scholarly journals Ways to discharge-based soft X-ray lasers with the wavelength λ<15 nm

2008 ◽  
Vol 26 (2) ◽  
pp. 167-178 ◽  
Author(s):  
K. Kolacek ◽  
J. Schmidt ◽  
V. Prukner ◽  
O. Frolov ◽  
J. Straus
Keyword(s):  
Spontaneous Emission ◽  
Population Inversion ◽  
Energy Levels ◽  
Metal Vapor ◽  
Lasing Wavelength ◽  
X Ray ◽  
Metal Vapors ◽  
Collisional Recombination ◽  
Metal Vapor Plasma ◽  
Local Water

AbstractTwo basic ways to amplification of spontaneous emission in the soft X-ray region are described. The first is based on the electron-collisional recombination pumping scheme, which uses recombination of fully stripped ions into hydrogen-like ions to create (in the case of sufficiently fast cooling) a population inversion on energy levels belonging to the Balmer-alpha transition. We test this scheme on nitrogen, for which the lasing wavelength is 13.4 nm. The second way to amplification of spontaneous emission is based on the electron-collisional excitation pumping scheme: this uses for creation of population inversion a fast excitation of Ne- or Ni-like ions. However, for wavelength below 15 nm it is necessary to use Ni-like ions of some metal vapors. Feeding metal vapors into a capillary is difficult, and if being fed they deposit on the capillary wall and significantly reduce the capillary lifetime. That is why we prepare metal vapor plasma in a capillary with liquid wall – by wire explosion in water. For slowdown of the plasma-channel expansion a local-water-compression by linearly focused shock wave is being developed.

Modeling of the electrogun metal vapor plasma discharge

1996 ◽  
Author(s):  
Laxminarayan Raja ◽  
Philip Varghese ◽  
Dennis Wilson
Keyword(s):  
Metal Vapor ◽  
Plasma Discharge ◽  
Metal Vapor Plasma

Observation of population inversion in recombining Al plasma by time‐ and space‐resolved x‐ray spectroscopy

1996 ◽  
Vol 68 (11) ◽  
pp. 1479-1481 ◽  
Author(s):  
M. Katsuragawa ◽  
J. Itatani ◽  
S. Orimo ◽  
T. Ozaki ◽  
H. Kuroda ◽  
...  
Keyword(s):  
Population Inversion ◽  
Time And Space ◽  
X Ray

Modeling of the electrothermal ignitor metal vapor plasma for electrothermal-chemical guns

1997 ◽  
Vol 33 (1) ◽  
pp. 316-321 ◽  
Author(s):  
L.L. Raja ◽  
P.L. Varghese ◽  
D.E. Wilson
Keyword(s):  
Metal Vapor ◽  
Metal Vapor Plasma

scholarly journals Transient Formation of Super-Explosives under High Pressure for Fast Ignition

2008 ◽  
Vol 63 (1-2) ◽  
pp. 35-41 ◽  
Author(s):  
Friedwardt Winterberg
Keyword(s):  
High Pressure ◽  
Energy Levels ◽  
Strong Shock ◽  
Dense Matter ◽  
Fast Ignition ◽  
Molecular Configuration ◽  
Exploding Wire ◽  
X Ray ◽  
Wire Arrays ◽  
Thermonuclear Target

Dense matter, if put under high pressure, can undergo a transformation from an atomic to a molecular configuration, where the electron orbits go into lower energy levels. If the rise in pressure is very sudden, for example by a strong shock wave, the electrons change their orbits rapidly under the emission of photons, which for more than 100 Mbar can reach keV energies. With the opacity of dense matter going in proportion to the density, the photons can be efficiently released from the surface of the compressed matter by a rarefaction wave. The so produced X-ray photons can be used for the fast ignition of a thermonuclear target.The proposed mechanism may be also responsible for the large keV X-ray bursts observed in exploding wire arrays, which can not be explained by conversion of kinetic into thermal energy.

scholarly journals X-ray laser lines in nickel-like erbium

2016 ◽  
Vol 94 (8) ◽  
pp. 705-711
Author(s):  
Wessameldin S. Abdelaziz
Keyword(s):  
Ionization Potential ◽  
Excited States ◽  
Ground State ◽  
Energy Levels ◽  
Single Electron ◽  
Electron Densities ◽  
X Ray ◽  
Electron Excited States

Energy levels of 249 excited levels in nickel-like erbium are calculated using the 3s23p63d10 as a ground state and the single electron excited states from n = 3 to n = 4, 5 orbitals, calculations have been performed using FAC code (Gu. Astrophys. J. 582, 1241 (2003). doi:10.1086/344745 ). The populations are calculated over electron densities from 1020 to 1023 cm−3 and electron temperatures 1/2, 3/4 of the ionization potential of Ni-like Er. The gain coefficients of the transitions are calculated.

Effect of spontaneous emission in hydrogenlike magnesium and aluminum x-ray laser schemes

1987 ◽  
Vol 4 (12) ◽  
pp. 1949 ◽  
Author(s):  
D. C. Eder ◽  
M. D. Rosen ◽  
R. W. Lee ◽  
J. E. Trebes ◽  
N. M. Ceglio ◽  
...  
Keyword(s):  
Spontaneous Emission ◽  
X Ray

scholarly journals The output of a laser amplifier with simultaneous amplified spontaneous emission and an injected seed

2009 ◽  
Vol 27 (3) ◽  
pp. 393-398 ◽  
Author(s):  
H. Huang ◽  
G.J. Tallents
Keyword(s):  
Spontaneous Emission ◽  
Extreme Ultraviolet ◽  
Amplified Spontaneous Emission ◽  
Gain Saturation ◽  
Free Electron Lasers ◽  
Laser Amplifier ◽  
One Dimensional ◽  
X Ray ◽  
Laser Amplifiers ◽  
Harmonic Radiation

AbstractThe minimum irradiance needed to overcome amplified spontaneous emission (ASE) of a seed beam injected into a laser amplifier is evaluated. The treatment is particularly applicable to extreme ultraviolet (EUV) and X-ray laser schemes to inject laser harmonic radiation as a seed into (1) plasma laser amplifiers and (2) free-electron lasers. Simple expressions and calculations are given for the minimum injected irradiance required for amplification of the injected seed beam to exceed ASE from the amplifier, including the effects of gain saturation, assuming one dimensional radiative transfer.

about chemical bonding and molecular structure. This information can be used to detect th e types of organic materials present on the surface. 4.3.2.2. Raman spectroscopy (RS) [7, 8] It is used to examine the energy levels of molecules that cannot be well character-ized via infrared spectroscopy. Th e two techniques, however, are complimentary. In the RS, a sample is irradiated with a strong monochromatic light source (usu-ally a laser). Most of the radiation will scatter or "reflect off' the sample at the same energy as the incoming laser radiation. However, a small amount will scat-ter from the sample at a wavelength slightly shifted from the original wavelength. It is possible to study the molecular structure or determine the chemical identity of the sample. It is quite straightforward to identify compounds by spectral library search. Due to extensive library spectral information, the unique spectral finger-print of every compound, and the ease with which such analyses can be per-formed, the RS is a very useful technique for various applications. An important application of the RS is the rapid, nondestructive characterization of diamond, diamond-like, and amorphous-carbon films. 4.3.2.3. Scanning electron microscopy (SEM) / energy dispersive X-ra y analysis (EDX) [7, 8] The SEM produce s detailed photographs that provide important information about the surface structure and morphology of almost any kind of sample. Image analy-sis is often the first and most important step in problem solving and failure analy-sis. With SEM, a focused beam of high-energy electrons is scanned over the sur-face of a material, causing a variety of signals, secondary electrons, X-rays, photons, etc. - each of which may be used to characterize the material with re-spect to specific properties . The signals are used to modulate the brightness on a CRT display, thereb y providing a high-resolution map of the selected material property. It is a surface imaging technique, but with Energy Dispersive X-ray (EDX) it can identify elements in the near-surface region. This technique is most useful for imaging particles. 4.3.2.4. X-ray fluorescence (XRF) [7, 8] Incident X-rays are used to excite surface atoms. The atoms relax through the emission of an X-ray with energy characteristic of the parent atoms and the inten-sity proportional to the amount of the element present. It is a bulk or "total mate-rials" characterization technique for rapid, simultaneous, and nondestructive analysis of elements having an atomic number higher than that of boron. Tradi-tional bulk analysis applications include identifying metals and alloys, detecting trace elements in liquids, and identifying residues and deposits. 4.3.2.5. Total-reflection X-ray fluorescence (TXRF) [7, 8] It is a special XRF technique that provides extremely sensitive measures of the elements present in a material's outer surface. Applications include searching for metal contamination in thin films on silicon wafers and detecting picogram-levels o f arsenic, lead, mercury and cadmium on hazardous, chemical fume hoods.

2003 ◽  
pp. 43-45
Keyword(s):  
Molecular Structure ◽  
Energy Levels ◽  
Monochromatic Light ◽  
Surface Region ◽  
Carbon Films ◽  
Energy Dispersive ◽  
X Rays ◽  
Bulk Analysis ◽  
X Ray ◽  
High Resolution Map
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