Direct observation of atomic step edges on the rutile TiO2(110)-(1 × 1) surface using atomic force microscopy

2018 ◽  
Vol 20 (44) ◽  
pp. 28331-28337 ◽  
Author(s):  
Huan Fei Wen ◽  
Masato Miyazaki ◽  
Quanzhen Zhang ◽  
Yuuki Adachi ◽  
Yan Jun Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Atomic Step ◽  
Atomic Configuration ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Step Edges

Clarifying the atomic configuration of step edges on a rutile TiO2 surface is crucial for understanding its fundamental reactivity, and the direct observation of atomic step edges is still a challenge.

DIRECT OBSERVATION BY ATOMIC FORCE MICROSCOPY OF SEVERAL BACTERIA SPECIES

1996 ◽  
Vol 86 (2-3) ◽  
pp. 193-193
Author(s):  
Denis ROBICHON ◽  
Jean-Franc¸ois CAVELLIER ◽  
Yves CENATIEMPO ◽  
Jean-Christophe GIRARD
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of polyhydroxyalkanoate chains by atomic force microscopy

2002 ◽  
Vol 91 (1-4) ◽  
pp. 157-164 ◽  
Author(s):  
Kumar Sudesh ◽  
Zhihua Gan ◽  
Ken’ichiro Matsumoto ◽  
Yoshiharu Doi
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of surfactant aggregate behavior on a mica surface using high-speed atomic force microscopy

2011 ◽  
Vol 47 (17) ◽  
pp. 4974 ◽  
Author(s):  
Shigeto Inoue ◽  
Takayuki Uchihashi ◽  
Daisuke Yamamoto ◽  
Toshio Ando
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Mica Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Aggregate Behavior

scholarly journals Characterization of individual molecular adsorption geometries by atomic force microscopy: Cu-TCPP on rutile TiO2 (110)

2015 ◽  
Vol 143 (9) ◽  
pp. 094202 ◽  
Author(s):  
Res Jöhr ◽  
Antoine Hinaut ◽  
Rémy Pawlak ◽  
Ali Sadeghi ◽  
Santanu Saha ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Adsorption ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

Tip-Induced Control of Charge and Molecular Bonding of Oxygen Atoms on the Rutile TiO2 (110) Surface with Atomic Force Microscopy

ACS Nano ◽  
2019 ◽  
Vol 13 (6) ◽  
pp. 6917-6924 ◽  
Author(s):  
Yuuki Adachi ◽  
Huan Fei Wen ◽  
Quanzhen Zhang ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molecular Bonding ◽  
Oxygen Atoms

Characterization and Reversible Migration of Subsurface Hydrogen on Rutile TiO2(110) by Atomic Force Microscopy at 78 K

2019 ◽  
Vol 123 (36) ◽  
pp. 22595-22602 ◽  
Author(s):  
Quanzhen Zhang ◽  
Huan Fei Wen ◽  
Yuuki Adachi ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Direct Observation of Rotary Catalysis of Rotorless F1-ATPase by High-Speed Atomic Force Microscopy

2012 ◽  
Vol 102 (3) ◽  
pp. 600a
Author(s):  
Ryota Iino ◽  
Takayuki Uchihashi ◽  
Toshio Ando ◽  
Hiroyuki Noji
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Force Microscopy ◽  
F1 Atpase ◽  
Atomic Force ◽  
Rotary Catalysis

Direct Observation at Nanoscale of Resistance Switching in NiO Layers by Conductive-Atomic Force Microscopy

2011 ◽  
Vol 4 (5) ◽  
pp. 051101 ◽  
Author(s):  
Damien Deleruyelle ◽  
Carine Dumas ◽  
Marion Carmona ◽  
Christophe Muller ◽  
Sabina Spiga ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Resistance Switching ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Electrical Engineering of the Oxygen Adatom and Vacancy on Rutile TiO2(110) by Atomic Force Microscopy at 78 K

2019 ◽  
Vol 123 (47) ◽  
pp. 28852-28858 ◽  
Author(s):  
Quanzhen Zhang ◽  
Huan Fei Wen ◽  
Yuuki Adachi ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Engineering ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force
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