Direct observation of polyhydroxyalkanoate chains by atomic force microscopy

2002 ◽  
Vol 91 (1-4) ◽  
pp. 157-164 ◽  
Author(s):  
Kumar Sudesh ◽  
Zhihua Gan ◽  
Ken’ichiro Matsumoto ◽  
Yoshiharu Doi
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

DIRECT OBSERVATION BY ATOMIC FORCE MICROSCOPY OF SEVERAL BACTERIA SPECIES

1996 ◽  
Vol 86 (2-3) ◽  
pp. 193-193
Author(s):  
Denis ROBICHON ◽  
Jean-Franc¸ois CAVELLIER ◽  
Yves CENATIEMPO ◽  
Jean-Christophe GIRARD
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of surfactant aggregate behavior on a mica surface using high-speed atomic force microscopy

2011 ◽  
Vol 47 (17) ◽  
pp. 4974 ◽  
Author(s):  
Shigeto Inoue ◽  
Takayuki Uchihashi ◽  
Daisuke Yamamoto ◽  
Toshio Ando
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Mica Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Aggregate Behavior

Direct observation of atomic step edges on the rutile TiO2(110)-(1 × 1) surface using atomic force microscopy

2018 ◽  
Vol 20 (44) ◽  
pp. 28331-28337 ◽  
Author(s):  
Huan Fei Wen ◽  
Masato Miyazaki ◽  
Quanzhen Zhang ◽  
Yuuki Adachi ◽  
Yan Jun Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Atomic Step ◽  
Atomic Configuration ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Step Edges

Clarifying the atomic configuration of step edges on a rutile TiO2 surface is crucial for understanding its fundamental reactivity, and the direct observation of atomic step edges is still a challenge.

scholarly journals Direct Observation of Rotary Catalysis of Rotorless F1-ATPase by High-Speed Atomic Force Microscopy

2012 ◽  
Vol 102 (3) ◽  
pp. 600a
Author(s):  
Ryota Iino ◽  
Takayuki Uchihashi ◽  
Toshio Ando ◽  
Hiroyuki Noji
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Force Microscopy ◽  
F1 Atpase ◽  
Atomic Force ◽  
Rotary Catalysis

Direct Observation at Nanoscale of Resistance Switching in NiO Layers by Conductive-Atomic Force Microscopy

2011 ◽  
Vol 4 (5) ◽  
pp. 051101 ◽  
Author(s):  
Damien Deleruyelle ◽  
Carine Dumas ◽  
Marion Carmona ◽  
Christophe Muller ◽  
Sabina Spiga ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Resistance Switching ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Direct Observation of SEI Formation and Lithiation in Thin-Film Silicon Electrodes via in Situ Electrochemical Atomic Force Microscopy

2019 ◽  
Vol 2 (9) ◽  
pp. 6761-6767 ◽  
Author(s):  
Svenja Benning ◽  
Chunguang Chen ◽  
Rüdiger-A. Eichel ◽  
Peter H. L. Notten ◽  
Florian Hausen
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Film Silicon

Direct Observation of Single Particle Electrostatic Charging by Atomic Force Microscopy

2007 ◽  
Vol 24 (6) ◽  
pp. 1165-1169 ◽  
Author(s):  
Matthew J. Bunker ◽  
Martyn C. Davies ◽  
Michael B. James ◽  
Clive J. Roberts
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Single Particle ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrostatic Charging

scholarly journals Direct observation of dynamic force propagation between focal adhesions of cells on microposts by atomic force microscopy

2011 ◽  
Vol 99 (26) ◽  
pp. 263703 ◽  
Author(s):  
Akinori Okada ◽  
Yusuke Mizutani ◽  
Agus Subagyo ◽  
Hirotaka Hosoi ◽  
Motonori Nakamura ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Focal Adhesions ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Propagation
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