
Vol 132 (3-4) ◽  
pp. 427-434 ◽  
Author(s):  
C. Bocchi ◽  
C. Ferrari ◽  
P. Franzosi ◽  
A. Bosacchi ◽  
S. Franchi
Keyword(s):  
High Resolution ◽  
Lattice Mismatch ◽  
Accurate Determination ◽  
X Ray Diffraction ◽  
X Ray

Structure determination of a new polymorph of TiO2 by high-resolution electron microscopy and computer simulations

1989 ◽  
Vol 47 ◽  
pp. 416-417
Author(s):  
Jillian F. Banfield ◽  
David R. Veblen ◽  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Computer Simulations ◽  
High Resolution Electron Microscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Naturally Occurring ◽  
Resolution Electron

A new, naturally occurring polymorph of TiO2 has been identified. This mineral forms lamellae generally only a few nanometers wide in anatase from two localities near Bintal Valais, Switzerland. The abundance of this mineral in anatase is too low to allow investigation by X-ray diffraction. The unit cell determined by electron diffraction is triclinic, with a = 0.754 nm, b = 0.448 nm, c = 0.616 nm, α = 78.90°, β = 124.55°, γ = 96.54°. The coherently intergrown lamellae are oriented with b parallel to a of anatase; the interface is parallel to (103) anatase.

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