Electron beam-induced current, cathodoluminescence and cross-sectional transmission electron microscopy characterization of degraded AlGaAs/GaAs lasers

J. Ratajczak; J. Kątcki; A. Maląg

doi:10.1016/s0254-0584(02)00599-0

Electron beam-induced current, cathodoluminescence and cross-sectional transmission electron microscopy characterization of degraded AlGaAs/GaAs lasers

Materials Chemistry and Physics ◽

10.1016/s0254-0584(02)00599-0 ◽

2003 ◽

Vol 81 (2-3) ◽

pp. 269-272

Author(s):

J. Ratajczak ◽

J. Kątcki ◽

A. Maląg

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

Induced Current ◽

Cross Sectional ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Electron Beam Induced Current ◽

Microscopy Characterization

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Cross-sectional transmission electron microscopy characterization of the interface between plasma-sprayed TiC and inconel

Thin Solid Films ◽

10.1016/0040-6090(87)90355-5 ◽

1987 ◽

Vol 154 (1-2) ◽

pp. 91-100 ◽

Cited By ~ 3

Author(s):

G. Veilleux ◽

R.G. Saint-Jacques ◽

S. Dallaire

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Cross Sectional ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Plasma Sprayed ◽

Microscopy Characterization

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Cross‐sectional transmission electron microscopy/electron beam induced current investigations on as‐grown and hydrogen‐passivated, gas‐assisted solidified polycrystalline silicon

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576139 ◽

1989 ◽

Vol 7 (6) ◽

pp. 3295-3300

Author(s):

C. H. Chu ◽

C. Y. Sun ◽

H. L. Hwang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

Polycrystalline Silicon ◽

Induced Current ◽

Cross Sectional ◽

Transmission Electron ◽

Electron Beam Induced Current

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Transmission electron microscopy characterization of the microstructure of a CoCrAlY electron beam physical vapor deposition coating on IN738

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.573660 ◽

1986 ◽

Vol 4 (6) ◽

pp. 2915-2921 ◽

Cited By ~ 3

Author(s):

J. R. Caola ◽

G. H. Meier ◽

F. S. Pettit

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

Vapor Deposition ◽

Physical Vapor Deposition ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Transmission Electron Microscopy Characterization of Hydrothermal-treated Aluminum Film

10.1557/proc-1231-nn03-11 ◽

2009 ◽

Author(s):

Takashi Ishiguro ◽

Zhiyong Qiu ◽

Junichi Shimanuki ◽

Yusuke Hosoki

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Aluminum Film ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Metallurgical study of Ni/(Ga,Al) As contacts. III. Transmission electron microscopy characterization of ternary superstructured phases in the reacted layers

Journal of Applied Physics ◽

10.1063/1.349718 ◽

1991 ◽

Vol 70 (12) ◽

pp. 7613-7619 ◽

Cited By ~ 13

Author(s):

A. Poudoulec ◽

B. Guenais ◽

A. Guivarc’h ◽

J. Caulet ◽

R. Guérin

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Metallurgical Study ◽

Microscopy Characterization

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Transmission Electron Microscopy Characterization of Position-Controlled InN Nanocolumns

Japanese Journal of Applied Physics ◽

10.1143/jjap.47.5330 ◽

2008 ◽

Vol 47 (7) ◽

pp. 5330-5332 ◽

Cited By ~ 18

Author(s):

Satoshi Harui ◽

Hidetoshi Tamiya ◽

Takanobu Akagi ◽

Hideto Miyake ◽

Kazumasa Hiramatsu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Analysis of V defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current

Applied Physics Letters ◽

10.1063/1.2945232 ◽

2008 ◽

Vol 92 (24) ◽

pp. 242103 ◽

Cited By ~ 11

Author(s):

C. L. Progl ◽

C. M. Parish ◽

J. P. Vitarelli ◽

P. E. Russell

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

Scanning Transmission Electron Microscopy ◽

Light Emitting Diodes ◽

Induced Current ◽

Light Emitting ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Beam Induced Current

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Efficient Transmission Electron Microscopy Characterization of Cell–Nanostructure Interfacial Interactions

Journal of the American Chemical Society ◽

10.1021/jacs.0c05919 ◽

2020 ◽

Vol 142 (37) ◽

pp. 15649-15653

Author(s):

Stella Aslanoglou ◽

Yaping Chen ◽

Viola Oorschot ◽

Zlatan Trifunovic ◽

Eric Hanssen ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Interfacial Interactions ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization ◽

Efficient Transmission

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High resolution transmission electron microscopy characterization of fcc → 9R transformation in nanocrystalline palladium films due to hydriding

Applied Physics Letters ◽

10.1063/1.4793512 ◽

2013 ◽

Vol 102 (7) ◽

pp. 071911 ◽

Cited By ~ 16

Author(s):

Behnam Amin-Ahmadi ◽

Hosni Idrissi ◽

Renaud Delmelle ◽

Thomas Pardoen ◽

Joris Proost ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Transmission electron microscopy characterization of GaN nanowires

Journal of Electronic Materials ◽

10.1007/s11664-002-0089-4 ◽

2002 ◽

Vol 31 (5) ◽

pp. 391-394 ◽

Cited By ~ 2

Author(s):

Z. Liliental-Weber ◽

Y. H. Gao ◽

Y. Bando

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Gan Nanowires ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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