Effect of the microscopic correlated-pinning landscape on the macroscopic critical current density in YBCO films

2000 ◽  
Vol 341-348 ◽  
pp. 1177-1178 ◽  
Author(s):  
G. Ghigo ◽  
A. Chiodoni ◽  
R. Gerbaldo ◽  
L. Gozzelino ◽  
F. Laviano ◽  
...  
2011 ◽  
Vol 24 (10) ◽  
pp. 105020 ◽  
Author(s):  
I A Golovchanskiy ◽  
A V Pan ◽  
O V Shcherbakova ◽  
S A Fedoseev ◽  
S X Dou

2001 ◽  
Vol 689 ◽  
Author(s):  
S. Sathyamurthy ◽  
M. Paranthaman ◽  
B. W. Kang ◽  
H. Y. Zhai ◽  
T. Aytug ◽  
...  

Sol-gel processing of La2Zr2O7 (LZO) buffer layers on biaxially textured Ni-3 at.% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effect of increasing the annealing speed on the texture, microstructure and the carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of Yttria Stabilized Zirconia (YSZ) and Ceria (CeO2) were deposited using rf sputtering, and YBa2Cu3Ox (YBCO) films were then deposited using Pulsed Laser Deposition (PLD). A critical current density (Jc) of 1.9 MA/cm2 at 77K and self-field and 0.34 MA/cm2 at 77K and 0.5T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers, and are the highest ever obtained using solution seed layers. The use of all-solution buffers for coated conductor processing has also been explored. A critical current density of 1.1 MA/cm2 at 77 K and self-field was obtained on YBCO films grown be PLD on LZO buffered nickel substrates.


2002 ◽  
Vol 17 (7) ◽  
pp. 1750-1757 ◽  
Author(s):  
B. W. Kang ◽  
A. Goyal ◽  
D. F. Lee ◽  
J. E. Mathis ◽  
E. D. Specht ◽  
...  

We investigated the dependence of critical current density (Jc) on thickness of Yba2Cu3O7−δ (YBCO) films grown by pulsed laser deposition on (100) SrTiO3 (STO) and on rolling-assisted biaxially textured substrates (RABiTS). The thickness of YBCO films varied from 0.19 to 3 μm. The highest Jcs of 5.3 and 2.6 MA/cm2 at 77 K, self-field were obtained for 0.19-μm YBCO films on STO and RABiTS, respectively. Jc was found to decrease exponentially with YBCO thickness on both substrates. However, the results suggest different mechanisms are responsible for the Jc reduction in the two cases. On STO, growth of a-axis grains within c-axis films and broadening of the in-plane texture were observed in thick films. On RABiTS, degradation in cube texture as well as development of a porous surface morphology were found to correlate with film thickness.


1994 ◽  
Vol 235-240 ◽  
pp. 627-628 ◽  
Author(s):  
M. Pernet ◽  
D. Chateigner ◽  
P. Germi ◽  
C Dubourdieu ◽  
O. Thomas ◽  
...  

1999 ◽  
Vol 9 (2) ◽  
pp. 1535-1538 ◽  
Author(s):  
V.M. Pan ◽  
A.L. Kasatkin ◽  
V.L. Svetchnikov ◽  
V.A. Komashko ◽  
A.G. Popov ◽  
...  

2000 ◽  
Vol 13 (2) ◽  
pp. 209-214 ◽  
Author(s):  
V A Komashko ◽  
A G Popov ◽  
V L Svetchnikov ◽  
A V Pronin ◽  
V S Melnikov ◽  
...  

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